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    • 8. 发明授权
    • Defect management engine for semiconductor memories and memory systems
    • 半导体存储器和存储器系统的缺陷管理引擎
    • US6141267A
    • 2000-10-31
    • US243645
    • 1999-02-03
    • Toshiaki KirihataLouis Lu-Chen HsuChandrasekhar Narayan
    • Toshiaki KirihataLouis Lu-Chen HsuChandrasekhar Narayan
    • G11C5/02G11C8/06G11C11/00G11C29/00G11C7/00
    • G11C29/808G11C11/005G11C29/846G11C5/02G11C8/06
    • A defect management engine (DME) for memories integrates a plurality of redundancy data cells and a plurality of redundancy address cells in the same array. The redundancy data cells are used for replacing defective cells in the memories. The redundancy address cells store the addresses of the defective cells. The memories are preferably sub-divided into a plurality of domains. A plurality of defective cells in each domain are supported by a plurality of repair units, each consisting of one or more redundancy data bits and redundancy address bits in the DME. When one or more data bits are read from a domain in the memory, the corresponding wordline in the DME simultaneously activates a plurality of repair units coupling to the wordline (self-contained domain selection). The redundancy data bits and the redundancy address bits are also read from the redundancy data cells and redundancy address cells, respectively. The DME logic detects whether or not the redundancy address bits match or do not match the address inputs of each repair unit (self contained redundancy match detection). This couples either redundancy data bits from the DME (i.e., a matching condition) or the data bits from the domain in the memories (i.e., a no match condition) to the corresponding DQ (self-contained redundancy replacement). The DME enables an integrated redundancy means (self-contained domain selection, self-contained redundancy match detection, and self-contained redundancy replacement). Single bit replacement, multi-bit replacement, line replacement, and variable bit size replacement are discussed. Finally, an extension of the DME concept to a memory system is also discussed.
    • 用于存储器的缺陷管理引擎(DME)将多个冗余数据单元和多个冗余地址单元集成在相同的阵列中。 冗余数据单元用于替换存储器中的有缺陷的单元。 冗余地址单元存储有缺陷单元的地址。 存储器优选地被细分为多个域。 每个域中的多个缺陷单元由多个修复单元支持,每个修复单元由DME中的一个或多个冗余数据位和冗余地址位组成。 当从存储器中的域读取一个或多个数据位时,DME中的相应字线同时激活耦合到字线(自包含域选择)的多个修复单元。 冗余数据位和冗余地址位也分别从冗余数据单元和冗余地址单元读取。 DME逻辑检测冗余地址位是否匹配或不匹配每个修复单元的地址输入(自包含冗余匹配检测)。 这将来自DME的冗余数据位(即,匹配条件)或来自存储器中的域的数据位(即,不匹配条件)耦合到相应的DQ(独立冗余替换)。 DME可实现集成的冗余手段(自包含域选择,独立冗余匹配检测和自包含冗余替换)。 讨论了单位替换,多位替换,线替换和可变位大小替换。 最后还讨论了将DME概念扩展到内存系统。
    • 9. 发明授权
    • Controlled temperature bonding
    • 受控温度键合
    • US5641114A
    • 1997-06-24
    • US475255
    • 1995-06-07
    • Raymond Robert HortonChandrasekhar NarayanMichael Jon Palmer
    • Raymond Robert HortonChandrasekhar NarayanMichael Jon Palmer
    • B23K1/00B23K31/02B23K37/00
    • B23K1/0016B23K2201/40
    • In a bonding station the parts of the apparatus to be bonded are retained at a thermal bias temperature at a permitted level and a thermal check valve interface is provided between the bonding location and the part of the station that would serve as a conduction heat sink, thereby thermally insulating other uninvolved parts of the structure and and confining the bonding heat to the bonding region. Such confinement reduces the dwell time that the bond must remain at the bonding temperature. The bonding station has a number of features: the parts to be bonded are maintained on a support member that is provided with a heat biasing capability that can establish the assembly at a specified temperature; a retention capability, such as the use of vacuum, is provided to maintain registration and thermal contact of the part with the support; and a thermal check valve capability is provided to control the rate of heat flow through the support member so that locallized heat is controlled in dissipation.
    • 在接合站中,要被接合的设备的部件被保持在允许的水平的热偏压温度,并且在用作传导散热器的接合位置和站的部分之间提供热止回阀接口, 从而将结构的其它未掺杂部分进行绝热并且将结合热限制到接合区域。 这种限制减少了粘合在粘合温度下必须保持的停留时间。 粘合台具有许多特征:待粘合的部件被保持在具有可在规定温度下建立组件的热偏置能力的支撑部件上; 提供保持能力,例如使用真空,以保持部件与支撑件的配准和热接触; 并且提供热止回阀能力以控制通过支撑构件的热流的速率,从而控制局部放热的散热。
    • 10. 发明授权
    • Flat panel display containing black matrix polymer
    • 含黑色矩阵聚合物的平板显示器
    • US5619357A
    • 1997-04-08
    • US466317
    • 1995-06-06
    • Marie AngelopoulosAli Afzali-ArdakaniClaudius FegerChandrasekhar Narayan
    • Marie AngelopoulosAli Afzali-ArdakaniClaudius FegerChandrasekhar Narayan
    • G02F1/1335
    • G02F1/133512
    • A thin film transistor display that comprises a black matrix polymer layer, comprising a polymer having an optical density of at least about 0.8 per .mu.m and being self-absorbent of visible light and being selected from the group consisting of substituted and unsubstituted polyanilines, substituted and unsubstituted polyparaphenylenevinylenes, substituted and unsubstituted polythiophenes, substituted and unsubstituted polyazines, substituted and unsubstituted polyparaphenylenes, substituted and unsubstituted polyfuranes, substituted and unsubstituted polypyrroles, substituted and unsubstituted polyselenophene, substituted and unsubstituted poly-p-phenylene sulfides and substituted and unsubstituted polyacetylenes, and mixtures thereof, and copolymers thereof. The layer also comprises one or more pigments. The resistivity of the black matrix composite is 10E12 to 10E14 ohm cm.
    • 一种薄膜晶体管显示器,其包括黑矩阵聚合物层,其包含光密度为至少约0.8每μm的聚合物,并且是可吸收的可见光,并且选自取代和未取代的聚苯胺,取代的 取代和未取代的聚噻吩,取代和未取代的聚噻吩,取代和未取代的聚嗪,取代和未取代的聚对苯二烯,取代和未取代的聚呋喃,取代和未取代的聚吡咯,取代和未取代的聚硒吩,取代和未取代的聚对苯硫醚和取代和未取代的聚乙炔, 其混合物,及其共聚物。 该层还包含一种或多种颜料。 黑色矩阵复合材料的电阻率为10E12至10E14欧姆厘米。