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    • 2. 发明申请
    • Low loss SOI/CMOS compatible silicon waveguide and method of making the same
    • 低损耗SOI / CMOS兼容硅波导及其制造方法
    • US20070000862A1
    • 2007-01-04
    • US11516217
    • 2006-09-06
    • Vipulkumar PatelPrakash GothoskarRobert MontgomeryMargaret Ghiron
    • Vipulkumar PatelPrakash GothoskarRobert MontgomeryMargaret Ghiron
    • B29D11/00C23F1/00B44C1/22
    • G02F1/025
    • A method and structure for reducing optical signal loss in a silicon waveguide formed within a silicon-on-insulator (SOI) structure uses CMOS processing techniques to round the edges/corners of the silicon material along the extent of the waveguiding region. One exemplary set of processes utilizes an additional, sacrificial silicon layer that is subsequently etched to form silicon sidewall fillets along the optical waveguide, the fillets thus “rounding” the edges of the waveguide. Alternatively, the sacrificial silicon layer can be oxidized to consume a portion of the underlying silicon waveguide layer, also rounding the edges. Instead of using a sacrificial silicon layer, an oxidation-resistant layer may be patterned over a blanket silicon layer, the pattern defined to protect the optical waveguiding region. A thermal oxidation process is then used to convert the exposed portion of the silicon layer into silicon dioxide, forming a bird's beak structure at the edges of the silicon layer, thus defining the “rounded” edges of the silicon waveguiding structure.
    • 用于减少在绝缘体上硅(SOI)结构中形成的硅波导中的光信号损耗的方法和结构使用CMOS处理技术来沿着波导区域的范围舍入硅材料的边缘/角。 一个示例性的工艺集合利用附加的牺牲硅层,其随后被蚀刻以沿着光波导形成硅侧壁圆角,因此圆角“波浪”了波导的边缘。 或者,牺牲硅层可以被氧化以消耗下面的硅波导层的一部分,也是边缘的四周。 代替使用牺牲硅层,可以在覆盖硅层上图案化抗氧化层,所述图案被限定为保护光波导区域。 然后使用热氧化工艺将硅层的暴露部分转化成二氧化硅,在硅层的边缘处形成鸟的喙结构,从而限定硅波导结构的“圆形”边缘。
    • 10. 发明申请
    • External cavity laser in thin SOI with monolithic electronics
    • 具有单片电子器件的薄SOI中的外腔激光器
    • US20070280326A1
    • 2007-12-06
    • US11637979
    • 2006-12-13
    • David PiedeMargaret GhironPrakash GothoskarRobert Montgomery
    • David PiedeMargaret GhironPrakash GothoskarRobert Montgomery
    • H01S3/10H01S3/08
    • H01S5/141H01S5/06804H01S5/0687
    • An ECL laser structure utilizes an SOI-based grating structure coupled to the external gain medium to provide lasing activity. In contrast to conventional Bragg grating structures, the grating utilized in the ECL of the present invention is laterally displaced (i.e., offset) from the waveguide (in most cases, a rib or strip waveguide) comprising the laser cavity. The grating is formed in an area with higher contrast ratio between materials (silicon and oxide) and thus requires a lesser amount of optical energy to reflect the selected wavelength, and can easily be formed using well-known CMOS fabrication processes. The pitch of the grating (i.e., the spacing between adjacent grating elements) and the refractive index values of the grating materials determine the reflected wavelength (also referred to as the “center wavelength”). A thermally conductive strip is disposed alongside the grating to adjust/tune the center wavelength of the grating, where the application of an electric current to the thermally conductive strip will heat the strip and transfer this heat to the grating. The change of temperature of the grating will modify the refractive indexes of the grating materials and as a result change its center wavelength.
    • ECL激光器结构利用耦合到外部增益介质的基于SOI的光栅结构来提供激光活动。 与传统的布拉格光栅结构相比,在本发明的ECL中使用的光栅从包括激光腔的波导(大多数情况下是肋或条形波导)横向移位(即偏移)。 光栅形成在材料(硅和氧化物)之间具有较高对比度的区域中,因此需要较少量的光能来反射所选择的波长,并且可以使用公知的CMOS制造工艺容易地形成。 光栅的间距(即相邻光栅元件之间的间距)和光栅材料的折射率值决定了反射波长(也称为“中心波长”)。 导热条沿光栅旁边设置以调整/调整光栅的中心波长,其中向导热带施加电流将加热带并将该热传递到光栅。 光栅的温度变化会改变光栅材料的折射率,从而改变其中心波长。