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    • 7. 发明授权
    • Method and apparatus for application's specific testing of assembled
circuits
    • 用于组装电路应用特定测试的方法和装置
    • US6038520A
    • 2000-03-14
    • US166207
    • 1998-10-02
    • Roy SchoonoverAlbert ManSam HoLee Lau
    • Roy SchoonoverAlbert ManSam HoLee Lau
    • G01R31/319G06F11/00H01L21/66
    • G01R31/31903
    • A method and apparatus for testing specific assembled circuits begins by configuring a plurality of applications specific testing entities to test assembled circuits, where the configuring is based on the types of assembled circuits being tested. Next, a specific assembled circuit testing program is provided to the corresponding application specific testing entity based on the type of assembled circuits it is testing. In addition to providing the testing programs to the testing entities, programming instructions are provided to a programmable handler to pick and place the appropriate assembled circuits with the corresponding applications specific testing entities. When the testing of a particular assembled circuit is complete, a test complete indication is provided. When the test complete indication is received by the host, programming instructions are provided to the programmable handler to remove the integrated circuit from the testing entity and place another integrated circuit in the proximity of the testing entity for subsequent testing.
    • 用于测试特定组装电路的方法和装置开始于通过配置多个应用特定的测试实体来测试组装的电路,其中组态基于被测试的组合电路的类型。 接下来,基于其正在测试的组合电路的类型,将特定的组装电路测试程序提供给相应的应用特定测试实体。 除了向测试实体提供测试程序外,还向可编程处理程序提供编程指令,以便将相应的应用程序特定测试实体的合适的组合电路进行选择和放置。 当特定组装电路的测试完成时,提供测试完成指示。 当主机接收到测试完成指示时,向可编程处理程序提供编程指令,以从测试实体中移除集成电路,并将另一个集成电路放置在测试实体附近以供后续测试。