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    • 9. 发明授权
    • Semiconductor memory, memory device, and memory card
    • 半导体存储器,存储器件和存储卡
    • US06477671B2
    • 2002-11-05
    • US09845350
    • 2001-05-01
    • Masashi WadaTakao OkuboTakeshi Furuno
    • Masashi WadaTakao OkuboTakeshi Furuno
    • G11C2900
    • G11C29/70G11C29/88
    • A semiconductor memory (1) comprising a plurality of memory blocks (2 and 3) provided with a lot of memory cells, a data input/output buffer (7), and first control means (11) for controlling the rewriting and reading of data for the memory cells is provided with first storage means (30) for designating part of the defective memory blocks and detection means (32) for detecting the access to a defective memory block designated by the first storage means in accordance with an address signal. In this case, when the detection means detects the access to a defective memory, the first control means inhibits the data rewrite operation for the instruction of the data rewrite operation and inhibits the data output operation of the data input/output buffer for the instruction of the data read operation. The inhibiting function makes it possible to provide a memory device having the compatibility with a non-defective semiconductor memory only by combining semiconductor memories having irremediable defects without fixing the levels of specific address input terminals so as to keep the defective memory blocks non-selective.
    • 一种半导体存储器(1),包括设置有大量存储单元的多个存储块(2和3),数据输入/输出缓冲器(7)和用于控制数据的重写和读取的第一控制装置(11) 为存储单元设置有用于指定部分缺陷存储块的第一存储装置(30)和用于根据地址信号检测由第一存储装置指定的缺陷存储块的存取的检测装置(32)。 在这种情况下,当检测装置检测到对缺陷存储器的访问时,第一控制装置禁止用于数据重写操作的指令的数据重写操作,并且禁止数据输入/输出缓冲器的数据输出操作用于指令 数据读取操作。 禁止功能使得可以仅通过组合具有不可弥补缺陷的半导体存储器来提供具有与无缺陷半导体存储器的兼容性的存储器件,而不固定特定地址输入端子的电平,以便保持有缺陷的存储块非选择性。