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    • 4. 发明授权
    • High density test head
    • 高密度测试头
    • US4605894A
    • 1986-08-12
    • US527214
    • 1983-08-29
    • Gerald CoxBill DeHaven
    • Gerald CoxBill DeHaven
    • G01R31/28G01R1/073G01R31/319G01R31/26G01R1/02G01R17/02
    • G01R31/31924G01R1/073
    • An improved automatic test equipment system for testing electronic assemblies wherein such system includes a main cabinet and a test head. Driver and load circuits are partitioned between the test head and main cabinet so that high power dissipating portions of the load circuit and drive circuit are located in the main cabinet and the low power dissipating portions of the load circuit and drive circuit are positioned in the test head. Disclosed is a structure by which the partitioning of the driver and load circuits can be achieved, the structure including a transmission line and a current buffer which permit the transmission of current pulses over long distances without degradation in the current pulse shape. The structure utilizes a common base current buffer stage with collector base clamping.
    • 一种用于测试电子组件的改进的自动测试设备系统,其中该系统包括主机柜和测试头。 驱动器和负载电路在测试头和主机柜之间分隔开,使得负载电路和驱动电路的大功率消耗部分位于主机柜中,并且负载电路和驱动电路的低功率耗散部分位于测试中 头。 公开了可以实现驱动器和负载电路的分割的结构,该结构包括允许电流脉冲在长距离上传输而不降低电流脉冲形状的传输线和电流缓冲器。 该结构采用集电极基极钳位的公共基极电流缓冲级。