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    • 2. 发明授权
    • High-voltage MOS transistor and corresponding manufacturing method
    • 高压MOS晶体管及相应的制造方法
    • US07265426B2
    • 2007-09-04
    • US11191894
    • 2005-07-27
    • Klaus PetzoldSteffi LindenkreuzJoachim Strauss
    • Klaus PetzoldSteffi LindenkreuzJoachim Strauss
    • H01L29/94
    • H01L29/0847H01L29/0626H01L29/42368H01L29/66659H01L29/7835
    • A high-voltage MOS transistor having: a first region of a first conductivity type; a source region of the second conductivity type, which is introduced into the first region; a drain region of the second conductivity type, which is introduced into the first region; a channel region on the upper side of the first region, between the source region and the drain region; a field-oxide region in the drain region, between the source region and the drain region; a gate-oxide region over the channel region and between the edge of the drain region and the field-oxide region; a magnetoresistor region between the source region and the drain region, over the gate-oxide region and over at least a part of the field-oxide region; the drain region having a drain-terminal region and a drain-extension region and the doping profile of the drain-extension region is designed so that an avalanche breakdown occurs between the source region and the drain region, in a breakdown region that is on the edge of the drain-extension region and is not situated at the upper surface. Also it describes corresponding manufacturing methods.
    • 一种高电压MOS晶体管,具有:具有第一导电类型的第一区域; 第二导电类型的源极区域,被引入第一区域; 第二导电类型的漏极区域,被引入第一区域; 在所述源极区域和所述漏极区域之间的所述第一区域的上侧的沟道区域; 在漏极区域中的源极区域和漏极区域之间的场氧化物区域; 沟道区域上方的漏极区域和场氧化物区域的边缘之间的栅极 - 氧化物区域; 源区域和漏极区域之间的磁阻电阻区域,在栅极 - 氧化物区域上方和场氧化物区域的至少一部分上方; 具有漏极 - 端子区域和漏极 - 延伸区域的漏极区域以及漏极 - 延伸区域的掺杂分布被设计成使得在源极区域和漏极区域之间发生雪崩击穿, 漏极延伸区域的边缘并且不位于上表面。 它也描述了相应的制造方法。
    • 3. 发明申请
    • High-voltage MOS transistor and corresponding manufacturing method
    • 高压MOS晶体管及相应的制造方法
    • US20060022294A1
    • 2006-02-02
    • US11191894
    • 2005-07-27
    • Klaus PetzoldSteffi LindenkreuzJoachim Strauss
    • Klaus PetzoldSteffi LindenkreuzJoachim Strauss
    • H01L23/58H01L21/336
    • H01L29/0847H01L29/0626H01L29/42368H01L29/66659H01L29/7835
    • A high-voltage MOS transistor having: a first region of a first conductivity type; a source region of the second conductivity type, which is introduced into the first region; a drain region of the second conductivity type, which is introduced into the first region; a channel region on the upper side of the first region, between the source region and the drain region; a field-oxide region in the drain region, between the source region and the drain region; a gate-oxide region over the channel region and between the edge of the drain region and the field-oxide region; a magnetoresistor region between the source region and the drain region, over the gate-oxide region and over at least a part of the field-oxide region; the drain region having a drain-terminal region and a drain-extension region and the doping profile of the drain-extension region is designed so that an avalanche breakdown occurs between the source region and the drain region, in a breakdown region that is on the edge of the drain-extension region and is not situated at the upper surface. Also it describes corresponding manufacturing methods.
    • 一种高电压MOS晶体管,具有:具有第一导电类型的第一区域; 第二导电类型的源极区域,被引入第一区域; 第二导电类型的漏极区域,被引入第一区域; 在所述源极区域和所述漏极区域之间的所述第一区域的上侧的沟道区域; 在漏极区域中的源极区域和漏极区域之间的场氧化物区域; 沟道区域上方的漏极区域和场氧化物区域的边缘之间的栅极 - 氧化物区域; 源区域和漏极区域之间的磁阻电阻区域,在栅极 - 氧化物区域上方和场氧化物区域的至少一部分上方; 具有漏极 - 端子区域和漏极 - 延伸区域的漏极区域以及漏极 - 延伸区域的掺杂分布被设计成使得在源极区域和漏极区域之间发生雪崩击穿, 漏极延伸区域的边缘并且不位于上表面。 它也描述了相应的制造方法。