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1. 发明申请

US20060109459A1 Microscope with laser light source and protective device for preventing eye damage 有权
标题翻译：具有激光光源的显微镜和防止眼睛损伤的保护装置
公开(公告)号：US20060109459A1
公开(公告)日：2006-05-25
申请号：US11254879
申请日：2005-10-19
申请人： Matthias Kramer , Bruene Venus
发明人： Matthias Kramer , Bruene Venus
IPC分类号： G01J3/44
CPC分类号： G02B21/0076 , G02B5/223
摘要： The invention is directed to a microscope in which laser light is used to irradiate a sample to be examined and which is outfitted with a protective device for preventing eye damage due to laser light. It is the object of the invention to provide a protective device for microscopes of the type described above which ensures protection against eye damage and visibility of the sample. According to the invention, the protective device has at least one area which is not transparent to harmful radiation components, but which is transparent to harmless, visible radiation components, so that an observer can see the sample through this area without risk of eye damage.
摘要翻译：本发明涉及一种显微镜，其中使用激光照射被检样品，并配备有用于防止由于激光引起的眼睛损伤的保护装置。本发明的目的是提供一种用于上述类型的显微镜的保护装置，其确保防止眼睛损伤和样品的可见性。根据本发明，保护装置具有至少一个对有害辐射部件不透明但对无害的可见辐射分量透明的区域，使得观察者可以通过该区域观察样品，而没有眼睛损伤的风险。

2. 发明授权

US07293885B2 Microscope with laser light source and protective device for preventing eye damage 有权
标题翻译：具有激光光源的显微镜和防止眼睛损伤的保护装置
公开(公告)号：US07293885B2
公开(公告)日：2007-11-13
申请号：US11254879
申请日：2005-10-19
申请人： Matthias Kramer , Bruene Venus
发明人： Matthias Kramer , Bruene Venus
IPC分类号： G02B27/00
CPC分类号： G02B21/0076 , G02B5/223
摘要： The invention is directed to a microscope in which laser light is used to irradiate a sample to be examined and which is outfitted with a protective device for preventing eye damage due to laser light. It is the object of the invention to provide a protective device for microscopes of the type described above which ensures protection against eye damage and visibility of the sample. According to the invention, the protective device has at least one area which is not transparent to harmful radiation components, but which is transparent to harmless, visible radiation components, so that an observer can see the sample through this area without risk of eye damage.
摘要翻译：本发明涉及一种显微镜，其中使用激光照射被检样品，并配备有用于防止由于激光引起的眼睛损伤的保护装置。本发明的目的是提供一种用于上述类型的显微镜的保护装置，其确保防止眼睛损伤和样品的可见性。根据本发明，保护装置具有至少一个对有害辐射部件不透明但对无害的可见辐射分量透明的区域，使得观察者可以通过该区域观察样品，而没有眼睛损伤的风险。

3. 发明授权

US08378314B2 Device and method for the evanescent illumination of a sample 有权
标题翻译：样品瞬间照明的装置和方法
公开(公告)号：US08378314B2
公开(公告)日：2013-02-19
申请号：US12991108
申请日：2009-04-28
申请人： Manfred Matthae , Bruene Venus
发明人： Manfred Matthae , Bruene Venus
IPC分类号： G01N21/64
CPC分类号： G01N21/648 , G01N21/6458 , G01N2021/6419 , G01Q60/20 , G01Q60/22 , G02B27/56
摘要： A device for the evanescent illumination of a sample, including an optical illumination element with an optical corrective element and an objective arranged downstream from the corrective element, to evanescently illuminate the sample with a supplied ray beam containing optical radiation with at least two different wavelengths. The corrective optical element has a transverse chromatic aberration which, during the illumination, leads to the optical radiation penetrating the pupil of the objective at different heights relative to the optical axis varying according to the wavelength. The corrective optical element is selected in such a way that the wavelength-related difference of the penetration depths of the radiation into the sample is reduced during the evanescent illumination.
摘要翻译：一种用于样品的消逝照明的装置，包括具有光学校正元件的光学照明元件和布置在校正元件下游的物镜，以使包含具有至少两个不同波长的光学辐射的所提供的射线束ev逝照射样品。校正光学元件具有横向色差，其在照明期间导致相对于根据波长变化的光轴的不同高度穿透物镜的光瞳的光学辐射。选择校正光学元件，使得在渐逝照射期间辐射进入样品的穿透深度的波长相关差异减小。

4. 发明授权

US07382530B2 Method for the adjustment of a light source in a microscope 有权
标题翻译：在显微镜中调整光源的方法
公开(公告)号：US07382530B2
公开(公告)日：2008-06-03
申请号：US11539390
申请日：2006-10-06
申请人： Jan Thirase , Bruene Venus
发明人： Jan Thirase , Bruene Venus
IPC分类号： G02B21/06
CPC分类号： G02B21/16 , G02B21/08 , G02B2207/113
摘要： A method by which the illumination radiation to be coupled into the illumination beam path of a microscope can be exactly monitored and/or adjusted. In the method for adjusting a light source for a microscope, an imaging optical reflection unit, instead of the objective, is coupled to the microscope in order to image the light of the light source on a detector in such a way that a monitoring of the focus position and/or the position and/or an adjustment of the laser light source with respect to the focus position and/or the position can be carried out. Provided is an approach for monitoring and adjusting a laser beam to be coupled into the illumination beam path of a microscope particularly for using TIRF effects. It can also be used in principle for other solutions in which the parallelism of illumination beams must be monitored and/or adjusted.
摘要翻译：可以精确地监测和/或调整要耦合到显微镜的照明光束路径中的照射辐射的方法。在用于调整显微镜的光源的方法中，将成像光学反射单元代替该目标耦合到显微镜，以便将光源的光在检测器上成像，使得监视可以执行聚焦位置和/或激光光源相对于焦点位置和/或位置的位置和/或调整。提供了一种用于监测和调整要耦合到显微镜的照明光束路径中的激光束的方法，特别是对于使用TIRF效应。原理上也可以使用必须监视和/或调节照明光束的平行度的其他解决方案。

5. 发明申请

US20110062348A1 DEVICE AND METHOD FOR THE EVANESCENT ILLUMINATION OF A SAMPLE 有权
标题翻译：用于样品的历史照明的装置和方法
公开(公告)号：US20110062348A1
公开(公告)日：2011-03-17
申请号：US12991108
申请日：2009-04-28
申请人： Manfred Matthae , Bruene Venus
发明人： Manfred Matthae , Bruene Venus
IPC分类号： G01N21/64
CPC分类号： G01N21/648 , G01N21/6458 , G01N2021/6419 , G01Q60/20 , G01Q60/22 , G02B27/56
摘要： A device for the evanescent illumination of a sample, including an optical illumination element with an optical corrective element and an objective arranged downstream from the corrective element, to evanescently illuminate the sample with a supplied ray beam containing optical radiation with at least two different wavelengths. The corrective optical element has a transverse chromatic aberration which, during the illumination, leads to the optical radiation penetrating the pupil of the objective at different heights relative to the optical axis varying according to the wavelength. The corrective optical element is selected in such a way that the wavelength-related difference of the penetration depths of the radiation into the sample is reduced during the evanescent illumination.
摘要翻译：一种用于样品的消逝照明的装置，包括具有光学校正元件的光学照明元件和布置在校正元件下游的物镜，以使包含具有至少两个不同波长的光学辐射的所提供的射线束ev逝照射样品。校正光学元件具有横向色差，其在照明期间导致相对于根据波长变化的光轴的不同高度穿透物镜的光瞳的光学辐射。选择校正光学元件，使得在渐逝照射期间辐射进入样品的穿透深度的波长相关差异减小。

6. 发明申请

US20070097497A1 METHOD FOR THE ADJUSTMENT OF A LIGHT SOURCE IN A MICROSCOPE 有权
标题翻译：用于调整微光源中的光源的方法
公开(公告)号：US20070097497A1
公开(公告)日：2007-05-03
申请号：US11539390
申请日：2006-10-06
申请人： Jan Thirase , Bruene Venus
发明人： Jan Thirase , Bruene Venus
IPC分类号： G02B21/06
CPC分类号： G02B21/16 , G02B21/08 , G02B2207/113
摘要： The present invention is directed to a method by which the illumination radiation to be coupled into the illumination beam path of a microscope can be exactly monitored and/or adjusted. In the method according to the invention for adjusting a light source for a microscope, an imaging optical reflection unit, instead of the objective, is coupled to the microscope in order to image the light of the light source on a detector in such a way that a monitoring of the focus position and/or the position and/or an adjustment of the laser light source with respect to the focus position and/or the position can be carried out. The proposed solution for monitoring and adjusting a laser beam to be coupled into the illumination beam path of a microscope is provided particularly for using TIRF effects, but can also be used in principle for other solutions in which the parallelism of illumination beams must be monitored and/or adjusted. The method according to the invention provides a simple and fast solution for the adjustment of the illumination of a microscope which prevents endangerment of personnel through exiting illumination light.
摘要翻译：本发明涉及一种可以精确地监视和/或调整要耦合到显微镜的照明光束路径中的照射辐射的方法。在根据本发明的用于调整显微镜的光源的方法中，将成像光学反射单元代替该目标耦合到显微镜，以便将光源的光在检测器上成像，使得可以进行聚焦位置和/或位置的监视和/或激光光源相对于聚焦位置和/或位置的调整。提供的用于监视和调整要耦合到显微镜的照明光束路径中的激光束的解决方案特别用于使用TIRF效应，但是也可以原理地用于必须监视照明光束的并行性的其他解决方案， /或调整。根据本发明的方法提供了用于调节显微镜照明的简单且快速的解决方案，其防止人员通过退出照明光而遭到危害。

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