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    • 5. 发明申请
    • Oblique angle etched underlayers for improved exchange biased structures in a magnetoresitive sensor
    • 斜角蚀刻底层,用于改进磁阻传感器中的交换偏置结构
    • US20070109692A1
    • 2007-05-17
    • US11283033
    • 2005-11-17
    • Matthew CareyJeffrey ChildressJames FreitagStefan MaatMustafa Pinarbasi
    • Matthew CareyJeffrey ChildressJames FreitagStefan MaatMustafa Pinarbasi
    • G11B5/127
    • G11B5/3909B82Y10/00B82Y25/00G01R33/093G11B5/3932G11B2005/3996
    • A magnetoresistive sensor having improved pinning field strength. The sensor includes a pinned layer structure pinned by exchange coupling with an antiferromagnetic (AFM) layer. The AFM layer is constructed upon an under layer having treated surface with an anisotropic roughness. The anisotropic roughness, produced by an angled ion etch, results in improved pinning strength. The underlayer may include a seed layer and a thin layer of crystalline material such as PtMn formed over the seed layer. The magnetic layer may include a first sub-layer of NiFeCr and a second sub-layer of NiFe formed there over. The present invention also includes a magnetoresistive sensor having a magnetic layer deposited on an underlayer (such as a non-magnetic spacer) having a surface treated with an anisotropic texture. An AFM layer is then deposited over the magnetic layer. The magnetic layer is then strongly pinned by a combination of exchange coupling with the AFM layer and a strong anisotropy provided by the surface texture of the underlayer. Such a structure can be used for example in a sensor having a pinned layer structure formed above the free layer, or in a sensor having an in stack bias structure.
    • 具有改善的钉扎场强的磁阻传感器。 传感器包括通过与反铁磁(AFM)层的交换耦合固定的钉扎层结构。 AFM层被构造在具有各向异性粗糙度的处理表面的底层上。 通过角度离子蚀刻产生的各向异性粗糙度导致改善的钉扎强度。 底层可以包括种子层和在种子层上形成的诸如PtMn的薄层结晶材料。 磁性层可以包括NiFeCr的第一子层和在其上形成的NiFe的第二子层。 本发明还包括具有沉积在具有用各向异性纹理处理的表面的底层(例如非磁性间隔物)上的磁性层的磁阻传感器。 然后将AFM层沉积在磁性层上。 然后通过与AFM层的交换耦合的组合强烈地钉住磁性层,并且由底层的表面纹理提供强烈的各向异性。 这种结构可以用于例如具有形成在自由层上方的钉扎层结构的传感器中,或者在具有堆叠偏压结构的传感器中。
    • 7. 发明申请
    • Current-perpendicular-to-the-plane (CPP) magnetoresistive sensor with antiparallel-pinned structure having selected additive elements
    • 电流垂直于平面(CPP)磁阻传感器,具有选择的添加元素的反平行销钉结构
    • US20070047155A1
    • 2007-03-01
    • US11216746
    • 2005-08-30
    • Matthew CareyJeffrey ChildressStefan Maat
    • Matthew CareyJeffrey ChildressStefan Maat
    • G11B5/127
    • H01L43/08G11B5/3906
    • A current-perpendicular-to-the-plane spin-valve (CPP-SV) magnetoresistive sensor has an improved antiparallel (AP) pinned structure, i.e., a structure with first (AP1) and second (AP2) ferromagnetic layers separated by a nonmagnetic antiparallel coupling (APC) layer with the magnetization directions of AP1 and AP2 oriented substantially antiparallel. The AP2 ferromagnetic layer (the layer in contact with the SV spacer layer) is an alloy of a ferromagnetic material and one or more additive elements of Cu, Au and Ag. The additive elements reduce the magnetic moment of the AP2 layer, which enables its thickness to be increased so that its magnetic moment remains close to the magnetic moment of the AP1 ferromagnetic layer. The thicker AP2 layer allows for more bulk spin-dependent scattering of electrons which increases the magnetoresistance of the sensor. An annealed AP2 layer results in more segregation of the ferromagnetic material grains and the additive element grains, and thus a further improvement in magnetoresistance as a result of more interfacial scattering of electrons.
    • 电流垂直于平面的自旋阀(CPP-SV)磁阻传感器具有改进的反平行(AP)钉扎结构,即,具有由非磁性分离的第一(AP1)和第二(AP2)铁磁层的结构 反向平行耦合(APC)层,其AP1和AP2的磁化方向基本上反平行取向。 AP2铁磁层(与SV间隔层接触的层)是铁磁材料和Cu,Au和Ag的一种或多种添加元素的合金。 添加元素降低了AP2层的磁矩,使其厚度增加,使其磁矩保持接近AP1铁磁层的磁矩。 较厚的AP2层允许电子的更多的体自旋依赖性散射,这增加了传感器的磁阻。 退火的AP2层导致铁磁材料晶粒和添加元素晶粒的更多偏析,并且因此由于电子的更多的界面散射而导致的磁阻的进一步改善。