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    • 1. 发明授权
    • Trench-filling method and film-forming system
    • 沟槽填充法和成膜系统
    • US08722510B2
    • 2014-05-13
    • US13194426
    • 2011-07-29
    • Masahisa WatanabeKazuhide Hasebe
    • Masahisa WatanabeKazuhide Hasebe
    • H01L21/76
    • H01L21/67167H01L21/02164H01L21/02222H01L21/02304H01L21/02323H01L21/32055H01L21/32105H01L21/67207H01L21/76227
    • A method of filling a trench comprises heating a semiconductor substrate having a trench formed therein and an oxide film formed at least on the sidewall of the trench and supplying an aminosilane gas to the surface of the substrate so as to form a seed layer on the semiconductor substrate, heating the semiconductor substrate having the seed layer formed thereon and supplying a monosilane gas to the surface of the seed layer so as to form a silicon film on the seed layer, filling the trench of the semiconductor substrate, which has the silicon film formed thereon, with a filling material that shrinks by burning, and burning the semiconductor substrate coated by the filling material filling the trench in an atmosphere containing water and/or a hydroxy group while changing the filling material into a silicon oxide and changing the silicon film and the seed layer into a silicon oxide.
    • 填充沟槽的方法包括加热其中形成有沟槽的半导体衬底和至少形成在沟槽的侧壁上的氧化膜,并将氨基硅烷气体供应到衬底的表面,以在半导体上形成晶种层 对其上形成有籽晶层的半导体基板进行加热,并向种子层的表面供给单硅烷气体,以在种子层上形成硅膜,填充形成有硅膜的半导体衬底的沟槽 在其上通过燃烧收缩的填充材料,并且在将填充材料变为氧化硅并且改变硅膜的同时,在填充有水和/或羟基的气氛中填充沟槽的填充材料涂覆的半导体衬底燃烧, 种子层成为氧化硅。