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    • 2. 发明申请
    • Novel hard bias design for sensor applications
    • 传感器应用的新型硬偏置设计
    • US20060132988A1
    • 2006-06-22
    • US11016506
    • 2004-12-17
    • Kunliang ZhangMao-Min ChenChyu-Jiuh TorngMin LiChen-Jung Chien
    • Kunliang ZhangMao-Min ChenChyu-Jiuh TorngMin LiChen-Jung Chien
    • G11B5/33G11B5/127
    • B82Y25/00B82Y10/00G11B5/3932G11B2005/3996Y10T29/49032
    • A hard bias structure for biasing a free layer in a MR element within a magnetic read head is comprised of a soft magnetic underlayer such as NiFe and a hard bias layer comprised of Co78.6Cr5.2Pt16.2 or Co65Cr15Pt20 that are rigidly exchange coupled to ensure a well aligned longitudinal biasing direction with minimal dispersions. The hard bias structure is formed on a BCC seed layer such as CrTi to improve lattice matching. The hard bias structure may be laminated in which each of the underlayers and hard bias layers has a thickness that is adjusted to optimize the total HC, Mrt, and S values. The present invention encompasses CIP and CPP spin values, MTJ devices, and multi-layer sensors. A larger process window for fabricating the hard bias structure is realized and lower asymmetry output and NBLW reject rates during a read operation are achieved.
    • 用于偏置磁读头内的MR元件中的自由层的硬偏压结构由诸如NiFe的软磁性底层和由Co ++ 78.6Cr 5.2构成的硬偏置层组成, 或刚性交换耦合以确保良好对准的/SUB>Pt16.2 或Co 15 Cr 15 纵向偏置方向最小分散。 在诸如CrTi的BCC种子层上形成硬偏压结构以改善晶格匹配。 可以层压硬偏压结构,其中每个底层和硬偏压层具有被调节以使总H C,M L t和S的最大化的厚度 价值观。 本发明包括CIP和CPP旋转值,MTJ装置和多层传感器。 实现了用于制造硬偏置结构的更大的工艺窗口,并且实现了读操作期间较低的不对称输出和NBLW废弃率。
    • 3. 发明授权
    • Composite hard bias design with a soft magnetic underlayer for sensor applications
    • 复合硬偏置设计与传感器应用的软磁底层
    • US07446987B2
    • 2008-11-04
    • US11016507
    • 2004-12-17
    • Kunliang ZhangMao-Min ChenChyu-Jiuh TorngMin LiChen-Jung Chien
    • Kunliang ZhangMao-Min ChenChyu-Jiuh TorngMin LiChen-Jung Chien
    • G11B5/33G11B5/127
    • B82Y25/00B82Y10/00G11B5/3909G11B5/3932G11B2005/3996
    • A hard bias structure for biasing a free layer in a MR element within a magnetic read head is comprised of a soft magnetic underlayer such as NiFe and a hard bias layer comprised of Co78.6Cr5.2Pt16.2 or Co65Cr15Pt20 that are rigidly exchange coupled to ensure a well aligned longitudinal biasing direction with minimal dispersions. The hard bias structure is formed on a BCC seed layer such as CrTi to improve lattice matching. The hard bias structure may be laminated in which each of the underlayers and hard bias layers has a thickness that is adjusted to optimize the total Hc, Mrt, and S values. The present invention encompasses CIP and CPP spin values, MTJ devices, and multi-layer sensors. A larger process window for fabricating the hard bias structure is realized and lower asymmetry output and NBLW (normalized base line wandering) reject rates during a read operation are achieved.
    • 用于偏置磁读头内的MR元件中的自由层的硬偏压结构由诸如NiFe的软磁性底层和由Co ++ 78.6Cr 5.2构成的硬偏置层组成, 或刚性交换耦合以确保良好对准的/SUB>Pt16.2 或Co 15 Cr 15 纵向偏置方向最小分散。 在诸如CrTi的BCC种子层上形成硬偏压结构以改善晶格匹配。 可以层压硬偏压结构,其中每个底层和硬偏压层具有被调节以使总H c,M L t和S的最大值的厚度 价值观。 本发明包括CIP和CPP旋转值,MTJ装置和多层传感器。 实现了用于制造硬偏置结构的更大的工艺窗口,并且实现了在读取操作期间较低的不对称输出和NBLW(归一化的基线漂移)拒绝率。
    • 4. 发明授权
    • Composite hard bias design with a soft magnetic underlayer for sensor applications
    • 复合硬偏置设计与传感器应用的软磁底层
    • US07515388B2
    • 2009-04-07
    • US11016506
    • 2004-12-17
    • Kunliang ZhangMao-Min ChenChyu-Jiuh TorngMin LiChen-Jung Chien
    • Kunliang ZhangMao-Min ChenChyu-Jiuh TorngMin LiChen-Jung Chien
    • G11B5/33G11B5/127
    • B82Y25/00B82Y10/00G11B5/3932G11B2005/3996Y10T29/49032
    • A hard bias structure for biasing a free layer in a MR element within a magnetic read head is comprised of a soft magnetic underlayer such as NiFe and a hard bias layer comprised of Co78.6Cr5.2Pt16.2 or Co65Cr15Pt20 that are rigidly exchange coupled to ensure a well aligned longitudinal biasing direction with minimal dispersions. The hard bias structure is formed on a BCC seed layer such as CrTi to improve lattice matching. The hard bias structure may be laminated in which each of the underlayers and hard bias layers has a thickness that is adjusted to optimize the total HC, Mrt, and S values. The present invention encompasses CIP and CPP spin values, MTJ devices, and multi-layer sensors. A larger process window for fabricating the hard bias structure is realized and lower asymmetry output and NBLW (normalized base line wandering) reject rates during a read operation are achieved.
    • 用于偏置磁读头内的MR元件中的自由层的硬偏置结构由诸如NiFe的软磁性底层和由Co78.6Cr5.2Pt16.2或Co65Cr15Pt20构成的硬偏置层组成,其刚性交换耦合到 确保具有最小分散度的良好对齐的纵向偏置方向。 在诸如CrTi的BCC种子层上形成硬偏压结构以改善晶格匹配。 可以层压硬偏压结构,其中每个底层和硬偏压层具有被调节以使总HC,Mrt和S值最优化的厚度。 本发明包括CIP和CPP旋转值,MTJ装置和多层传感器。 实现了用于制造硬偏置结构的更大的工艺窗口,并且实现了在读取操作期间较低的不对称输出和NBLW(归一化的基线漂移)拒绝率。
    • 9. 发明申请
    • Novel hard bias design for extra high density recording
    • 用于超高密度记录的新型硬偏置设计
    • US20100172053A1
    • 2010-07-08
    • US12660908
    • 2010-03-05
    • Kunliang ZhangYun-Fei LiChyu-Jiuh TorngChen-Jung Chien
    • Kunliang ZhangYun-Fei LiChyu-Jiuh TorngChen-Jung Chien
    • G11B5/187B05D1/36
    • B82Y25/00B82Y10/00G11B5/3912G11B5/3932G11B2005/3996
    • A hard bias structure for biasing a free layer in a MR element within a read head is comprised of a composite hard bias layer having a Co78.6Cr5.2Pt16.2/Co65Cr15Pt20 configuration. The upper Co65Cr15Pt20 layer has a larger Hc value and a thickness about 2 to 10 times greater than that of the Co78.6Cr5.2Pt16.2 layer. The hard bias structure may also include a BCC underlayer such as FeCoMo which enhances the magnetic moment of the hard bias structure. Optionally, the thickness of the Co78.6Cr5.2Pt16.2 layer is zero and the Co65Cr15Pt20 layer is formed on the BCC underlayer. The present invention also encompasses a laminated hard bias structure. The Mrt value for the hard bias structure may be optimized by adjusting the thicknesses of the BCC underlayer and CoCrPt layers. As a result, a larger process window is realized and lower asymmetry output during a read operation is achieved.
    • 用于偏置读取头内的MR元件中的自由层的硬偏置结构由具有Co78.6Cr5.2Pt16.2 / Co65Cr15Pt20配置的复合硬偏置层组成。 Co65Cr15Pt20上层具有较大的Hc值,厚度约为Co78.6Cr5.2Pt16.2层的2〜10倍。 硬偏压结构还可以包括诸如FeCoMo的BCC底层,其增强了硬偏压结构的磁矩。 可选地,Co78.6Cr5.2Pt16.2层的厚度为零,Co65Cr15Pt20层形成在BCC底层上。 本发明还包括层压硬偏置结构。 可以通过调整BCC底层和CoCrPt层的厚度来优化硬偏置结构的Mrt值。 结果,实现了更大的处理窗口,并且在读取操作期间实现了较低的不对称输出。
    • 10. 发明授权
    • Hard bias design for extra high density recording
    • 用于超高密度记录的硬偏置设计
    • US07688555B2
    • 2010-03-30
    • US10868716
    • 2004-06-15
    • Kunliang ZhangYun-Fei LiChyu-Jiuh TorngChen-Jung Chien
    • Kunliang ZhangYun-Fei LiChyu-Jiuh TorngChen-Jung Chien
    • G11B5/39G11B5/127
    • B82Y25/00B82Y10/00G11B5/3912G11B5/3932G11B2005/3996
    • A hard bias structure for biasing a free layer in a MR element within a read head is comprised of a composite hard bias layer having a Co78.6Cr5.2Pt16.2/Co65Cr15Pt20 configuration. The upper Co65Cr15Pt20 layer has a larger Hc value and a thickness about 2 to 10 times greater than that of the Co78.6Cr5.2Pt16.2 layer. The hard bias structure may also include a BCC underlayer such as FeCoMo which enhances the magnetic moment of the hard bias structure. Optionally, the thickness of the Co78.6Cr5.2Pt16.2 layer is zero and the Co65Cr15Pt20 layer is formed on the BCC underlayer. The present invention also encompasses a laminated hard bias structure. The Mrt value for the hard bias structure may be optimized by adjusting the thicknesses of the BCC underlayer and CoCrPt layers. As a result, a larger process window is realized and lower asymmetry output during a read operation is achieved.
    • 用于偏置读取头内的MR元件中的自由层的硬偏置结构由具有Co78.6Cr5.2Pt16.2 / Co65Cr15Pt20配置的复合硬偏置层组成。 Co65Cr15Pt20上层具有较大的Hc值,厚度约为Co78.6Cr5.2Pt16.2层的2〜10倍。 硬偏压结构还可以包括诸如FeCoMo的BCC底层,其增强了硬偏压结构的磁矩。 可选地,Co78.6Cr5.2Pt16.2层的厚度为零,Co65Cr15Pt20层形成在BCC底层上。 本发明还包括层压硬偏置结构。 可以通过调整BCC底层和CoCrPt层的厚度来优化硬偏置结构的Mrt值。 结果,实现了更大的处理窗口,并且在读取操作期间实现了较低的不对称输出。