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热词
    • 2. 发明授权
    • Test apparatus, test method, analyzing apparatus and computer readable medium
    • 测试仪器,测试方法,分析仪器和计算机可读介质
    • US07689880B2
    • 2010-03-30
    • US12047329
    • 2008-03-13
    • Kunihiko Kawasaki
    • Kunihiko Kawasaki
    • G11C29/00
    • G11C29/56G11C29/56008G11C2029/2602
    • There is provided a test apparatus including a plurality of test signal feeding sections that are provided in a one-to-one correspondence with the plurality of memories under test, where each of the plurality of test signal feeding sections feeds a test signal designed to test a corresponding one of the plurality of memories under test to the corresponding memory under test, a plurality of defect detecting sections that are provided in a one-to-one correspondence with the plurality of memories under test, where each of the plurality of defect detecting sections detects a defect in a corresponding one of the plurality of memories under test, a plurality of first calculating sections that are provided in a one-to-one correspondence with the plurality of memories under test, where each of the plurality of first calculating sections calculates a remedy solution for a corresponding one of the plurality of memories under test and the remedy solution remedies the defect in the corresponding memory under test by replacing a defective storage cell in the corresponding memory under test with a backup cell of the corresponding memory under test, and a second calculating section that takes over, from one or more of the plurality of first calculating sections which have not finished calculating the remedy solutions, the unfinished remedy solution calculations, in response to a start of calculations by the plurality of first calculating sections for remedy solutions for a different group of memories under test, and performs the remedy solution calculations.
    • 提供了一种测试装置,包括多个测试信号馈送部分,所述测试信号馈送部分与被测试的多个存储器一一对应地设置,其中多个测试信号馈送部分中的每一个馈送设计为测试的测试信号 被测试的多个存储器中的对应的一个被测试的对应存储器,多个缺陷检测部分,与被测试的多个存储器一一对应地设置,其中多个缺陷检测 部分检测被测试的多个存储器中的对应的一个中的缺陷,多个第一计算部分,与被测试的多个存储器一一对应地设置,其中多个第一计算部分 为被测试的多个存储器中的对应的一个计算补救解决方案,并且补救措施解决了相应的m中的缺陷 通过用待测对应的存储器的备用单元替换被测试的对应的存储器中的有缺陷的存储单元的第二计算部分,以及从未完成的多个第一计算部分中的一个或多个接管的第二计算部分, 响应于所述多个第一计算部分开始计算用于被测试的不同存储器组的补救方案,并且执行补救方案计算,来计算补救措施解决方案,未完成的补救方案计算。