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    • 2. 发明授权
    • Freeze-drying apparatus and freeze-drying method
    • 冷冻干燥装置和冷冻干燥法
    • US08978268B2
    • 2015-03-17
    • US13003002
    • 2009-07-08
    • Masaki ItouKyuzo NakamuraTakeo KatoKatsuhiko ItouTakashi Hanamoto
    • Masaki ItouKyuzo NakamuraTakeo KatoKatsuhiko ItouTakashi Hanamoto
    • F26B5/06F26B9/00A23L3/44
    • A23L3/44F26B5/065
    • [Object] To provide a freeze-drying apparatus and a freeze-drying method, which are capable of increasing a drying efficiency of frozen particles.[Solving Means] The freeze-drying apparatus 100 includes a freezing chamber 10 into which a raw material fluid F is injected. During the injection of the raw material fluid F, after the injection of the raw material fluid F, or for a time period covering the start to the termination of the injection of the raw material fluid F, a shelf 16 is vibrated in a horizontal direction due to an actuation of vibration generators 31. With this, the frozen particles deposited on the shelf 16 are evenly diffused on the shelf 16 in such a manner that a deposition thickness thereof becomes smaller or a single layer thereof is formed. With this, a freezing efficiency and the drying efficiency of individual particles are promoted.
    • 提供能够提高冷冻颗粒的干燥效率的冷冻干燥装置和冷冻干燥方法。 [解决方案]冷冻干燥装置100包括注入原料流体F的冷冻室10。 在注入原料流体F的过程中,在注入原料流体F之后,或者在原料流体F的注入开始至结束的期间,搁架16在水平方向上振动 由此,沉积在搁架16上的冻结颗粒以沉积厚度变小或形成单层的方式均匀地扩散到搁板16上。 由此,促进了各个颗粒的冷冻效率和干燥效率。
    • 5. 发明申请
    • FREEZE-DRYING APPARATUS AND FREEZE-DRYING METHOD
    • 冷冻干燥设备和冷冻干燥方法
    • US20110113644A1
    • 2011-05-19
    • US13002994
    • 2009-07-08
    • Masaki ItouKyuzo NakamuraTakeo KatoKatsuhiko ItouTakao Kinoshita
    • Masaki ItouKyuzo NakamuraTakeo KatoKatsuhiko ItouTakao Kinoshita
    • F26B5/06F26B5/04
    • A23L3/44F26B5/065
    • [Object] To provide a freeze-drying apparatus and a freeze-drying method, which are capable of increasing a collection rate of a raw material without a need for providing a member such as a baffle plate or the like.[Solving Means] The freeze-drying apparatus 100 includes: a container 4 to store a raw material fluid F; a freezing chamber 10 being a vacuum chamber; a vacuum pump 1 to exhaust the freezing chamber 10; and an injection mechanism 25 to inject the raw material fluid F stored in the container 4 into the freezing chamber 10. The cold trap 20 is arranged within the freezing chamber 10, and hence a phenomenon that the raw material is discharged to the outside of the vacuum chamber together with a vapor as in the past can be prevented. With this, the collection rate of the raw material can be increased. Further, it becomes unnecessary to provide the baffle plate or the like for preventing the phenomenon in vicinity of an exhaust port of the vacuum chamber.
    • 本发明提供能够提高原料收集率而不需要设置挡板等构件的冷冻干燥装置和冷冻干燥方法。 [解决方案]冷冻干燥装置100包括:储存原料流体F的容器4; 冷冻室10是真空室; 用于排出冷冻室10的真空泵1; 以及将存储在容器4中的原料流体F注入到冷冻室10中的注入机构25.冷阱20配置在冷冻室10内,因此将原料排出到 可以防止真空室与过去的蒸气一起。 由此,可以提高原料的收集率。 此外,不需要设置用于防止真空室的排气口附近的现象的挡板等。
    • 6. 发明申请
    • FREEZE-DRYING APPARATUS
    • 冷冻干燥装置
    • US20110113643A1
    • 2011-05-19
    • US13003005
    • 2009-07-08
    • Masaki ItouKyuzo NakamuraTakeo KatoKatsuhiko ItouTakao Kinoshita
    • Masaki ItouKyuzo NakamuraTakeo KatoKatsuhiko ItouTakao Kinoshita
    • F26B13/30
    • A23L3/44F26B5/065F26B21/004
    • [Object] To provide a freeze-drying apparatus capable of achieving an increase of a processing capacity without causing a variation of a particle diameter.[Solving Means] A freeze-drying apparatus 100 according to an embodiment of the present invention includes: a freezing chamber 10 forming a vacuum chamber; and an injector 25. The injector 25 includes a tube member 29 provided to the vacuum chamber, and a nozzle 9 including a plurality of injection holes 92 open to an inside of the tube member 29. The injector 25 injects a raw material fluid F, which is fed to the tube member 29, from the nozzle 9 into the vacuum chamber. The respective injection holes 92 are each formed so as to be open to the inside of the tube member 29, and hence the raw material fluid F is injected through the respective injection holes 92 at the same injection pressure. With this, it is possible to achieve the increase of the processing capacity without causing the variation of the particle diameter.
    • 本发明提供能够在不引起粒径变化的情况下实现加工能力的提高的冷冻干燥装置。 [解决方案]根据本发明的实施方式的冷冻干燥装置100包括:形成真空室的冷冻室10; 和喷射器25.喷射器25包括设置在真空室中的管件29和一个喷嘴9,喷嘴9包括通向管件29内部的多个喷射孔92.喷射器25喷射原料流体F, 其从喷嘴9被供给到管构件29进入真空室。 各喷射孔92分别形成为向管状部件29的内侧开口,因此原料流体F以相同的喷射压力通过各喷射孔92喷射。 由此,可以在不引起粒径变化的情况下实现加工能力的提高。
    • 8. 发明授权
    • Method for forming tantalum nitride film
    • 形成氮化钽膜的方法
    • US08158198B2
    • 2012-04-17
    • US11885399
    • 2006-03-03
    • Narishi GonoheSatoru ToyodaHarunori UshikawaTomoyasu KondoKyuzo Nakamura
    • Narishi GonoheSatoru ToyodaHarunori UshikawaTomoyasu KondoKyuzo Nakamura
    • C23C16/00
    • H01L21/76843C23C16/34C23C16/45525C23C16/45534C23C16/45536C23C16/4554C23C16/45553H01L21/28562
    • A tantalum nitride film-forming method comprises the steps of introducing a raw gas consisting of a coordination compound constituted by an elemental tantalum (Ta) having a coordinated ligand represented by the general formula: N═(R,R′) (in the formula, R and R′ may be the same or different and each represents an alkyl group having 1 to 6 carbon atoms), and a halogen gas into a vacuum chamber; and reacting these components with one another on a substrate to thus form a surface adsorption film comprising a mono-atomic or multi (several)-atomic layer and composed of a compound represented by the following general formula: TaNx(Hal)y(R, R′)z (in the formula, Hal represents a halogen atom), then introducing radicals generated from an H atom-containing compound to thus remove Ta—N bonds present in the resulting compound through breakage thereof and remove, at the same time, the remaining R(R′) groups bonded to the N atoms present in the compound through the cleavage thereof and to thus form a tantalum nitride film rich in tantalum atoms. The resulting tantalum nitride film has a low resistance, low contents of C and N atoms, and a high compositional ratio: Ta/N, can ensure sufficiently high adherence to the distributing wire-forming film and can thus be useful as a barrier film. Moreover, tantalum particles are implanted in the resulting film according to the sputtering technique to thus further enrich the film with tantalum.
    • 氮化钽膜形成方法包括以下步骤:引入由具有由以下通式表示的配位配体的元素钽(Ta)构成的配位化合物构成的原料气体:N =(R,R')(式 R和R'可以相同或不同,各自表示碳原子数1〜6的烷基),卤素气体进入真空室; 并将这些组分彼此反应在基底上,从而形成包含单原子或多(多个)原子层的表面吸附膜,并由以下通式表示的化合物组成:TaNx(Hal)y(R, R')z(式中,Hal表示卤素原子),然后引入由含H原子的化合物产生的自由基,从而通过其残留除去所得化合物中存在的Ta-N键,同时除去 剩余的R(R')基团通过其切割而与化合物中存在的N原子键合,从而形成富含钽原子的氮化钽膜。 所得到的氮化钽膜具有低电阻,C原子和N原子含量低,组成比高:Ta / N可以确保足够高的附着线分布线形成膜,因此可用作阻挡膜。 此外,根据溅射技术将钽颗粒注入到所得的膜中,从而进一步用钽富集膜。