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1. 发明申请

US20200174083A1 APPARATUS AND METHOD FOR ESTIMATING STATE OF SECONDARY BATTERY 审中-公开
公开(公告)号：US20200174083A1
公开(公告)日：2020-06-04
申请号：US16623136
申请日：2019-01-25
申请人： LG CHEM, LTD.
发明人： Se-Wook SEO , Jin-Hyung LIM , Cheol-Soo LEE
IPC分类号： G01R31/392 , H01M10/46 , H01M10/48 , H01M10/44 , G01R31/3835 , H02J7/00
摘要： An apparatus for estimating a state of a secondary battery (SB), including: a charging unit electrically connected to two terminals of the SB, the charging unit charging the SB, a voltage measuring unit electrically connected to and measuring a voltage across the two terminals of the SB, a time measuring unit for: receiving a voltage value of the SB from the voltage measuring unit, and during charging of the SB, in a predefined voltage range, measuring a charge time of the SB corresponding to the voltage range multiple times, and a control unit for: transmitting/receiving an electrical signal to/from the charging unit, the voltage measuring unit, and the time measuring unit, calculating a ratio of a first charge time and a second charge time measured by the time measuring unit sequentially at a time interval, and estimating a state of the SB.

2. 发明申请

US20180074131A1 APPARATUS AND METHOD FOR CONDUCTING NAIL PENETRATION TEST FOR SECONDARY BATTERY 审中-公开
公开(公告)号：US20180074131A1
公开(公告)日：2018-03-15
申请号：US15562086
申请日：2016-09-08
申请人： LG CHEM, LTD.
发明人： Jin-Hyung LIM , Se-Wook SEO , Yo-Han KO , Yong-Seok CHOI
IPC分类号： G01R31/36
CPC分类号： G01R31/389 , G01R31/36 , G01R31/367 , G01R31/385 , H01M10/4285 , H01M10/48 , H01M10/488
摘要： An apparatus and method for conducting a nail penetration test for a secondary battery are provided. The apparatus for conducting the nail penetration test includes: a stage on which the secondary battery, which is an object of the nail penetration test, is fixed; a nail penetration unit including a nail elevating/lowering means; a voltage measuring unit configured to repeatedly measure a short-circuit voltage of the secondary battery with a time interval during the nail penetration test; and a controller operably coupled to the voltage measuring unit. The controller periodically receives a short-circuit voltage from the voltage measuring unit, determines a short-circuit current allowing the received short-circuit voltage to be applied between outermost nodes of an equivalent circuit which models the secondary battery whenever the short-circuit voltage is received, and visually outputs a change in the determined value of the short-circuit current according to time through a display unit.

3. 发明申请

US20180069272A1 APPARATUS AND METHOD FOR ADJUSTING CHARGING CONDITION OF SECONDARY BATTERY 审中-公开
公开(公告)号：US20180069272A1
公开(公告)日：2018-03-08
申请号：US15549838
申请日：2016-08-22
申请人： LG CHEM, LTD.
发明人： Se-Wook SEO , Sang-Il SON , Yo-Han KO , Jin-Hyung LIM , Yong-Seok CHOI
IPC分类号： H01M10/44 , H02J7/00 , H02J7/04
CPC分类号： H01M10/44 , B60L3/0046 , B60L58/12 , B60L58/24 , B60L2240/54 , B60L2240/545 , B60L2260/56 , H01M10/4221 , H02J7/00 , H02J7/0008 , H02J7/0081 , H02J7/0086 , H02J7/04 , H02J7/041 , H02J7/045 , H02J7/047
摘要： An apparatus and method for adjusting a charging condition of a secondary battery are provided. The apparatus includes: a controller configured to receive measurement results from a current measuring unit and a temperature measuring unit of the secondary battery, determine a charging current value and a current temperature value, determine a predicted overheat amount required to raise the temperature of the secondary battery from the current temperature to a threshold temperature for a preset reference time by using a predefined thermodynamic calculation equation, determine a predicted charging current required to generate the predicted overheat amount through charging, determine a predicted charging voltage expected when the predicted charging current flows through an equivalent circuit of the secondary battery, and when a condition of the predicted charging voltage being lower than a preset upper limit charging voltage is satisfied, adjust the upper limit charging voltage such that the upper limit charging voltage is lowered to the predicted charging voltage.

4. 发明申请

US20180059192A1 APPARATUS AND METHOD FOR ESTIMATING DEGREE OF AGING OF SECONDARY BATTERY 审中-公开
公开(公告)号：US20180059192A1
公开(公告)日：2018-03-01
申请号：US15560423
申请日：2016-08-22
申请人： LG CHEM, LTD.
发明人： Se-Wook SEO , Yo-Han KO , Jin-Hyung LIM , Yong-Seok CHOI
IPC分类号： G01R31/36
摘要： An apparatus for estimating a degree of aging of a secondary battery is configured to: determine a current and a temperature of the secondary battery; determine a state of charge from the current of the secondary battery; determine a degree of calendar aging by applying a cumulative degree-of-aging model to a degree-of-calendar-aging profile corresponding to the determined state of charge and the determined temperature while the secondary battery is in a calendar state; determine a degree of cycle aging by applying the cumulative degree-of-aging model to a degree-of-cycle-aging profile corresponding to the state of charge, the temperature, and the current of the secondary battery while the secondary battery is in a cycle state; and determine, as the degree of aging of the secondary battery, a weighted average value calculated for the determined degree of calendar aging and the determined degree of cycle aging based on calendar time and cycle time.

5. 发明申请

US20180080990A1 BATTERY TESTING APPARATUS AND METHOD 审中-公开
公开(公告)号：US20180080990A1
公开(公告)日：2018-03-22
申请号：US15707567
申请日：2017-09-18
申请人： LG CHEM, LTD.
发明人： Se-Wook SEO
IPC分类号： G01R31/36 , H01M10/48
摘要： Disclosed is a battery testing apparatus, which includes a memory unit configured to store profile data of a battery; an interface unit configured to receive a signal designating specific date in the future at which a lowest SOC according to degradation of the battery is to be predicted, the specific date being a time point after the beginning of life of the battery; and a processor connected to the memory unit and the interface unit to communicate therewith. The profile data includes a first look-up table in which open circuit voltages measured in advance for each SOC from the battery in the beginning of life are recorded; a second look-up table in which closed circuit voltages and open circuit voltages obtained for each SOC from an equivalent circuit of the battery in the beginning of life are recorded; and a third look-up table in which a resistance increase rate predetermined for each use period is recorded. The processor predicts the lowest SOC at the specific date according to the degradation of the battery with reference to the first look-up table, the second look-up table and the third look-up table.

6. 发明申请

US20210288355A1 APPARATUS AND METHOD FOR ESTIMATING CAPACITY RETENTION RATIO OF SECONDARY BATTERY 有权
公开(公告)号：US20210288355A1
公开(公告)日：2021-09-16
申请号：US16336638
申请日：2018-06-14
申请人： LG CHEM, LTD.
发明人： Se-Wook SEO
IPC分类号： H01M10/42 , H01M10/48 , G01R31/36 , G01R31/374 , G01R31/387
摘要： An apparatus for estimating a capacity retention rate of a secondary battery from a degree of calendar aging and a degree of cycle aging of the secondary battery included in a battery pack, including a control unit that receives current information and temperature information of the secondary battery from a sensing unit installed in the battery pack in each cycle having a preset time length, and performs a first main process and a second main process in a sequential order, a memory that stores a predetermined weighting factor, and further stores a state of charge, a degree of cycle aging and a degree of calendar aging of the secondary battery updated in each cycle when the first main process is performed.

7. 发明申请

US20150112661A1 OVERCURRENT SIMULATION METHOD WHEN NAIL PENETRATES SECONDARY BATTERY AND RECORDING MEDIUM STORING THE PROGRAM 有权
标题翻译：钉扎二次电池和记录媒体存储程序时的过流模拟方法
公开(公告)号：US20150112661A1
公开(公告)日：2015-04-23
申请号：US14516258
申请日：2014-10-16
申请人： LG CHEM, LTD.
发明人： Se-Wook SEO , Dal-Mo KANG , Seung-Hun JUNG
IPC分类号： G06F17/50
CPC分类号： G06F17/5036 , G06F2217/78
摘要： Disclosed is an overcurrent simulation method when a nail penetrates a secondary battery and a recording medium storing the program. The overcurrent simulation method according to the present disclosure constructs a safety device and a secondary battery equivalent circuit, and produces a nail penetration effect by changing a resistance value. In this instance, various current simulations may be obtained by changing a first metal sheet and a second metal sheet included in the safety device, and a resistance value limiting an overcurrent may be calculated.
摘要翻译：公开了一种当钉子穿过二次电池和存储该程序的记录介质时的过电流模拟方法。根据本公开的过电流模拟方法构造安全装置和二次电池等效电路，并且通过改变电阻值来产生指甲穿透效果。在这种情况下，可以通过改变包括在安全装置中的第一金属片和第二金属片来获得各种电流模拟，并且可以计算限制过电流的电阻值。

8. 发明申请

US20200150183A1 METHOD AND APPARATUS FOR ESTIMATING SOC-OCV PROFILE 审中-公开
公开(公告)号：US20200150183A1
公开(公告)日：2020-05-14
申请号：US16624057
申请日：2019-01-28
申请人： LG CHEM, LTD.
发明人： Du-Seong YOON , Jin-Hyung LIM , Yo-Han KO , Yong-Jun KIM , Hyeong-Seok KIM , Gi-Min NAM , Se-Wook SEO , Won-Tae JOE , Su-Hyun CHAE
IPC分类号： G01R31/367 , G01R31/382
摘要： An apparatus estimating a state of charge (SOC)-open circuit voltage (OCV) profile, including: a storage unit storing: a beginning of life (BOL) positive electrode (PE) half-cell SOC-OCV profile and available range (AR), a BOL negative electrode (NE) half-cell SOC-OCV profile and AR, and a BOL full-cell SOC-OCV profile and total capacity (TC), and a control unit estimating a full-cell SOC-OCV profile at middle of life (MOL), including: an AR determination module for: calculating an MOL full-cell TC while a secondary battery is fully charged/discharged at MOL, and determining the MOL PE and NE ARs so a ratio of the MOL to the BOL full-cell TCs equals a ratio of the MOL to the BOL PE ARs and a ratio of the MOL to the BOL NE ARs, and a profile management module for: estimating, as an MOL full-cell SOC-OCV profile, a differential profile, and updating the BOL full-cell SOC-OCV profile.

9. 发明申请

US20150145525A1 OVERCURRENT SIMULATION METHOD WHEN NAIL PENETRATES SECONDARY BATTERY AND RECORDING MEDIUM STORING THE PROGRAM 有权
公开(公告)号：US20150145525A1
公开(公告)日：2015-05-28
申请号：US14525310
申请日：2014-10-28
申请人： LG CHEM, LTD.
发明人： Se-Wook SEO , Dal-Mo KANG , Seung-Hun JUNG
IPC分类号： G01R31/16 , G01R31/36
CPC分类号： G06F17/5036 , G01R31/3651 , H01M2/345 , H01M10/425 , H01M10/4285 , H01M10/48 , H01M2200/00
摘要： Disclosed is an overcurrent simulation method when a nail penetrates a secondary battery and a recording medium storing the program. The overcurrent simulation method according to the present disclosure constructs a safety device and a secondary battery equivalent circuit, and produces a nail penetration effect by changing a resistance value. In this instance, various current simulations may be obtained by changing a first metal sheet and a second metal sheet included in the safety device, and a resistance value limiting an overcurrent may be calculated.

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