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1. 发明申请

US20080092095A1 Design Structure and System for Identification of Defects on Circuits or Other Arrayed Products 有权
标题翻译：用于识别电路或其他阵列产品缺陷的设计结构和系统
公开(公告)号：US20080092095A1
公开(公告)日：2008-04-17
申请号：US11926605
申请日：2007-10-29
申请人： Mary Lanzerotti , Emmanuel Yashchin , Christina Landers , Asya Takken , Brian Trapp
发明人： Mary Lanzerotti , Emmanuel Yashchin , Christina Landers , Asya Takken , Brian Trapp
IPC分类号： G06F17/50
CPC分类号： H01L22/20 , H01L2924/0002 , H01L2924/00
摘要： A system and method is disclosed for assessing a probability of failure of operation of a semiconductor wafer. The method includes inputting risk factor data into a memory and inputting a plurality of wafers into a semiconductor fabrication manufacturing process. A subset of wafers is select to obtain a sample population and at least one region of each wafer of the sample population is inspected. Circuit design data associated with each wafer of the sample population is obtained and one or more defects that present an increased risk to the operation of a particular wafer are identified. The identification is a function of the risk factor data, the inspecting step and the circuit design data. A probability of semiconductor wafer failure is calculated.
摘要翻译：公开了一种用于评估半导体晶片的操作失败概率的系统和方法。该方法包括将危险因素数据输入存储器并将多个晶片输入到半导体制造制造过程中。选择晶片的子集以获得样本群体，并且检查样本群体的每个晶片的至少一个区域。获得与样品群的每个晶片相关联的电路设计数据，并且识别出对特定晶片的操作具有增加的风险的一个或多个缺陷。识别是风险因素数据，检查步骤和电路设计数据的函数。计算半导体晶片故障的概率。

2. 发明申请

US20080148201A1 Design Structure and System for Identification of Defects on Circuits or Other Arrayed Products 审中-公开
标题翻译：用于识别电路或其他阵列产品缺陷的设计结构和系统
公开(公告)号：US20080148201A1
公开(公告)日：2008-06-19
申请号：US11969294
申请日：2008-01-04
申请人： Mary Lanzerotti , Emmanuel Yashchin , Christina Landers , Asya Takken , Brian Trapp
发明人： Mary Lanzerotti , Emmanuel Yashchin , Christina Landers , Asya Takken , Brian Trapp
IPC分类号： G06F17/50
CPC分类号： H01L22/20
摘要： A system and method is disclosed for assessing a probability of failure of operation of a semiconductor wafer. The method includes inputting risk factor data into a memory and inputting a plurality of wafers into a semiconductor fabrication manufacturing process. A subset of wafers is selected to obtain a sample population and at least one region of each wafer of the sample population is inspected. Circuit design data associated with each wafer of the sample population is obtained and one or more defects that present an increased risk to the operation of a particular wafer are identified. The identification is a function of the risk factor data, the inspecting step and the circuit design data. A probability of semiconductor wafer failure is calculated.
摘要翻译：公开了一种用于评估半导体晶片的操作失败概率的系统和方法。该方法包括将危险因素数据输入存储器并将多个晶片输入到半导体制造制造过程中。选择晶片的子集以获得样本群体，并且检查样本群体的每个晶片的至少一个区域。获得与样品群的每个晶片相关联的电路设计数据，并且识别出对特定晶片的操作具有增加的风险的一个或多个缺陷。识别是风险因素数据，检查步骤和电路设计数据的函数。计算半导体晶片故障的概率。

3. 发明申请

US20060265185A1 System for identification of defects on circuits or other arrayed products 审中-公开
标题翻译：用于识别电路或其他阵列产品上的缺陷的系统
公开(公告)号：US20060265185A1
公开(公告)日：2006-11-23
申请号：US11493092
申请日：2006-07-25
申请人： Mary Lanzerotti , Emmanuel Yashchin , Christina Landers , Asya Takken , Brian Trapp
发明人： Mary Lanzerotti , Emmanuel Yashchin , Christina Landers , Asya Takken , Brian Trapp
IPC分类号： G06F17/18
CPC分类号： H01L22/20
摘要： A system and method is disclosed for assessing a probability of failure of operation of a semiconductor wafer. The method includes inputting risk factor data into a memory and inputting a plurality of wafers into a semiconductor fabrication manufacturing process. A subset of wafers is selected to obtain a sample population and at least one region of each wafer of the sample population is inspected. Circuit design data associated with each wafer of the sample population is obtained and one or more defects that present an increased risk to the operation of a particular wafer are identified. The identification is a function of the risk factor data, the inspecting step and the circuit design data. A probability of semiconductor wafer failure is calculated.
摘要翻译：公开了一种用于评估半导体晶片的操作失败概率的系统和方法。该方法包括将危险因素数据输入存储器并将多个晶片输入到半导体制造制造过程中。选择晶片的子集以获得样本群体，并且检查样本群体的每个晶片的至少一个区域。获得与样品群的每个晶片相关联的电路设计数据，并且识别出对特定晶片的操作具有增加的风险的一个或多个缺陷。识别是风险因素数据，检查步骤和电路设计数据的函数。计算半导体晶片故障的概率。

4. 发明授权

US07752581B2 Design structure and system for identification of defects on circuits or other arrayed products 有权
标题翻译：用于识别电路或其他阵列产品上的缺陷的设计结构和系统
公开(公告)号：US07752581B2
公开(公告)日：2010-07-06
申请号：US11926605
申请日：2007-10-29
申请人： Mary Lanzerotti , Emmanuel Yashchin , Christina Landers , Asya Takken , Brian Trapp
发明人： Mary Lanzerotti , Emmanuel Yashchin , Christina Landers , Asya Takken , Brian Trapp
IPC分类号： G06F17/50
CPC分类号： H01L22/20 , H01L2924/0002 , H01L2924/00
摘要： A system and method is disclosed for assessing a probability of failure of operation of a semiconductor wafer. The method includes inputting risk factor data into a memory and inputting a plurality of wafers into a semiconductor fabrication manufacturing process. A subset of wafers is select to obtain a sample population and at least one region of each wafer of the sample population is inspected. Circuit design data associated with each wafer of the sample population is obtained and one or more defects that present an increased risk to the operation of a particular wafer are identified. The identification is a function of the risk factor data, the inspecting step and the circuit design data. A probability of semiconductor wafer failure is calculated.
摘要翻译：公开了一种用于评估半导体晶片的操作失败概率的系统和方法。该方法包括将危险因素数据输入存储器并将多个晶片输入到半导体制造制造过程中。选择晶片的子集以获得样本群体，并且检查样本群体的每个晶片的至少一个区域。获得与样品群的每个晶片相关联的电路设计数据，并且识别出对特定晶片的操作具有增加的风险的一个或多个缺陷。识别是风险因素数据，检查步骤和电路设计数据的函数。计算半导体晶片故障的概率。

5. 发明授权

US07346470B2 System for identification of defects on circuits or other arrayed products 有权
标题翻译：用于识别电路或其他阵列产品上的缺陷的系统
公开(公告)号：US07346470B2
公开(公告)日：2008-03-18
申请号：US10459132
申请日：2003-06-10
申请人： Mary Wisniewski , Emmanuel Yashchin , Christina Landers , Asya Takken , Brian Trapp
发明人： Mary Wisniewski , Emmanuel Yashchin , Christina Landers , Asya Takken , Brian Trapp
IPC分类号： G06F15/00 , G06F17/50
CPC分类号： H01L22/20
摘要： A system and method is disclosed for assessing a probability of failure of operation of a semiconductor wafer. The method includes inputting risk factor data into a memory and inputting a plurality of wafers into a semiconductor fabrication manufacturing process. A subset of wafers is selected to obtain a sample population and at least one region of each wafer of the sample population is inspected. Circuit design data associated with each wafer of the sample population is obtained and one or more defects that present an increased risk to the operation of a particular wafer are identified. The identification is a function of the risk factor data, the inspecting step and the circuit design data. A probability of semiconductor wafer failure is calculated.
摘要翻译：公开了一种用于评估半导体晶片的操作失败概率的系统和方法。该方法包括将危险因素数据输入存储器并将多个晶片输入到半导体制造制造过程中。选择晶片的子集以获得样本群体，并且检查样本群体的每个晶片的至少一个区域。获得与样品群的每个晶片相关联的电路设计数据，并且识别出对特定晶片的操作具有增加的风险的一个或多个缺陷。识别是风险因素数据，检查步骤和电路设计数据的函数。计算半导体晶片故障的概率。

6. 发明申请

US20130041705A1 DISTRIBUTION NETWORK MAINTENANCE PLANNING 有权
标题翻译：分销网络维护计划
公开(公告)号：US20130041705A1
公开(公告)日：2013-02-14
申请号：US13205190
申请日：2011-08-08
申请人： Arun Hampapur , Jayant R. Kalagnanam , Emmanuel Yashchin , Yada Zhu
发明人： Arun Hampapur , Jayant R. Kalagnanam , Emmanuel Yashchin , Yada Zhu
IPC分类号： G06Q10/00
CPC分类号： G06Q10/10 , G06Q10/06
摘要： A system, method and computer program product for maintaining an infrastructure of components. The system receives structured data, unstructured data, and infrastructure data from a database. The system runs at least one statistical and optimization modeler with one or more of: the received structured data, the received unstructured data and the received infrastructure data, in order to calculate a health index of at least one component of the infrastructure. The health index represents a health attribute of the at least one component. The system establishes at least one maintenance plan of the infrastructure, based on the calculated health index. Each established maintenance plan is associated with at least one health index. The system compares health indices of the at least one established maintenance plan. The system selects a plan, among the at least one established maintenance plan, whose health index is a maximum among the compared health indices.
摘要翻译：一种用于维护组件基础设施的系统，方法和计算机程序产品。系统从数据库接收结构化数据，非结构化数据和基础架构数据。该系统运行至少一个统计和优化建模器，具有以下一个或多个：接收的结构化数据，接收的非结构化数据和接收的基础设施数据，以便计算基础设施的至少一个组件的健康指数。健康指数表示至少一个组件的健康属性。系统根据计算出的健康指数建立基础设施的至少一个维护计划。每个既定的维护计划与至少一个健康指数相关联。该系统比较至少一个已建立的维护计划的健康指数。所述系统在所述至少一个已建立的维护计划中选择其健康指数在所述健康指数中的最大值的计划。

7. 发明申请

US20110087522A1 METHOD FOR DEPLOYING A PROBING ENVIRONMENT FOR PROVISIONED SERVICES TO RECOMMEND OPTIMAL BALANCE IN SERVICE LEVEL AGREEMENT USER EXPERIENCE AND ENVIRONMENTAL METRICS 审中-公开
标题翻译：为提供服务的探索环境提供服务水平协议中的最佳平衡的方法用户体验和环境标准
公开(公告)号：US20110087522A1
公开(公告)日：2011-04-14
申请号：US12575987
申请日：2009-10-08
申请人： Kirk A. Beaty , Rick A. Hamilton, II , Neal M. Keller , Andrzej Kochut , Clifford A. Pickover , Elizabeth J. Poole , Mariusz Sabath , Emmanuel Yashchin , Alexander Zlatsin
发明人： Kirk A. Beaty , Rick A. Hamilton, II , Neal M. Keller , Andrzej Kochut , Clifford A. Pickover , Elizabeth J. Poole , Mariusz Sabath , Emmanuel Yashchin , Alexander Zlatsin
IPC分类号： G06Q10/00 , G06Q50/00
CPC分类号： H04L43/12 , G06Q10/063 , G06Q10/0639 , G06Q10/10 , G06Q10/30 , H04L41/12 , H04L41/145 , H04L41/5006 , H04L41/5048 , H04L41/5051 , Y02W90/20
摘要： A system and method of determining performance metrics for inclusion in a Service Level Agreement (SLA) between a customer and a host computing service provider. The method comprises: receiving a provisioning request from a customer including receiving computing performance requirement parameters and environmental parameters for inclusion in the SLA from the customer; deploying discovery tools to identify relevant infrastructure components based on performance metrics. Based on identification of the customer's relevant infrastructure components, probes are deployed and installed. Then, data is obtained from the probes while changing infrastructure components for simulating and assessing impact of one or more different customer scenarios for different performance policies. In one aspect, the obtained data is used to identify and implement an a priori risk sharing agreement between the customer and service provider. In a further aspect, the data obtained for simulating and assessing impact of one or more different customer policies include data for simulating and assessing different environmental policies.
摘要翻译：确定包含在客户和主计算服务提供商之间的服务水平协议（SLA）中的性能度量的系统和方法。该方法包括：从客户接收供应请求，包括接收来自客户的SLA中包含的计算性能要求参数和环境参数; 部署发现工具以根据性能指标来识别相关的基础架构组件。根据客户相关基础设施组件的识别，部署和安装探测器。然后，在更改基础架构组件以模拟和评估不同性能策略的一个或多个不同客户方案的影响的同时，从探测器获取数据。在一个方面，所获得的数据用于识别和实现客户和服务提供商之间的先验风险共享协议。在另一方面，为模拟和评估一个或多个不同客户政策的影响而获得的数据包括用于模拟和评估不同环境政策的数据。

8. 发明申请

US20080065465A1 Method for detection of hazard rate increase in time-managed lifetime data 审中-公开
标题翻译：检测时间管理寿命数据危险率增加的方法
公开(公告)号：US20080065465A1
公开(公告)日：2008-03-13
申请号：US11519787
申请日：2006-09-13
申请人： Stephen Restivo , Emmanuel Yashchin
发明人： Stephen Restivo , Emmanuel Yashchin
IPC分类号： G06Q10/00 , G07G1/00 , G06F17/30 , G06Q30/00
CPC分类号： G06Q30/06 , G06Q10/0635
摘要： A method for detecting a hazard rate increase in time-managed lifetime data includes specifying acceptable and unacceptable levels of a shape parameter, summarizing rows of a data table by pre-specified criterion and consolidating the data table into a less refined block representation, computing bias-adjusted estimators of the shape parameter for every block in the data table, computing weights wi, i=1, 2, . . . , N corresponding to the estimators ĉi, the weights wi decreasing as the variance of ĉi increases, computing a threshold h to be applied to a set s1, s2, . . . , sN defined by s0=0, si=max[0, si-1+wi (ĉi−k)], I=1,2, . . . ,N, and applying the threshold to the set s1, s2, . . . , sN that was observed and establishing whether smax>h, where smax=max [s1, s2, . . . , sN].
摘要翻译：用于检测时间管理的寿命数据中的危险率增加的方法包括指定形状参数的可接受和不可接受的级别，通过预先指定的标准来总结数据表的行并将数据表合并为较不精细的块表示，计算偏差 - 数据表中每个块的形状参数的调整估计量，计算权重w i i i，i = 1,2。。。，N对应于估计器c i，随着c i i的方差而减小的权重越大，计算要应用的阈值h 到一个集合1 ，s 2 。。。由s 0 0定义的s N i = 1，...，i max = 0，...，（i-1）]，I = 1,2，...。。。，N，并将阈值应用于集合s 1，S 2，...。。。，观察到的，并且确定是否最小> h，其中s max = max [s 1 / s 2，...，。。，N N]。

9. 发明申请

US20060265625A1 System and method for early detection of system component failure 有权
标题翻译：系统和方法用于早期发现系统组件故障
公开(公告)号：US20060265625A1
公开(公告)日：2006-11-23
申请号：US11132265
申请日：2005-05-19
申请人： Andrew Dubois , Vaughn Evans , David Jensen , Ildar Khabibrakhmanov , Stephen Restivo , Christopher Ross , Emmanuel Yashchin
发明人： Andrew Dubois , Vaughn Evans , David Jensen , Ildar Khabibrakhmanov , Stephen Restivo , Christopher Ross , Emmanuel Yashchin
IPC分类号： G06F11/00
CPC分类号： G07C3/00
摘要： A system and method for detecting trends in time-managed lifetime data for products shipped in distinct vintages within a time window. Data is consolidated from several sources and represented in a form amenable to detection of trends using a criterion for measuring failure. A weight is applied to the failure measures, the weight increasing over the time the products are in the time window. A function of weighted failures is used to define a severity index for proximity to an unacceptable level of failures, and an alarm signal is triggered at a threshold level that allows the level of false alarms to be pre-set.
摘要翻译：一种用于在时间窗口内检测在不同年份运输的产品的时间管理生命周期数据趋势的系统和方法。数据从几个来源合并，并以适合于使用测量失败的标准来检测趋势的形式表示。应用重量应用于故障测量，产品在时间窗口内的重量增加。使用加权失败的功能来定义接近不可接受的故障级别的严重性指标，并且在阈值级别触发警报信号，允许预设错误警报级别。

10. 发明申请

US20130282355A1 MAINTENANCE PLANNING AND FAILURE PREDICTION FROM DATA OBSERVED WITHIN A TIME WINDOW 有权
标题翻译：维护计划和故障预测从时间窗口中观察到的数据
公开(公告)号：US20130282355A1
公开(公告)日：2013-10-24
申请号：US13454743
申请日：2012-04-24
申请人： Jonathan R. M. Hosking , Emmanuel Yashchin , Yada Zhu
发明人： Jonathan R. M. Hosking , Emmanuel Yashchin , Yada Zhu
IPC分类号： G06G7/62
CPC分类号： G06Q10/109
摘要： A system, method and computer program product for predicting a failure of equipment from prior maintenance data of the equipment collected during a time duration estimate a number of preceding failures of the equipment prior to the time duration. The system, method and computer program product construct a model, based on the prior maintenance data, of an impact of an external intervention on a failure of the equipment. The system, method and computer program product construct a model, based on the constructed model of the impact of the external intervention and the estimated number of preceding failures, a replacement policy of the equipment and a probability of a subsequent failure of the equipment in a subsequent time period.
摘要翻译：一种系统，方法和计算机程序产品，用于根据在时间段内收集的设备的先前维护数据来预测设备的故障，以估计在该持续时间之前设备的先前故障的数量。系统，方法和计算机程序产品根据现有维护数据构建了外部干预对设备故障影响的模型。系统，方法和计算机程序产品构建一个模型，基于外部干预影响的构建模型和以前故障的估计数，设备的替换策略和设备的后续故障概率后续时间

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