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    • 1. 发明申请
    • WAVEFRONT MEASURING APPARATUS, WAVEFRONT MEASURING METHOD, AND OBJECT MEASURING APPARATUS
    • WAVEFRONT测量装置,WAVEFRONT测量方法和对象测量装置
    • US20140183363A1
    • 2014-07-03
    • US14119169
    • 2012-04-19
    • Kousuke KajikiToshihiko OuchiTakeaki Itsuji
    • Kousuke KajikiToshihiko OuchiTakeaki Itsuji
    • G01B9/02
    • G01B9/02G01J9/00G01N21/3554G01N21/3581G01N21/3586G02B26/0833
    • The present invention provides a wavefront measuring apparatus and method, and object measuring apparatus which can increase resolution of wavefronts of electromagnetic wave pulses without being limited by the number of detecting elements. An embodiment of the present invention includes a detecting part detecting electric field strength of an electromagnetic wave pulse, and an optical delaying part delaying the electromagnetic wave pulse so as to provide a first propagation path and a second propagation path provided in a spatial region different from a spatial region of the first propagation path and having a length different from a length of the first propagation path, wherein time waveforms of the electromagnetic wave pulse are constructed using a signal associated with the electric field strength detected by the detecting part, and a wavefront is obtained based on the time waveforms and information associated with the lengths of the first and second propagation paths.
    • 本发明提供一种波前测量装置和方法以及可以增加电磁波脉冲波前分辨率而不受检测元件数量限制的对象测量装置。 本发明的一个实施例包括检测电磁波脉冲的电场强度的检测部分和延迟电磁波脉冲的光延迟部分,以便提供第一传播路径和设置在不同于 所述第一传播路径的空间区域具有与所述第一传播路径的长度不同的长度,其中,所述电磁波脉冲的时间波形使用与由所述检测部检测的电场强度相关联的信号构成, 基于与第一和第二传播路径的长度相关联的时间波形和信息获得。
    • 2. 发明申请
    • PHOTOCONDUCTIVE ELEMENT
    • 光电元件
    • US20120235040A1
    • 2012-09-20
    • US13416447
    • 2012-03-09
    • Toshihiko OuchiKousuke Kajiki
    • Toshihiko OuchiKousuke Kajiki
    • G01J3/28H01L31/18H01L31/12
    • G01J3/42G01N21/3586H01L31/09
    • Provided is a photoconductive element which solves a problem inherent in an element for generating/detecting a terahertz wave by photoexcitation that terahertz wave generation efficiency is limited by distortions and defects of a low temperature grown semiconductor. The photoconductive element includes: a semiconductor substrate; a semiconductor low temperature growth layer; and a semiconductor layer, which is positioned between the semiconductor low temperature growth layer and the semiconductor substrate and is thinner than the semiconductor low temperature growth layer, in which the semiconductor low temperature growth layer includes a semiconductor which lattice-matches with the semiconductor layer and does not lattice-match with the semiconductor substrate.
    • 提供一种光电元件,其解决了通过光激发产生/检测太赫兹波的元件固有的问题,太赫兹波发生效率受到低温生长半导体的失真和缺陷的限制。 光电导元件包括:半导体衬底; 半导体低温生长层; 以及半导体层,其位于半导体低温生长层和半导体基板之间并且比半导体低温生长层薄,其中半导体低温生长层包括与半导体层晶格匹配的半导体,以及 不与半导体衬底进行晶格匹配。
    • 3. 发明申请
    • INFORMATION ACQUIRING APPARATUS, AND INFORMATION ACQUIRING METHOD
    • 信息获取装置和信息获取方法
    • US20090198466A1
    • 2009-08-06
    • US12364422
    • 2009-02-02
    • Kousuke KajikiToshihiko Ouchi
    • Kousuke KajikiToshihiko Ouchi
    • G06F19/00G01J3/00
    • G01J3/42G01N21/3563G01N21/3586G01N21/85
    • An information acquiring apparatus includes a light source portion for generating pulse-shaped pump light, and first and second probe light in synchronization with each other. A generating portion generates terahertz pulses when irradiated with the pump light. A detecting portion detects pulses of terahertz radiation from the object. A first delay portion adjusts an optical path difference between optical paths of the pump light and the first probe light reaching the detecting portion, so that the detecting portion detects a field intensity of a fixed point on the time domain waveform of the terahertz pulse from the object, following the fixed point. A second delay portion adjusts an optical path difference between the optical path of the pump light and the second probe light reaching the detecting portion by a sum of an additional optical path adjustment amount and the optical path difference, so that the detecting portion obtains the time domain waveform. A correction processing portion compensates for influence of a change in condition of the object on the time domain waveform, using the field intensity of the fixed point, or the adjustment amount adjusted by the first delay portion.
    • 信息获取装置包括用于产生脉冲形泵浦光的光源部分和彼此同步的第一和第二探测光。 当用泵浦光照射时,产生部分产生太赫兹脉冲。 检测部分检测来自物体的太赫兹辐射的脉冲。 第一延迟部分调节泵浦光的光路和到达检测部分的第一探测光之间的光程差,使得检测部分检测从太赫兹脉冲的时域波形上的固定点的场强 对象,遵循固定点。 第二延迟部分通过附加光程调整量与光程差之和调整泵浦光的光路与到达检测部的第二探测光之间的光程差,使得检测部获得时间 域波形。 校正处理部分使用固定点的场强或由第一延迟部分调整的调整量来补偿对象的状态变化对时域波形的影响。
    • 4. 发明授权
    • Photoconductive element
    • 光导元件
    • US08835853B2
    • 2014-09-16
    • US13416447
    • 2012-03-09
    • Toshihiko OuchiKousuke Kajiki
    • Toshihiko OuchiKousuke Kajiki
    • G01N21/35H01L31/09G01J3/42
    • G01J3/42G01N21/3586H01L31/09
    • Provided is a photoconductive element which solves a problem inherent in an element for generating/detecting a terahertz wave by photoexcitation that terahertz wave generation efficiency is limited by distortions and defects of a low temperature grown semiconductor. The photoconductive element includes: a semiconductor substrate; a semiconductor low temperature growth layer; and a semiconductor layer, which is positioned between the semiconductor low temperature growth layer and the semiconductor substrate and is thinner than the semiconductor low temperature growth layer, in which the semiconductor low temperature growth layer includes a semiconductor which lattice-matches with the semiconductor layer and does not lattice-match with the semiconductor substrate.
    • 提供一种光电元件,其解决了用于通过光激发产生/检测太赫兹波的元件固有的问题,太赫兹波发生效率受到低温生长半导体的失真和缺陷的限制。 光电导元件包括:半导体衬底; 半导体低温生长层; 以及半导体层,其位于半导体低温生长层和半导体基板之间并且比半导体低温生长层薄,其中半导体低温生长层包括与半导体层晶格匹配的半导体,以及 不与半导体衬底进行晶格匹配。
    • 6. 发明申请
    • ELECTROMAGNETIC ANALYSIS APPARATUS
    • 电磁分析仪
    • US20090059226A1
    • 2009-03-05
    • US12196224
    • 2008-08-21
    • Kousuke KajikiToshihiko OuchiRyota Sekiguchi
    • Kousuke KajikiToshihiko OuchiRyota Sekiguchi
    • G01J3/28
    • G01J3/42G01J3/02G01J3/0218G01J3/20G01J3/36G01N21/31G01N21/3563G01N21/8901
    • An analysis apparatus for analyzing a specimen comprises a spectral separator for dispersing spatially an electromagnetic wave introduced from the specimen into spectral components, a sensing element array containing plural sensing elements for sensing the spectral components of the electromagnetic wave dispersed spatially by the spectral separator, and a spectrum calculator for calculating the spectrum from the signal sensed by the sensing elements; the sensing element array having sensitivities different to each of the spectral components of the electromagnetic wave dispersed spatially by the spectral separator, and the spectral separator and the sensing element array being placed so as to receive the spectral components by each of the sensing elements at different incident angles.
    • 用于分析试样的分析装置包括用于将从试样引入的电磁波空间分散到光谱分量中的光谱分离装置,包含用于感测由光谱分离器在空间上分散的电磁波的光谱分量的多个感测元件的感测元件阵列,以及 频谱计算器,用于根据由感测元件感测的信号计算频谱; 感测元件阵列具有与通过光谱分离器在空间上分散的电磁波的每个光谱分量不同的灵敏度,并且光谱分离器和感测元件阵列被放置以便通过每个感测元件在不同的方向上接收光谱分量 入射角度
    • 10. 发明授权
    • Compensation in terahertz time domain spectroscopy having two delays
    • 具有两个延迟的太赫兹时域光谱补偿
    • US08514399B2
    • 2013-08-20
    • US12364422
    • 2009-02-02
    • Kousuke KajikiToshihiko Ouchi
    • Kousuke KajikiToshihiko Ouchi
    • G01J5/02G01J3/45
    • G01J3/42G01N21/3563G01N21/3586G01N21/85
    • An information acquiring apparatus includes a light source portion for generating pulse-shaped pump light, and first and second probe light in synchronization with each other. A generating portion generates terahertz pulses when irradiated with the pump light. A detecting portion detects pulses of terahertz radiation from the object. A first delay portion adjusts an optical path difference between optical paths of the pump light and the first probe light reaching the detecting portion, so that the detecting portion detects a field intensity of a fixed point on the time domain waveform of the terahertz pulse from the object, following the fixed point. A second delay portion adjusts an optical path difference between the optical path of the pump light and the second probe light reaching the detecting portion by a sum of an additional optical path adjustment amount and the optical path difference, so that the detecting portion obtains the time domain waveform. A correction processing portion compensates for influence of a change in condition of the object on the time domain waveform, using the field intensity of the fixed point, or the adjustment amount adjusted by the first delay portion.
    • 信息获取装置包括用于产生脉冲形泵浦光的光源部分和彼此同步的第一和第二探测光。 当用泵浦光照射时,产生部分产生太赫兹脉冲。 检测部分检测来自物体的太赫兹辐射的脉冲。 第一延迟部分调节泵浦光的光路和到达检测部分的第一探测光之间的光程差,使得检测部分检测从太赫兹脉冲的时域波形上的固定点的场强 对象,遵循固定点。 第二延迟部分通过附加光程调整量与光程差之和调整泵浦光的光路与到达检测部的第二探测光之间的光程差,使得检测部获得时间 域波形。 校正处理部分使用固定点的场强或由第一延迟部分调整的调整量来补偿对象的状态变化对时域波形的影响。