专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20210140751A1 DIGITAL MICROMETER 有权
公开(公告)号：US20210140751A1
公开(公告)日：2021-05-13
申请号：US17251097
申请日：2019-06-07
申请人： MITUTOYO CORPORATION
发明人： Koji Matsumoto , Yuji Fujikawa , Shinichiro Yanaka , Osamu Saito
IPC分类号： G01B3/18 , G01B7/14
摘要： There is provided a digital micrometer suitable for measuring an object to be measured that is a strong magnet.
A digital micrometer includes a main-body frame, a spindle, a thimble part, and a displacement detector that detects displacement of the spindle. The main-body frame includes an U-shaped frame part, and a spindle holding part provided on the other end side of the U-shaped frame part and having a length in a direction away from an anvil. The spindle is held by a spindle holding part, provided to be movable forward and backward in an axial direction with respect to the anvil, and includes a contactor on one end face. The main-body frame and the spindle are formed of a non-magnetic material.

2. 发明授权

US11821724B2 Digital micrometer 有权
公开(公告)号：US11821724B2
公开(公告)日：2023-11-21
申请号：US17251097
申请日：2019-06-07
申请人： MITUTOYO CORPORATION
发明人： Koji Matsumoto , Yuji Fujikawa , Shinichiro Yanaka , Osamu Saito
IPC分类号： G01B3/18 , G01B7/14
CPC分类号： G01B3/18 , G01B7/14
摘要： A digital micrometer includes a main-body frame, a spindle, a thimble part, and a displacement detector that detects displacement of the spindle. The main-body frame includes a U-shaped frame part, and a spindle holding part provided on the other end side of the U-shaped frame part and having a length in a direction away from an anvil. The spindle is held by a spindle holding part, provided to be movable forward and backward in an axial direction with respect to the anvil, and includes a contactor on one end face. The main-body frame and the spindle are formed of a non-magnetic material.

3. 发明授权

US09316487B2 Laser tracking interferometer 有权
标题翻译：激光跟踪干涉仪
公开(公告)号：US09316487B2
公开(公告)日：2016-04-19
申请号：US14280743
申请日：2014-05-19
申请人： MITUTOYO CORPORATION
发明人： Masayuki Nara , Shinichiro Yanaka
IPC分类号： G01B11/02 , G01B11/14 , G01B11/00
CPC分类号： G01B11/14 , G01B11/002
摘要： A laser tracking interferometer has a carriage provided with a first displacement gauge outputting a displacement signal associated with a relative displacement from a reference sphere; a second retroreflector provided to the carriage; a laser interferometer provided to the carriage and outputting a displacement signal associated with a relative displacement between the first retroreflector and the second retroreflector; and a data processor calculating a displacement of the first retroreflector with reference to the reference sphere based on the displacement signal output from the first displacement gauge and the displacement signal output from the laser interferometer.
摘要翻译：激光跟踪干涉仪具有一个滑架，该滑架设置有第一位移量规，输出与参考球相对的位移相关联的位移信号; 提供给车厢的第二个后向反射器; 激光干涉仪，其被提供到所述滑架并输出与所述第一后向反射器和所述第二后向反射器之间的相对位移相关联的位移信号; 以及数据处理器，基于从第一位移计输出的位移信号和从激光干涉仪输出的位移信号，相对于参考球体计算第一后向反射器的位移。

4. 发明授权

US11366447B2 Spatial accuracy correction method and apparatus 有权
公开(公告)号：US11366447B2
公开(公告)日：2022-06-21
申请号：US16218902
申请日：2018-12-13
申请人： MITUTOYO CORPORATION
发明人： Shinichiro Yanaka , Masayuki Nara
IPC分类号： G05B19/401 , G01B9/02055 , G01B21/04
摘要： A spatial accuracy correction apparatus performs a spatial accuracy correction of a positioner displacing a displacer to a predetermined set of spatial coordinates using a measurable length value measured by an interferometer and a measurable value of the set of spatial coordinates of the displacement body that is measured by the positioner. The measured length value and the measured value for each measurement point are acquired by displacing the displacement body to a plurality of measurement points in order, one or more repeated measurements are conducted for at least one of the plurality of measurement points being measured after conducting measurement of the measured length value and the measured value for each of the plurality of measurement points, and the plurality of points are measured again when a repeat error of the measured length value is equal to or greater than a threshold value.

5. 发明授权

US11366448B2 Spatial accuracy correction method and apparatus 有权
公开(公告)号：US11366448B2
公开(公告)日：2022-06-21
申请号：US16219033
申请日：2018-12-13
申请人： MITUTOYO CORPORATION
发明人： Shinichiro Yanaka , Masayuki Nara
IPC分类号： G05B19/401 , G01B9/02055 , G06F17/12
摘要： A method that corrects an error in positioning in a positioning mechanism by using a measurable length value measured by a laser interferometer and a measured value for spatial coordinates measured by the positioning mechanism. The method includes a measurement step in which a retroreflector affixed to a displacer is displaced to a plurality of measurement points, and the measured length value and the measured value at each of the measurement points is acquired; and a parameter calculation step in which a correction parameter is calculated based on the measured value, the measured length value, and the coordinates of a rotation center of the tracking-type laser interferometer. A first correction constant is applied to the measured length value for each measurement line, and a second correction constant different from the first correction constant is applied to the coordinates of the rotation center of the interferometer for each measurement line.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式