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    • 1. 发明授权
    • Method for fabricating BiCMOS device
    • BiCMOS器件制造方法
    • US5693555A
    • 1997-12-02
    • US670756
    • 1996-06-21
    • Kwang-Soo KimCheon-Soo KimKyu-Ha BaekBo-Woo Kim
    • Kwang-Soo KimCheon-Soo KimKyu-Ha BaekBo-Woo Kim
    • H01L21/822H01L21/8249H01L27/06
    • H01L21/8249H01L27/0623
    • A method for fabricating a bipolar complementary metal oxide semiconductor device, includes a first step of forming a three-layered substrate of p.sup.- /n.sup.+ /n.sup.- type or n.sup.- /p.sup.+ /p.sup.- type and forming p- and n-wells to be adjacent to each other to the bottom of the top layer of the three-layered substrate; a second step of isolating the p- and n-wells from each other and defining a region for a bipolar transistor on one side to separate base/emitter regions from each other; a third step of defining a gate region to form a metal- oxide semiconductor transistor in each of the p- and n-wells and forming collector/emitter regions in the bipolar transistor region; and a fourth step of forming an n-type metal oxide semiconductor transistor, a p-type metal oxide semiconductor transistor and a bipolar transistor on the p-well, n-well and collector/emitter regions, respectively, and forming source/drain and base electrodes through diffusion by using a doped polycrystalline silicon sidewall spacer.
    • 一种制造双极互补金属氧化物半导体器件的方法,包括:形成p / n + / n型或n / p + / p-型三层衬底并形成p-和n-阱的第一步骤 彼此相邻到三层基板的顶层的底部; 将p阱和n阱彼此隔离并且在一侧限定双极晶体管的区域以将基极/发射极区彼此分离的第二步骤; 限定栅极区以在所述p阱和n阱中的每一个中形成金属氧化物半导体晶体管并在所述双极晶体管区域中形成集电极/发射极区域的第三步骤; 以及分别在p阱,n阱和集电极/发射极区域上形成n型金属氧化物半导体晶体管,p型金属氧化物半导体晶体管和双极晶体管的第四步骤,并且形成源极/漏极和 通过使用掺杂的多晶硅侧壁间隔物扩散基底电极。
    • 5. 发明授权
    • Method for fabricating semiconductor device
    • 制造半导体器件的方法
    • US07998862B2
    • 2011-08-16
    • US12689344
    • 2010-01-19
    • Kunsik ParkKyu-Ha BaekLee-Mi DoDong-Pyo KimJi Man Park
    • Kunsik ParkKyu-Ha BaekLee-Mi DoDong-Pyo KimJi Man Park
    • H01L21/4763H01L21/44
    • H01L21/76898H01L21/2885
    • A method of fabricating a semiconductor device includes forming a via hole in a semiconductor substrate, forming an isolation layer on an inner side of the via hole, forming a diffusion barrier layer over an upper portion of the semiconductor substrate and the inner side of the via hole where the isolation layer is formed, arranging a solvent, which contains electrically charged metal particles, on the semiconductor substrate where the diffusion barrier layer is formed, and filling the via hole with the metal particles by moving the metal particles using applied external force. The applied external force said includes a voltage causing an electric current to flow between the semiconductor substrate and the solvent, an electrical field applied between the semiconductor substrate and the solvent, or a magnetic field applied between the semiconductor substrate and the solvent.
    • 一种制造半导体器件的方法包括在半导体衬底中形成通孔,在通孔的内侧形成隔离层,在半导体衬底的上部和通孔的内侧形成扩散阻挡层 形成隔离层的孔,在形成有扩散阻挡层的半导体衬底上布置含有带电荷的金属颗粒的溶剂,并通过使用外力移动金属颗粒来填充通孔。 所施加的外力包括导致电流在半导体衬底和溶剂之间流动的电压,施加在半导体衬底和溶剂之间的电场或施加在半导体衬底和溶剂之间的磁场。
    • 7. 发明申请
    • TEMPLATES USED FOR NANOIMPRINT LITHOGRAPHY AND METHODS FOR FABRICATING THE SAME
    • 用于纳米压印的模板及其制作方法
    • US20110104322A1
    • 2011-05-05
    • US12763380
    • 2010-04-20
    • Kunsik PARKDong-Pyo KimJi Man ParkKyu-Ha BaekLee-Mi Do
    • Kunsik PARKDong-Pyo KimJi Man ParkKyu-Ha BaekLee-Mi Do
    • B28B11/08B05D3/10
    • G03F7/0002B82Y10/00B82Y40/00
    • Provided are a template used for nanoimprint lithography and a method for fabricating the same. A raised first deposition layer pattern including at least one downwardly sloped side surface is formed on a substrate. A second deposition layer pattern covering the side surface of the raised first deposition layer pattern and progressively decreasing in width downward along the side surface of the raised first deposition layer pattern is formed. A third deposition layer is formed on the entire surface of a structure on which the second deposition layer pattern. A second deposition layer nano pattern between the raised first deposition layer pattern and a planarized third deposition layer is formed by planarizing the third deposition layer to expose upper surfaces of the raised first deposition layer pattern and the second deposition layer pattern. An intaglio nano pattern defined by side surfaces sloped downward from upper surfaces of the raised first deposition layer pattern and the planarized third deposition layer to the surface of the substrate is formed by removing the second deposition layer nano pattern.
    • 提供了用于纳米压印光刻的模板及其制造方法。 在衬底上形成包括至少一个向下倾斜的侧表面的升高的第一沉积层图案。 形成覆盖凸起的第一沉积层图案的侧表面并且沿着凸起的第一沉积层图案的侧表面沿着宽度逐渐减小的第二沉积层图案。 第三沉积层形成在其上具有第二沉积层图案的结构的整个表面上。 在凸起的第一沉积层图案和平坦化的第三沉积层之间的第二沉积层纳米图案通过平坦化第三沉积层以暴露升高的第一沉积层图案和第二沉积层图案的上表面而形成。 通过去除第二沉积层纳米图案,形成由从凸起的第一沉积层图案的上表面向下倾斜的侧表面和平坦化的第三沉积层到基板的表面限定的凹版纳米图案。