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    • 6. 发明授权
    • Semiconductor memory device with shortened connection length among memory block, data buffer and data bus
    • 具有缩短存储块,数据缓冲器和数据总线之间连接长度的半导体存储器件
    • US06787859B2
    • 2004-09-07
    • US10223319
    • 2002-08-20
    • Takashi ItouMasaki ShimodaYasuhiko Tsukikawa
    • Takashi ItouMasaki ShimodaYasuhiko Tsukikawa
    • H01L2994
    • G11C5/025G11C7/18
    • There is provided a semiconductor memory device including eight memory blocks 20a to 20h, first data bus 22a, and second data bus 22b. The eight memory blocks are arranged at respective eight of the total nine areas 11 to 19 defined in a three rows by three columns matrix except for a center area 19. A first data bus 22a linearly extends between memory blocks in the first and second row of the matrix. A second data bus 22b linearly extends between memory blocks in the second and third row of the matrix. The eight memory blocks includes a first group of the four memory blocks arranged adjacent the first data bus and connected to the first data bus and a second group of the four memory blocks arranged adjacent the second data bus and connected to the second data bus.
    • 提供了包括八个存储块20a至20h,第一数据总线22a和第二数据总线22b的半导体存储器件。 八个存储块被布置在除了中心区域19之外以三行×三列矩阵定义的总共九个区域11至19中的相应八个。第一数据总线22a在第一和第二行中的存储块之间线性地延伸 矩阵。 第二数据总线22b在矩阵的第二和第三行中的存储块之间线性地延伸。 八个存储器块包括与第一数据总线相邻布置并连接到第一数据总线的四个存储器块的第一组以及与第二数据总线相邻布置并连接到第二数据总线的四个存储器块的第二组。
    • 9. 发明授权
    • Semiconductor memory device having a plurality of I/O terminal groups
    • 具有多个I / O端子组的半导体存储器件
    • US5623447A
    • 1997-04-22
    • US597822
    • 1996-02-07
    • Masaki Shimoda
    • Masaki Shimoda
    • G11C11/401G11C7/10G11C11/409G11C7/00
    • G11C7/1057G11C7/10G11C7/1051G11C7/1078G11C2207/108
    • There are provided upper and lower data I/O terminal groups, each forming a unit for input/output of data. When an early write detecting circuit included in a clock generating circuit detects designation of an early write mode and one of the groups is designated for writing, lower or upper input buffers controlled by write control circuit takes in the data. Concurrently, in response to the detection of mode, lower or upper output buffer uses, for reading, the other group not taking in data for writing. In this mode, therefore, the write and read operations are executed simultaneously. Thereby, simultaneous operation of the write and read data is allowed, and a data processing speed is improved.
    • 提供了上下数据I / O端子组,每个组成一个单元,用于输入/输出数据。 当包括在时钟发生电路中的早期写入检测电路检测到早期写入模式的指定并且指定组中的一个写入时,由写入控制电路控制的下部或上部输入缓冲器接收数据。 同时,响应于模式的检测,较低或较高的输出缓冲器用于读取另一组不接收数据进行写入。 因此,在该模式中,同时执行写入和读取操作。 从而,允许写入和读取数据的同时操作,并且提高数据处理速度。
    • 10. 发明授权
    • Block partitioned dynamic semiconductor memory device
    • 块分割动态半导体存储器件
    • US4934826A
    • 1990-06-19
    • US211548
    • 1988-06-24
    • Hideshi MiyatakeHiroyuki YamasakiMasaki ShimodaKazuhiro Tsukamoto
    • Hideshi MiyatakeHiroyuki YamasakiMasaki ShimodaKazuhiro Tsukamoto
    • G11C11/406G11C11/408G11C11/409
    • G11C11/409G11C11/406G11C11/408
    • A word line driving signal generating circuit and a sense amplifier activating signal generating circuit are provided for every partitioned memory cell array. When the levels of an external RAS signal and an external CAS signal have a predetermined relation and an external RNC signal remains at a predetermined potential or more, a refresh operation is started. A refresh address is generated from a refresh address counter in a sense restore control circuit. All of the memory cell arrays are simultaneously refreshed in response to the address. On this occasion, an operation for selecting a column by a column decoder provided in each of the memory cell arrays is inhibited. In the case in which an input of the external RNC signal is not prepared, when the levels of the external RAS signal and the external CAS signal have a predetermined relation and this state is held in a predetermined time period or more, the same refresh operation as described above is started.
    • 为每个分区存储单元阵列提供字线驱动信号发生电路和读出放大器激活信号产生电路。 当外部RAS信号和外部CAS信号的电平具有预定关系并且外部RNC信号保持在预定电位或更大时,开始刷新操作。 从感测恢复控制电路中的刷新地址计数器产生刷新地址。 响应于地址,所有的存储单元阵列被同时刷新。 在这种情况下,禁止通过设置在每个存储单元阵列中的列解码器来选择列的操作。 在没有准备外部RNC信号的输入的情况下,当外部RAS信号和外部CAS信号的电平具有预定关系并且该状态保持在预定时间段或更长时间时,相同的刷新操作 如上所述开始。