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1. 发明申请

US20110179326A1 The Performance Of Signature-Based Diagnosis For Logic BIST 有权
标题翻译：基于签名的逻辑BIST诊断性能
公开(公告)号：US20110179326A1
公开(公告)日：2011-07-21
申请号：US12918988
申请日：2009-02-23
申请人： Manish Sharma , Wu-Tung Cheng , Thomas Rinderknecht
发明人： Manish Sharma , Wu-Tung Cheng , Thomas Rinderknecht
IPC分类号： G01R31/3183 , G06F11/25
CPC分类号： G06F11/277 , G01R31/318547
摘要： Techniques are disclosed for reducing the set of initial candidates in signature based diagnosis methodology. These techniques are based on a unique way of making optimum use of information from logic back-cone tracing along with equations that describe the test response compactor.
摘要翻译：公开了用于减少基于签名的诊断方法中的初始候选者的集合的技术。这些技术基于一种独特的方式，从逻辑后锥跟踪中最佳地利用信息以及描述测试响应压实器的方程式。

2. 发明申请

US20070100586A1 Direct fault diagnostics using per-pattern compactor signatures 有权
标题翻译：直接故障诊断使用每模式压实机签名
公开(公告)号：US20070100586A1
公开(公告)日：2007-05-03
申请号：US11584038
申请日：2006-10-20
申请人： Wu-Tung Cheng , Manish Sharma , Thomas Rinderknecht
发明人： Wu-Tung Cheng , Manish Sharma , Thomas Rinderknecht
IPC分类号： G06F11/30
CPC分类号： G01R31/318547 , G01R31/318357
摘要： In embodiments of the disclosed technology, diagnosis of a circuit is performed using compactor signatures (a technique referred to herein as “signature-based diagnosis”). Signature-based diagnosis typically does not require a test step that bypasses the compactor. Compactor signatures can be read from a compactor on a per-pattern basis, and an expected signature can be loaded into a compactor while an actual signature is being read from the compactor. Error functions can be used to describe relationships between errors in scan cell values and per-pattern compactor signatures, and the functions can be used to help generate a list of fault candidates in a circuit design.
摘要翻译：在所公开的技术的实施例中，使用压缩机签名（本文称为“基于签名的诊断”的技术）来执行电路的诊断。基于签名的诊断通常不需要绕过压实机的测试步骤。压缩机签名可以在每个模式的基础上从压实机读取，并且预期的签名可以加载到压实机中，同时从压实机读取实际的签名。错误函数可用于描述扫描单元格值和每图案压缩器签名中的错误之间的关系，并且该函数可用于帮助生成电路设计中的故障候选列表。

3. 发明授权

US07836366B2 Defect localization based on defective cell diagnosis 有权
标题翻译：基于缺陷细胞诊断的缺陷定位
公开(公告)号：US07836366B2
公开(公告)日：2010-11-16
申请号：US11876430
申请日：2007-10-22
申请人： Manish Sharma , Wu-Tung Cheng
发明人： Manish Sharma , Wu-Tung Cheng
IPC分类号： G01R31/28 , G01R31/14 , G01R31/02 , G01R31/26 , G06F11/00
CPC分类号： G01R31/318569 , G01R31/2846
摘要： Among the various embodiments described is a method of detecting defects in a cell of an integrated circuit that analyzes exercising conditions applied to an input of the cell during a capture phase of testing with failed test patterns that produce an indication of a fault and that analyzes the exercising conditions that are applied during a capture phase of testing with observable passing patterns that do not provide an indication of a fault. From the analysis, true failing excitation conditions and passing excitation conditions can be determined and used to identify whether a defect is in the cell or on an interconnect wire of the integrated circuit.
摘要翻译：所描述的各种实施例中的一种检测集成电路的单元中的缺陷的方法，其分析在测试的捕获阶段期间施加到单元的输入的运行条件，其中产生故障指示的失败的测试图案，并且分析运行在测试捕获阶段期间应用的条件，其中可观察到的通过模式不提供故障指示。从分析可以确定真实故障激励条件和通过激励条件，并用于识别缺陷是在集成电路的单元还是互连线上。

4. 发明申请

US20090287438A1 Increased Fault Diagnosis Throughput Using Dictionaries For Hyperactive Faults 审中-公开
标题翻译：增加故障诊断吞吐量使用字典为超活动故障
公开(公告)号：US20090287438A1
公开(公告)日：2009-11-19
申请号：US12335453
申请日：2008-12-15
申请人： Wu-Tung Cheng , Huaxing Tang , Wei Zou , Manish Sharma
发明人： Wu-Tung Cheng , Huaxing Tang , Wei Zou , Manish Sharma
IPC分类号： G06F19/00
CPC分类号： G06F11/2252
摘要： Techniques to achieve greater diagnostic speeds using relatively small fault dictionaries, such as dictionaries that are only slightly larger than so-called NFB dictionaries. This speed-up may be achieved by identifying a set of faults called hyperactive faults, and creating a dictionary for identifying those faults.
摘要翻译：使用相对较小的故障字典来实现更高诊断速度的技术，例如仅比所谓的NFB字典略大的字典。这种加速可以通过识别一组称为多动故障的故障来实现，并创建用于识别这些故障的字典。

5. 发明授权

US07395473B2 Removing the effects of unknown test values from compacted test responses 有权
标题翻译：从压实的测试响应中消除未知测试值的影响
公开(公告)号：US07395473B2
公开(公告)日：2008-07-01
申请号：US11258769
申请日：2005-10-25
申请人： Wu-Tung Cheng , Manish Sharma
发明人： Wu-Tung Cheng , Manish Sharma
IPC分类号： G01R31/28
CPC分类号： G01R31/31703 , G01R31/318547
摘要： Methods, apparatus, and systems for filtering compacted test responses are disclosed. The methods, apparatus, and systems can be used, for example, to remove the effects of unknown test values. For instance, in one embodiment, a compacted test response from a compactor of a circuit-under-test is received. In this embodiment, the compacted test response includes one or more compacted test response values that are dependent on one or more respective unknown values. The compacted test response is filtered to remove the dependency of at least some of the compacted test response values on the one or more respective unknown values, and a filtered test response is output. Various filtering circuits and testing systems are also disclosed.
摘要翻译：公开了用于过滤压实测试响应的方法，装置和系统。可以使用方法，装置和系统来例如去除未知测试值的影响。例如，在一个实施例中，接收来自被测电路的压实机的压实测试响应。在该实施例中，压实的测试响应包括依赖于一个或多个相应未知值的一个或多个压缩测试响应值。过滤压实的测试响应以去除至少一些压实的测试响应值对一个或多个相应的未知值的依赖性，并且输出经滤波的测试响应。还公开了各种滤波电路和测试系统。

6. 发明申请

US20060156144A1 Removing the effects of unknown test values from compacted test responses 有权
标题翻译：从压实的测试响应中消除未知测试值的影响
公开(公告)号：US20060156144A1
公开(公告)日：2006-07-13
申请号：US11258769
申请日：2005-10-25
申请人： Wu-Tung Cheng , Manish Sharma
发明人： Wu-Tung Cheng , Manish Sharma
IPC分类号： G01R31/28 , G06F11/00
CPC分类号： G01R31/31703 , G01R31/318547
摘要： Methods, apparatus, and systems for filtering compacted test responses are disclosed. The methods, apparatus, and systems can be used, for example, to remove the effects of unknown test values. For instance, in one embodiment, a compacted test response from a compactor of a circuit-under-test is received. In this embodiment, the compacted test response includes one or more compacted test response values that are dependent on one or more respective unknown values. The compacted test response is filtered to remove the dependency of at least some of the compacted test response values on the one or more respective unknown values, and a filtered test response is output. Various filtering circuits and testing systems are also disclosed.
摘要翻译：公开了用于过滤压实测试响应的方法，装置和系统。可以使用方法，装置和系统来例如去除未知测试值的影响。例如，在一个实施例中，接收来自被测电路的压实机的压实测试响应。在该实施例中，压实的测试响应包括依赖于一个或多个相应未知值的一个或多个压缩测试响应值。过滤压实的测试响应以去除至少一些压实的测试响应值对一个或多个相应的未知值的依赖性，并且输出经滤波的测试响应。还公开了各种滤波电路和测试系统。

7. 发明授权

US08607107B2 Test access mechanism for diagnosis based on partitioining scan chains 有权
标题翻译：基于分割扫描链的诊断检测机制
公开(公告)号：US08607107B2
公开(公告)日：2013-12-10
申请号：US13091092
申请日：2011-04-20
申请人： Wu-Tung Cheng , Manish Sharma , Avijit Dutta , Robert Brady Benware , Mark A Kassab
发明人： Wu-Tung Cheng , Manish Sharma , Avijit Dutta , Robert Brady Benware , Mark A Kassab
IPC分类号： G01R31/28
CPC分类号： G01R31/3177 , G01R31/318563 , G06F11/2242
摘要： Disclosed are representative embodiments of methods, apparatus, and systems for partitioning-based Test Access Mechanisms (TAM). Test response data are captured by scan cells of a plurality scan chains in a circuit under test and are compared with test response data expected for a good CUT to generate check values. Based on the check values, partition pass/fail signals are generated by partitioning scheme generators. Each of the partitioning scheme generators is configured to generate one of the partition pass/fail signals for one of partitioning schemes. A partitioning scheme divides the scan cells into a set of non-overlapping partitions. Based on the partition pass/fail signals, a failure diagnosis process may be performed.
摘要翻译：公开了用于基于分区的测试访问机制（TAM）的方法，装置和系统的代表性实施例。测试响应数据由被测电路中的多个扫描链的扫描单元捕获，并与预期的良好CUT的测试响应数据进行比较以产生检查值。基于检查值，分区通过/失败信号由分区方案生成器生成。每个分区方案生成器被配置为为分区方案之一生成分区通过/失败信号之一。分区方案将扫描单元划分为一组非重叠分区。基于分区通过/失败信号，可以执行故障诊断处理。

8. 发明授权

US08448032B2 Performance of signature-based diagnosis for logic BIST 有权
标题翻译：逻辑BIST的基于签名的诊断性能
公开(公告)号：US08448032B2
公开(公告)日：2013-05-21
申请号：US12918988
申请日：2009-02-23
申请人： Manish Sharma , Wu-Tung Cheng , Thomas H. Rinderknecht
发明人： Manish Sharma , Wu-Tung Cheng , Thomas H. Rinderknecht
IPC分类号： G01R13/28
CPC分类号： G06F11/277 , G01R31/318547
摘要： Techniques are disclosed for reducing the set of initial candidates in signature based diagnosis methodology. These techniques are based on a unique way of making optimum use of information from logic back-cone tracing along with equations that describe the test response compactor.
摘要翻译：公开了用于减少基于签名的诊断方法中的初始候选者的集合的技术。这些技术基于一种独特的方式，从逻辑后锥跟踪中最佳地利用信息以及描述测试响应压实器的方程式。

9. 发明申请

US20080294953A1 Removing the effects of unknown test values from compacted test responses 有权
公开(公告)号：US20080294953A1
公开(公告)日：2008-11-27
申请号：US12215593
申请日：2008-06-27
申请人： Wu-Tung Cheng , Manish Sharma
发明人： Wu-Tung Cheng , Manish Sharma
IPC分类号： G01R31/3177 , G06F11/25 , G06F17/50 , G06F15/00
CPC分类号： G01R31/31703 , G01R31/318547
摘要： Methods, apparatus, and systems for filtering compacted test responses are disclosed. The methods, apparatus, and systems can be used, for example, to remove the effects of unknown test values. For instance, in one embodiment, a compacted test response from a compactor of a circuit-under-test is received. In this embodiment, the compacted test response includes one or more compacted test response values that are dependent on one or more respective unknown values. The compacted test response is filtered to remove the dependency of at least some of the compacted test response values on the one or more respective unknown values, and a filtered test response is output. Various filtering circuits and testing systems are also disclosed.

10. 发明授权

US09222978B2 Two-dimensional scan architecture 有权
标题翻译：二维扫描架构
公开(公告)号：US09222978B2
公开(公告)日：2015-12-29
申请号：US13416912
申请日：2012-03-09
申请人： Yu Huang , Wu-Tung Cheng , Ruifeng Guo , Manish Sharma , Liyang Lai
发明人： Yu Huang , Wu-Tung Cheng , Ruifeng Guo , Manish Sharma , Liyang Lai
IPC分类号： G01R31/28 , G01R31/3185
CPC分类号： G01R31/318536 , G01R31/318544
摘要： Aspects of the invention relate to techniques of using two-dimensional scan architecture for testing and diagnosis. A two-dimensional scan cell network may be constructed by coupling input for each scan cell to outputs for two or more other scan cells and/or primary inputs through a multiplexer. To test and diagnose the two-dimensional scan cell network, the two-dimensional scan cell network may be loaded with chain patterns and unloaded with corresponding chain test data along two or more sets of scan paths. Based on the chain test data, one or more defective scan cells or defective scan cell candidates may be determined.
摘要翻译：本发明的方面涉及使用二维扫描结构进行测试和诊断的技术。可以通过将每个扫描单元的输入耦合到通过多路复用器的两个或更多个其它扫描单元和/或主要输入的输出来构造二维扫描单元网络。为了测试和诊断二维扫描单元网络，二维扫描单元网络可以加载链模式并且沿着两组或更多组扫描路径卸载相应的链测试数据。基于链测试数据，可以确定一个或多个有缺陷的扫描单元或有缺陷的扫描单元候选。

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