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1. 发明申请

US20120229633A1 Security System and Method for Network Equipment Rack Having Camera 审中-公开
标题翻译：具有相机的网络设备机架的安全系统和方法
公开(公告)号：US20120229633A1
公开(公告)日：2012-09-13
申请号：US13414750
申请日：2012-03-08
申请人： Thomas J Boucino , Larry Ross , Darshan Patell
发明人： Thomas J Boucino , Larry Ross , Darshan Patell
IPC分类号： H04N7/18 , H05K7/00
CPC分类号： H05K7/1495 , H04N7/183
摘要： A network equipment rack includes a first support and a second support spaced from the first support by a given distance, the first and second supports configured to support a plurality of modules in a space between the supports and each support including a plurality of openings. At least one network module is mounted in the rack between the first support and the second support and may include a plurality of ports configured to receive a connector. A camera panel is also mounted in the rack between the first support and the second support and includes a panel member having a first end connected to the first support and a second end connected to the second support and an aperture through the panel member between the first end and the second end and a camera mounted in the aperture.
摘要翻译：网络设备机架包括第一支撑件和与第一支撑件间隔给定距离的第二支撑件，第一和第二支撑件构造成在支撑件之间的空间中支撑多个模块，并且每个支撑件包括多个开口。至少一个网络模块安装在第一支撑件和第二支撑件之间的机架中，并且可以包括配置成接收连接器的多个端口。相机面板也安装在第一支撑件和第二支撑件之间的齿条中，并且包括面板构件，其具有连接到第一支撑件的第一端和连接到第二支撑件的第二端和穿过第一端部和第二端以及安装在孔中的照相机。

2. 发明申请

US20150355274A1 PRECISION PROBE POSITIONING FOR AT-SPEED INTEGRATED CIRCUIT TESTING USING THROUGH SILICON IN-CIRCUIT LOGIC ANALYSIS 审中-公开
标题翻译：通过硅电路逻辑分析进行高速集成电路测试的精度探头定位
公开(公告)号：US20150355274A1
公开(公告)日：2015-12-10
申请号：US14299696
申请日：2014-06-09
申请人： Larry Ross , Michael Bruce
发明人： Larry Ross , Michael Bruce
IPC分类号： G01R31/311 , G01R31/3177
CPC分类号： G01R31/311 , G01R31/3177
摘要： A method, system, and computer program product for precision probe positioning and testing of an integrated circuit. Methods, systems, and a computer program product implement techniques for determining a particular area of interest for precision probe positioning and testing where the particular area of interest comprises an area less than an entire area of the integrated circuit. Once the particular area of interest for testing has been determined, then a laser probe is steered or otherwise directed to illuminate a plurality of pixels within the area of interest so as to generate reflected signals corresponding to the illuminated pixels. Techniques are provided for measuring the reflected signals to determine information about the IC within the area of interest. CAD data or user data can be used to determine XY addressable pixel locations within the area of interest.
摘要翻译：一种用于精密探针定位和集成电路测试的方法，系统和计算机程序产品。方法，系统和计算机程序产品实现用于确定特定感兴趣区域的精确探针定位和测试的特定区域的技术，其中感兴趣的特定区域包括小于集成电路的整个区域的面积。一旦已经确定了用于测试的特定的感兴趣区域，则激光探针被引导或以其他方式被引导以照射感兴趣区域内的多个像素，以便产生对应于被照射像素的反射信号。提供了用于测量反射信号以确定关于感兴趣区域内的IC的信息的技术。 CAD数据或用户数据可用于确定感兴趣区域内的XY可寻址像素位置。

3. 发明授权

US07043949B2 Child proof key for barrel-housed gun lock 失效
标题翻译：桶装枪锁的儿童防护钥匙
公开(公告)号：US07043949B2
公开(公告)日：2006-05-16
申请号：US10199629
申请日：2002-07-17
申请人： Larry Ross , Cruz Luna
发明人： Larry Ross , Cruz Luna
IPC分类号： E05B19/02 , E05B19/04
CPC分类号： E05B19/00 , F41A17/44 , Y10T70/7853 , Y10T70/7876 , Y10T70/8622 , Y10T70/8757
摘要： A Child Proof Key for Barrel-housed Gun Lock is disclosed. Also disclosed object of the present invention to provide a Child Proof Key for Barrel-housed Gun Lock. The lock includes a handle defined by a slot formed along its length for acceptance of the shaft. The shaft is hinged at one end which permits the shaft to be stowed within the shaft slot. The shaft terminates in a key socket at its head for engagement with the keyed head of a bore-housed gun lock. The key further includes a bushing along the length of the shaft for centering the key socket within the barrel of the weapon, and further to identify the size by indicia inscribable thereon (or other desirable indicia). Very importantly, the shaft slot formed in the handle is defined by a shoulder and a shaft bore, with the gap between the two shoulders being slightly smaller than the diameter of the shaft such that the shaft snaps into the slot when stowed. Once snapped in, the shoulders resist the removal of the shaft from the slot sufficiently to prevent a small child from utilizing the key to remove a locking device from a weapon. Still further, the key socket may include a pair of arcuate slots formed therein for engaging pins extending from the keyed head of a bore-housed gun lock.
摘要翻译：公开了一种用于桶装枪锁的防儿钥匙。本发明的另外公开的目的在于提供一种用于桶装枪枪的防儿钥匙。该锁包括由沿其长度形成的狭槽限定的手柄，用于接收轴。轴在一端铰接，允许轴被收纳在轴槽内。轴终止于其头部的钥匙插座，用于与钻孔枪锁的带键头接合。钥匙还包括沿着轴的长度的衬套，用于将钥匙插座对准在武器的枪管内，并且进一步通过可刻印在其上的标记（或其它所需的标记）来识别尺寸。非常重要的是，形成在手柄中的轴槽由肩部和轴孔限定，两个肩部之间的间隙略小于轴的直径，使得当收起时，轴卡入槽中。一旦卡入，肩部就能抵抗轴从槽中的移除，以防止小孩利用钥匙从武器上移除锁定装置。另外，密钥插座可以包括形成在其中的一对弧形槽，用于接合从孔内装有的枪锁的带键头延伸的销。

4. 发明授权

US06212813B1 Quick-release gun lock 有权
标题翻译：快速释放枪锁
公开(公告)号：US06212813B1
公开(公告)日：2001-04-10
申请号：US09223067
申请日：1998-12-29
申请人： Cruz Luna , Larry Ross
发明人： Cruz Luna , Larry Ross
IPC分类号： F41A1700
CPC分类号： F41A17/44
摘要： A Quick-release Gun Lock is disclosed. The gun lock comprises a base that cooperates with the gun's extractor, a pliable and expandable portion attached to the base for expanding to create an interference fit with the gun's bore, and a compression shaft that, when rotated, will force the expandable portion outwardly to create the interference fit. The device may further include a cam hub that interacts with the compression shaft to provide the desired interference fit with less than one rotation.
摘要翻译：公开了一种快速释放枪锁。枪锁包括与枪的提取器配合的基座，附接到基座的柔韧且可扩张的部分用于扩张以产生与枪的孔的过盈配合;以及压缩轴，当旋转时，压缩轴将迫使可扩张部分向外创建过盈配合。该装置还可以包括与压缩轴相互作用的凸轮毂，以提供小于一个旋转的期望的过盈配合。

5. 发明申请

US20140149811A1 AT-SPEED INTEGRATED CIRCUIT TESTING USING THROUGH SILICON IN-CIRCUIT LOGIC ANALYSIS 审中-公开
标题翻译：使用硅电路逻辑分析的AT速度集成电路测试
公开(公告)号：US20140149811A1
公开(公告)日：2014-05-29
申请号：US13862244
申请日：2013-04-12
申请人： Larry Ross , Michael Bruce
发明人： Larry Ross , Michael Bruce
IPC分类号： G01R31/3177
CPC分类号： G01R31/2882 , G01R31/311
摘要： A method, system, and computer program product for integrated circuit wafer and die testing. The method commences by selecting areas of interest accessible from a backside of an integrated circuit where the areas of interest correspond to electronic devices (e.g., gates or transistors or vias or pads). Then, using a small-beam light source such as a laser, illuminating the areas of interest and collecting the reflected signal returned from illuminated areas of interest. A processor analyses the reflected signal to determine logic states and timing information of the electronic devices and compares the determined logic states and timing information to a pre-determined logic pattern to identify one or more errors as observed from the actual electronic devices. Specific points within an area of interest are determined from CAD layout data, and the pre-determined logic patterns can be retrieved from CAD simulation data.
摘要翻译：一种用于集成电路晶片和芯片测试的方法，系统和计算机程序产品。该方法通过从感兴趣区域对应于电子设备（例如，门或晶体管或通孔或焊盘）的集成电路的背面选择感兴趣的区域开始。然后，使用诸如激光器的小束光源照射感兴趣的区域并收集从感兴趣的照明区域返回的反射信号。处理器分析反射信号以确定电子设备的逻辑状态和定时信息，并将所确定的逻辑状态和定时信息与预定逻辑模式进行比较，以识别从实际电子设备观测到的一个或多个错误。从CAD布局数据确定感兴趣区域内的特定点，并且可以从CAD仿真数据中检索预定逻辑图案。

6. 发明申请

US20100024277A1 Lateral quick connect-disconnect fish hook coupling system 审中-公开
标题翻译：横向快速连接断开鱼钩联轴器系统
公开(公告)号：US20100024277A1
公开(公告)日：2010-02-04
申请号：US12221380
申请日：2008-08-01
申请人： Larry Ross
发明人： Larry Ross
IPC分类号： A01K83/00 , A01K85/00
CPC分类号： A01K85/16 , A01K83/00
摘要： A holder for a fish hook is provided. The holder has a generally O- or U-shaped wire body having a first end and a second end. The first end is slightly spaced away from the second end for attachment to a lure body. The second end has a branched terminus with opposing first and second branches. The holder has an undercut that extends into the wire body without severing it. The second end is adapted to receive an eye of the fish hook by placing the eye over the first and second branches in sequence using the undercut in one position to thread the fish hook onto the wire body. Various designs of holders are possible with the common theme being that the branched terminus of the second end is sized to prevent an eye of a fish hook from passing over both the first and second branch simultaneously. The holders may also be part of a fishing lure.
摘要翻译：提供鱼钩的支架。保持器具有大致为O形或U形的线体，其具有第一端和第二端。第一端与第二端稍微间隔开，用于附接到诱饵体上。第二端具有带相对的第一和第二分支的支链末端。支架具有延伸到线体中而不断开的底切。第二端适于通过在一个位置中使用底切将眼睛放置在第一和第二分支上而顺序地接收鱼钩的眼睛，以将鱼钩螺纹连接到线体上。保持器的各种设计是可能的，其共同的主题是第二端的分支末端的尺寸设计成防止鱼钩的眼睛同时穿过第一和第二分支。持有人也可能是钓鱼诱惑的一部分。

7. 发明授权

US5950344A Quick-release gun lock 失效
公开(公告)号：US5950344A
公开(公告)日：1999-09-14
申请号：US960704
申请日：1997-10-30
申请人： Larry Ross
发明人： Larry Ross
IPC分类号： F41A17/44 , F41A17/00
CPC分类号： F41A17/44
摘要： A Quick-release Gun Lock is disclosed. The gun lock comprises a base that cooperates with the gun's extractor, a pliable and expandable portion attached to the base for expanding to create an interference fit with the gun's bore, and a compression shaft that, when rotated, will force the expandable portion outwardly to create the interference fit. The device may further include a cam hub that interacts with the compression shaft to provide the desired interference fit with less than one rotation.

8. 发明授权

US10012692B2 Precision probe positioning for at-speed integrated circuit testing using through silicon in-circuit logic analysis 有权
公开(公告)号：US10012692B2
公开(公告)日：2018-07-03
申请号：US14299696
申请日：2014-06-09
申请人： Larry Ross , Michael Bruce
发明人： Larry Ross , Michael Bruce
IPC分类号： G01R31/311 , G01R31/3177
CPC分类号： G01R31/311 , G01R31/3177
摘要： A method, system, and computer program product for precision probe positioning and testing of an integrated circuit. Methods, systems, and a computer program product implement techniques for determining a particular area of interest for precision probe positioning and testing where the particular area of interest comprises an area less than an entire area of the integrated circuit. Once the particular area of interest for testing has been determined, then a laser probe is steered or otherwise directed to illuminate a plurality of pixels within the area of interest so as to generate reflected signals corresponding to the illuminated pixels. Techniques are provided for measuring the reflected signals to determine information about the IC within the area of interest. CAD data or user data can be used to determine XY addressable pixel locations within the area of interest.

9. 发明申请

US20170299653A9 PRECISION PROBE POSITIONING FOR AT-SPEED INTEGRATED CIRCUIT TESTING USING THROUGH SILICON IN-CIRCUIT LOGIC ANALYSIS 审中-公开
公开(公告)号：US20170299653A9
公开(公告)日：2017-10-19
申请号：US14299696
申请日：2014-06-09
申请人： Larry Ross , Michael Bruce
发明人： Larry Ross , Michael Bruce
IPC分类号： G01R31/311 , G01R31/3177
CPC分类号： G01R31/311 , G01R31/3177
摘要： A method, system, and computer program product for precision probe positioning and testing of an integrated circuit. Methods, systems, and a computer program product implement techniques for determining a particular area of interest for precision probe positioning and testing where the particular area of interest comprises an area less than an entire area of the integrated circuit. Once the particular area of interest for testing has been determined, then a laser probe is steered or otherwise directed to illuminate a plurality of pixels within the area of interest so as to generate reflected signals corresponding to the illuminated pixels. Techniques are provided for measuring the reflected signals to determine information about the IC within the area of interest. CAD data or user data can be used to determine XY addressable pixel locations within the area of interest.

10. 发明授权

US09714978B2 At-speed integrated circuit testing using through silicon in-circuit logic analysis 有权
公开(公告)号：US09714978B2
公开(公告)日：2017-07-25
申请号：US13862244
申请日：2013-04-12
申请人： Larry Ross , Michael Bruce
发明人： Larry Ross , Michael Bruce
IPC分类号： G01R31/3177 , G01R31/28 , G01R31/311
CPC分类号： G01R31/2882 , G01R31/311
摘要： A method, system, and computer program product for integrated circuit wafer and die testing. The method commences by selecting areas of interest accessible from a backside of an integrated circuit where the areas of interest correspond to electronic devices (e.g., gates or transistors or vias or pads). Then, using a small-beam light source such as a laser, illuminating the areas of interest and collecting the reflected signal returned from illuminated areas of interest. A processor analyses the reflected signal to determine logic states and timing information of the electronic devices and compares the determined logic states and timing information to a pre-determined logic pattern to identify one or more errors as observed from the actual electronic devices. Specific points within an area of interest are determined from CAD layout data, and the pre-determined logic patterns can be retrieved from CAD simulation data.

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