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1. 发明授权

US11536563B2 Method for calibrating parameters of surface texture measuring apparatus 有权
公开(公告)号：US11536563B2
公开(公告)日：2022-12-27
申请号：US16935613
申请日：2020-07-22
申请人： MITUTOYO CORPORATION
发明人： Yoshiyuki Omori
IPC分类号： G01B21/04 , G01B5/20
摘要： A method for calibrating parameters includes a measurement step that obtains measurement data by scanning a defined surface; a correction step that obtains corrected data by correcting the measurement data based on the parameters; a determination step that calculates a roundness of the corrected data and determines whether the calculated roundness is equal to or less than a predetermined value; and an adjustment step that increases or reduces at least one of the parameters when the roundness is determined to be greater than the predetermined value, and the correction step, the determination step, and the adjustment step are repeated until the roundness is determined to be equal to or less than the predetermined value.

2. 发明授权

US10753721B2 Threaded shaft measuring device, threaded shaft measuring method, and adjustment jig 有权
公开(公告)号：US10753721B2
公开(公告)日：2020-08-25
申请号：US16052109
申请日：2018-08-01
申请人： MITUTOYO CORPORATION
发明人： Yoshiyuki Omori
IPC分类号： G01B5/16 , G01B5/20 , G01B5/008
摘要： A threaded shaft measuring device includes a table that supports a threaded shaft to be measured, and that is capable of adjusting a rotation position about a perpendicular Z axis, adjusting a rotation position about an X axis that is horizontal and intersects with the Z axis, and adjusting a position in a Y axis direction that is horizontal and intersects with the X axis; and a stylus that performs scanning measurement of a surface of the threaded shaft. An adjustment jig capable of making contact with the threaded shaft and an elevator that brings the adjustment jig into contact with the threaded shaft are installed on the table. The adjustment jig includes an abutting bottom surface; an abutting side surface; a measurement surface; and an axis line marker that enables a tilt relative to the X axis to be detected.

3. 发明申请

US20140107973A1 THREAD PROFILE MEASURING METHOD 有权
标题翻译：螺纹轮廓测量方法
公开(公告)号：US20140107973A1
公开(公告)日：2014-04-17
申请号：US14049335
申请日：2013-10-09
申请人： MITUTOYO CORPORATION
发明人： Yoshiyuki Omori
IPC分类号： G01B21/20
CPC分类号： G01B21/20 , G01B5/204
摘要： A method includes: performing a scanning measurement of a female thread along first and second axes extending along a center axis of the thread and opposed to each other across the center axis; determining characteristic values of the thread from contour data of the thread obtained through the measurement; obtaining the contour data including first contour data associated with the first axis and second contour data associated with the second axis by performing the measurement; detecting a thread displacement along the center axis between a crest associated with the first axis and a crest associated with the second axis at each of first position and second position on the center axis; calculating inclination and deviation of the first and second axes from the thread displacements detected at the first and second positions; and adjusting an attitude of the thread for the measurement to eliminate the inclination and deviation.
摘要翻译：一种方法包括：沿着沿着螺纹的中心轴延伸并沿着中心轴线彼此相对的第一和第二轴线执行阴螺纹的扫描测量; 从通过测量获得的线程的轮廓数据确定线程的特征值; 通过执行测量来获得包括与第一轴相关联的第一轮廓数据和与第二轴关联的第二轮廓数据的轮廓数据; 检测在与所述第一轴线相关联的波峰和在所述第一轴线与所述第二轴线相关联的波峰与所述中心轴线之间的中心轴线处的螺纹位移; 计算第一和第二轴线与在第一和第二位置处检测到的螺纹位移的倾斜度和偏差; 并调整用于测量的螺纹的姿态以消除倾斜和偏差。

4. 发明授权

US11041707B2 Roundness measuring device 有权
公开(公告)号：US11041707B2
公开(公告)日：2021-06-22
申请号：US16179227
申请日：2018-11-02
申请人： MITUTOYO CORPORATION
发明人： Yoshiyuki Omori
IPC分类号： G01B7/28 , G01B3/34 , G01B3/18
摘要： A roundness measuring device includes an annular ring, and a plurality of displacement sensors (comparative length measuring devices) provided on the ring at predetermined intervals. The displacement sensors are arranged such that lines along which measurement axes of the displacement sensors extend intersect at a single point.

5. 发明授权

US10514244B2 Roundness measuring machine 有权
公开(公告)号：US10514244B2
公开(公告)日：2019-12-24
申请号：US15689370
申请日：2017-08-29
申请人： MITUTOYO CORPORATION
发明人： Tatsuki Nakayama , Yoshiyuki Omori
IPC分类号： G01B5/20 , G01B7/28 , G01B21/20
摘要： A roundness measuring machine includes: a base; a table rotatable relative to the base; a probe configured to scan a surface of a workpiece mounted on the table; a motor configured to rotate the table; and a control device configured to control a rotation of the motor. The control device includes: a starting current detector configured to detect a starting current of the motor; and an acceleration/deceleration time setting unit configured to detect at least one of acceleration time and deceleration time for the motor in accordance with the starting current. The roundness measuring machine can suitably set the acceleration time and the deceleration time for the motor corresponding to the inertia moment of the workpiece mounted on the table.

6. 发明申请

US20140109419A1 PROFILE MEASURING INSTRUMENT, ADJUSTING METHOD FOR PROFILE MEASURING INSTRUMENT, AND PROFILE MEASURING METHOD 有权
标题翻译：配置文件测量仪器，配置文件测量仪器的调整方法和配置文件的测量方法
公开(公告)号：US20140109419A1
公开(公告)日：2014-04-24
申请号：US14055324
申请日：2013-10-16
申请人： MITUTOYO CORPORATION
发明人： Hideki Shindo , Yoshiyuki Omori
IPC分类号： G01B5/20
CPC分类号： G01B5/20 , G01B5/008 , G01B5/201
摘要： A profile measuring instrument usable to perform a rotary scanning measurement and a linear scanning measurement on a workpiece in the form of a revolution solid, includes: a turntable on which the workpiece is mounted, the turntable being rotatable around a predetermined rotation axis; a rotary scanning measurement unit being adapted to measure a displacement of a surface of the workpiece mounted on the turntable; a linear scanning measurement unit being adapted to measure a profile of the surface of the workpiece mounted on the turntable along a predetermined measurement axis; and an aligning mechanism being adapted to relatively move the linear scanning measurement unit and the turntable in a direction intersecting with the measurement axis. The linear scanning measurement unit and the turntable are adjusted to relative positions at which the measurement axis passes through the rotation axis.
摘要翻译：一种轮廓测量仪器，可用于对旋转实体形式的工件执行旋转扫描测量和线性扫描测量，包括：转台，工件安装在该转盘上，转盘可围绕预定旋转轴线旋转; 旋转扫描测量单元，其适于测量安装在所述转台上的所述工件的表面的位移; 线性扫描测量单元，其适于沿着预定的测量轴线测量安装在所述转台上的所述工件的表面的轮廓; 以及对准机构，其适于使所述线性扫描测量单元和所述转台沿与所述测量轴线相交的方向相对移动。线性扫描测量单元和转盘被调节到测量轴穿过旋转轴线的相对位置。

7. 发明授权

US10921107B2 Lens-measuring machine and lens-measurement method 有权
公开(公告)号：US10921107B2
公开(公告)日：2021-02-16
申请号：US16243539
申请日：2019-01-09
申请人： MITUTOYO CORPORATION
发明人： Yoshiyuki Omori
IPC分类号： G01B5/008 , G01B5/20 , G01M11/08
摘要： A lens-measuring machine includes: a table rotatable around a rotation axis; a lens holder that holds a workpiece in a form of a lens, the lens holder being placed on the table so that an optical axis of the lens becomes orthogonal to the rotation axis; a contact tip that contacts a measurement surface of the lens; an angle sensor for detecting a rotary angle of the table; a displacement detector for detecting a displacement of the contact tip; and a controller for calculating coordinates information of the measurement surface of the lens in a form of polar coordinates, whose origin is at the rotation axis, based on displacement of the contact tip for every predetermined rotary angle of the table, the controller converting the calculated polar coordinates into Cartesian coordinates.

8. 发明授权

US09395181B2 Thread profile measuring method 有权
标题翻译：螺纹轮廓测量方法
公开(公告)号：US09395181B2
公开(公告)日：2016-07-19
申请号：US14049335
申请日：2013-10-09
申请人： MITUTOYO CORPORATION
发明人： Yoshiyuki Omori
IPC分类号： G01B21/20 , G01B5/20
CPC分类号： G01B21/20 , G01B5/204
摘要： A method includes: performing a scanning measurement of a female thread along first and second axes extending along a center axis of the thread and opposed to each other across the center axis; determining characteristic values of the thread from contour data of the thread obtained through the measurement; obtaining the contour data including first contour data associated with the first axis and second contour data associated with the second axis by performing the measurement; detecting a thread displacement along the center axis between a crest associated with the first axis and a crest associated with the second axis at each of first position and second position on the center axis; calculating inclination and deviation of the first and second axes from the thread displacements detected at the first and second positions; and adjusting an attitude of the thread for the measurement to eliminate the inclination and deviation.
摘要翻译：一种方法包括：沿着沿着所述线的中心轴延伸并沿着所述中心轴线彼此相对的第一和第二轴线执行阴螺纹的扫描测量; 从通过测量获得的线程的轮廓数据确定线程的特征值; 通过执行测量来获得包括与第一轴相关联的第一轮廓数据和与第二轴关联的第二轮廓数据的轮廓数据; 检测在与所述第一轴线相关联的波峰和在所述第一轴线与所述第二轴线相关联的波峰与所述中心轴线之间的中心轴线处的螺纹位移; 计算第一和第二轴线与在第一和第二位置处检测到的螺纹位移的倾斜度和偏差; 并调整用于测量的螺纹的姿态以消除倾斜和偏差。

9. 发明授权

US09316476B2 Profile measuring instrument, adjusting method for profile measuring instrument, and profile measuring method 有权
标题翻译：型材测量仪器，型材测量仪器的调整方法和型材测量方法
公开(公告)号：US09316476B2
公开(公告)日：2016-04-19
申请号：US14055324
申请日：2013-10-16
申请人： MITUTOYO CORPORATION
发明人： Hideki Shindo , Yoshiyuki Omori
IPC分类号： G01B5/20 , G01B5/008
CPC分类号： G01B5/20 , G01B5/008 , G01B5/201
摘要： A profile measuring instrument usable to perform a rotary scanning measurement and a linear scanning measurement on a workpiece in the form of a revolution solid, includes: a turntable on which the workpiece is mounted, the turntable being rotatable around a predetermined rotation axis; a rotary scanning measurement unit being adapted to measure a displacement of a surface of the workpiece mounted on the turntable; a linear scanning measurement unit being adapted to measure a profile of the surface of the workpiece mounted on the turntable along a predetermined measurement axis; and an aligning mechanism being adapted to relatively move the linear scanning measurement unit and the turntable in a direction intersecting with the measurement axis. The linear scanning measurement unit and the turntable are adjusted to relative positions at which the measurement axis passes through the rotation axis.
摘要翻译：一种轮廓测量仪器，可用于对旋转实体形式的工件执行旋转扫描测量和线性扫描测量，包括：转台，工件安装在该转盘上，转台可围绕预定旋转轴线旋转; 旋转扫描测量单元，其适于测量安装在所述转台上的所述工件的表面的位移; 线性扫描测量单元，其适于沿着预定的测量轴线测量安装在所述转台上的所述工件的表面的轮廓; 以及对准机构，其适于使所述线性扫描测量单元和所述转台沿与所述测量轴线相交的方向相对移动。线性扫描测量单元和转盘被调节到测量轴穿过旋转轴线的相对位置。

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