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    • 4. 发明申请
    • X-RAY OBSCURATION FILM AND RELATED TECHNIQUES
    • X射线观察膜及相关技术
    • US20150303154A1
    • 2015-10-22
    • US14789885
    • 2015-07-01
    • Lockheed Martin Corporation
    • Stephen GonyaJesse Iannon
    • H01L23/00H05K9/00
    • G21F3/00H01L23/552H01L23/573H01L2924/0002H05K1/02H05K1/0209H05K1/0275H05K2201/0715H05K2201/09681H01L2924/00
    • An X-ray obscuration (XRO) film comprising one or more metallic wire mesh layers and an adjacent layer of indium foil having portions which extend into openings of the wire mesh and in contact with metallic portions thereof. The XRO film can be capable of absorbing at least a portion of X-ray energy thereby creating an interference pattern when the XRO film is coupled with an electronic circuit and placed between an X-ray source and an X-ray detector and subjected to radiographic inspection. The interference pattern can create sufficient visual static to effectively obscure circuit lines in the electronic circuit when subjected to radiographic inspection techniques. The XRO film can be substantially thinner than existing solutions for preventing X-ray inspection with an exemplary embodiment being no more than 5 mils thick. The metallic XRO film can also provide electromagnetic shielding and/or heat dissipation for electronic circuits.
    • 包括一个或多个金属丝网层和相邻的铟箔层的X射线遮蔽(XRO)膜,其具有延伸到金属丝网的开口中并与其金属部分接触的部分。 XRO膜能够吸收X射线能量的至少一部分,从而当XRO膜与电子电路耦合并且放置在X射线源和X射线检测器之间并经受射线照相时产生干涉图案 检查。 干涉图案可以产生足够的视觉静电,以在经受射线照相检查技术时有效地遮蔽电子电路中的电路线。 XRO膜可以比用于防止X射线检查的现有解决方案薄得多,示例性实施例不超过5密耳厚。 金属XRO膜还可以为电子电路提供电磁屏蔽和/或散热。
    • 6. 发明申请
    • X-RAY OBSCURATION FILM AND RELATED TECHNIQUES
    • X射线观察膜及相关技术
    • US20140374627A1
    • 2014-12-25
    • US14325670
    • 2014-07-08
    • Lockheed Martin Corporation
    • Stephen GonyaJesse Iannon
    • G21F3/00
    • G21F3/00H01L23/552H01L23/573H01L2924/0002H05K1/02H05K1/0209H05K1/0275H05K2201/0715H05K2201/09681H01L2924/00
    • An X-ray obscuration (XRO) film comprising one or more metallic wire mesh layers and an adjacent layer of indium foil having portions which extend into openings of the wire mesh and in contact with metallic portions thereof. The XRO film can be capable of absorbing at least a portion of X-ray energy thereby creating an interference pattern when the XRO film is coupled with an electronic circuit and placed between an X-ray source and an X-ray detector and subjected to radiographic inspection. The interference pattern can create sufficient visual static to effectively obscure circuit lines in the electronic circuit when subjected to radiographic inspection techniques. The XRO film can be substantially thinner than existing solutions for preventing X-ray inspection with an exemplary embodiment being no more than 5 mils thick. The metallic XRO film can also provide electromagnetic shielding and/or heat dissipation for electronic circuits.
    • 包括一个或多个金属丝网层和相邻的铟箔层的X射线遮蔽(XRO)膜,其具有延伸到金属丝网的开口中并与其金属部分接触的部分。 XRO膜能够吸收X射线能量的至少一部分,从而当XRO膜与电子电路耦合并且放置在X射线源和X射线检测器之间并经受射线照相时产生干涉图案 检查。 干涉图案可以产生足够的视觉静电,以在经受射线照相检查技术时有效地遮蔽电子电路中的电路线。 XRO膜可以比用于防止X射线检查的现有解决方案薄得多,示例性实施例不超过5密耳厚。 金属XRO膜还可以为电子电路提供电磁屏蔽和/或散热。
    • 7. 发明授权
    • X-ray obscuration film and related techniques
    • X射线遮蔽膜及相关技术
    • US08772745B1
    • 2014-07-08
    • US13827297
    • 2013-03-14
    • Lockheed Martin Corporation
    • Stephen GonyaJesse Iannon
    • B41M3/14
    • G21F3/00H01L23/552H01L23/573H01L2924/0002H05K1/02H05K1/0209H05K1/0275H05K2201/0715H05K2201/09681H01L2924/00
    • An X-ray obscuration (XRO) film comprising one or more metallic wire mesh layers and an adjacent layer of indium foil having portions which extend into openings of the wire mesh and in contact with metallic portions thereof. The XRO film can be capable of absorbing at least a portion of X-ray energy thereby creating an interference pattern when the XRO film is coupled with an electronic circuit and placed between an X-ray source and an X-ray detector and subjected to radiographic inspection. The interference pattern can create sufficient visual static to effectively obscure circuit lines in the electronic circuit when subjected to radiographic inspection techniques. The XRO film can be substantially thinner than existing solutions for preventing X-ray inspection with an exemplary embodiment being no more than 5 mils thick. The metallic XRO film can also provide electromagnetic shielding and/or heat dissipation for electronic circuits.
    • 包括一个或多个金属丝网层和相邻的铟箔层的X射线遮蔽(XRO)膜,其具有延伸到金属丝网的开口中并与其金属部分接触的部分。 XRO膜能够吸收X射线能量的至少一部分,从而当XRO膜与电子电路耦合并且放置在X射线源和X射线检测器之间并经受射线照相时产生干涉图案 检查。 干涉图案可以产生足够的视觉静电,以在经受射线照相检查技术时有效地遮蔽电子电路中的电路线。 XRO膜可以比用于防止X射线检查的现有解决方案薄得多,示例性实施例不超过5密耳厚。 金属XRO膜还可以为电子电路提供电磁屏蔽和/或散热。
    • 9. 发明授权
    • X-ray obscuration film and related techniques
    • X射线遮蔽膜及相关技术
    • US09087617B2
    • 2015-07-21
    • US14325670
    • 2014-07-08
    • Lockheed Martin Corporation
    • Stephen GonyaJesse Iannon
    • G21F1/12G21F3/00H05K1/02H01L23/00
    • G21F3/00H01L23/552H01L23/573H01L2924/0002H05K1/02H05K1/0209H05K1/0275H05K2201/0715H05K2201/09681H01L2924/00
    • An X-ray obscuration (XRO) film comprising one or more metallic wire mesh layers and an adjacent layer of indium foil having portions which extend into openings of the wire mesh and in contact with metallic portions thereof. The XRO film can be capable of absorbing at least a portion of X-ray energy thereby creating an interference pattern when the XRO film is coupled with an electronic circuit and placed between an X-ray source and an X-ray detector and subjected to radiographic inspection. The interference pattern can create sufficient visual static to effectively obscure circuit lines in the electronic circuit when subjected to radiographic inspection techniques. The XRO film can be substantially thinner than existing solutions for preventing X-ray inspection with an exemplary embodiment being no more than 5 mils thick. The metallic XRO film can also provide electromagnetic shielding and/or heat dissipation for electronic circuits.
    • 包括一个或多个金属丝网层和相邻的铟箔层的X射线遮蔽(XRO)膜,其具有延伸到金属丝网的开口中并与其金属部分接触的部分。 XRO膜能够吸收X射线能量的至少一部分,从而当XRO膜与电子电路耦合并且放置在X射线源和X射线检测器之间并经受射线照相时产生干涉图案 检查。 干涉图案可以产生足够的视觉静电,以在经受射线照相检查技术时有效地遮蔽电子电路中的电路线。 XRO膜可以比用于防止X射线检查的现有解决方案薄得多,示例性实施例不超过5密耳厚。 金属XRO膜还可以为电子电路提供电磁屏蔽和/或散热。