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1. 发明申请

US20120231666A1 CONNECTOR 失效
标题翻译：连接器
公开(公告)号：US20120231666A1
公开(公告)日：2012-09-13
申请号：US13365613
申请日：2012-02-03
申请人： Koki Takahashi , Koki Sato , Mitsuru Kobayashi
发明人： Koki Takahashi , Koki Sato , Mitsuru Kobayashi
IPC分类号： H01R24/28 , H01R4/18
CPC分类号： H01R12/721 , H01R12/716
摘要： A connector to be mounted on a substrate includes a first pad and a second pad formed on the surface, including a first contact including a first contacting portion to be in contact with the first pad when the connector is mounted on the substrate; and a second contact including a second contacting portion to be in contact with the second pad when the connector is mounted on the substrate, the first contact and the second contact being configured such that the first contacting portion slides on the first pad in a first direction while the second contacting portion slides on the second pad in a second direction opposite to the first direction, when the first contact and the second contact are pushed toward the first pad and the second pad, respectively, while the connector is being placed on and fixed to the substrate.
摘要翻译：要安装在基板上的连接器包括形成在表面上的第一焊盘和第二焊盘，包括第一接触件，当第一接触件包括第一接触部分以在接头安装在基板上时与第一焊盘接触; 以及第二触点，当所述连接器安装在所述基板上时，所述第二触点包括与所述第二焊盘接触的第二接触部分，所述第一触点和所述第二触点被构造成使得所述第一接触部分在所述第一焊盘上沿第一方向而第二接触部分在与第一方向相反的第二方向上在第二焊盘上滑动，当第一接触件和第二接触件分别被推向第一焊盘和第二焊盘时，同时连接器被放置并固定到基底。

2. 发明申请

US20110050263A1 PROBE AND METHOD OF MANUFACTURING PROBE 有权
标题翻译：探索和制造探针的方法
公开(公告)号：US20110050263A1
公开(公告)日：2011-03-03
申请号：US12870895
申请日：2010-08-30
申请人： Koki Sato , Yasuyuki Miki , Keita Harada , Mitsuru Kobayashi , Hideo Miyazawa , Koki Takahashi
发明人： Koki Sato , Yasuyuki Miki , Keita Harada , Mitsuru Kobayashi , Hideo Miyazawa , Koki Takahashi
IPC分类号： G01R1/067 , H05K13/00
CPC分类号： H05K13/00 , G01R1/067 , G01R1/06722 , G01R3/00 , H01L21/67005 , Y10T29/49002 , Y10T29/49204
摘要： A probe is made to contact an electrode terminal in an electric circuit or an electronic part for an electric measurement of the electric circuit or the electronic part. The probe includes a terminal portion which is brought in contact with the electrode terminal at one end of the probe, a spring portion in which U-shaped unit portions are arrayed in a zigzag formation, and a housing portion which surrounds the spring portion. The probe is formed of a sheet of a sheet-metal plate which is bent multiple times, the sheet-metal plate having a predetermined configuration in which a portion corresponding to the terminal portion, a portion corresponding to the spring portion, and a portion corresponding to the housing portion are continuously linked together.
摘要翻译：探针用于接触电路或电子部件中的电极端子，用于电路或电子部件的电测量。探针包括在探针的一端与电极端子接触的端子部分，其中U形单元部分以锯齿形阵列排列的弹簧部分和围绕弹簧部分的壳体部分。探针由多次弯曲的片状金属板形成，片状金属板具有预定的构造，其中对应于端子部分的部分，对应于弹簧部分的部分和对应于该部分的部分连接到壳体部分。

3. 发明授权

US08668499B2 Connector 失效
标题翻译：连接器
公开(公告)号：US08668499B2
公开(公告)日：2014-03-11
申请号：US13365613
申请日：2012-02-03
申请人： Koki Takahashi , Koki Sato , Mitsuru Kobayashi
发明人： Koki Takahashi , Koki Sato , Mitsuru Kobayashi
IPC分类号： H01R12/00
CPC分类号： H01R12/721 , H01R12/716
摘要： A connector to be mounted on a substrate includes a first pad and a second pad formed on the surface, including a first contact including a first contacting portion to be in contact with the first pad when the connector is mounted on the substrate; and a second contact including a second contacting portion to be in contact with the second pad when the connector is mounted on the substrate, the first contact and the second contact being configured such that the first contacting portion slides on the first pad in a first direction while the second contacting portion slides on the second pad in a second direction opposite to the first direction, when the first contact and the second contact are pushed toward the first pad and the second pad, respectively, while the connector is being placed on and fixed to the substrate.
摘要翻译：要安装在基板上的连接器包括形成在表面上的第一焊盘和第二焊盘，包括第一接触件，当第一接触件包括第一接触部分以在接头安装在基板上时与第一焊盘接触; 以及第二触点，当所述连接器安装在所述基板上时，所述第二触点包括与所述第二焊盘接触的第二接触部分，所述第一触点和所述第二触点被构造成使得所述第一接触部分在所述第一焊盘上沿第一方向而第二接触部分在与第一方向相反的第二方向上在第二焊盘上滑动，当第一接触件和第二接触件分别被推向第一焊盘和第二焊盘时，同时连接器被放置并固定到基底。

4. 发明申请

US20120194173A1 CONNECTOR, PROBE, AND METHOD OF MANUFACTURING PROBE 有权
标题翻译：连接器，探头和制造方法
公开(公告)号：US20120194173A1
公开(公告)日：2012-08-02
申请号：US13353377
申请日：2012-01-19
申请人： Koki Takahashi , Koki Sato , Mitsuru Kobayashi
发明人： Koki Takahashi , Koki Sato , Mitsuru Kobayashi
IPC分类号： G01R1/06
CPC分类号： G01R1/0416 , G01R1/06716 , G01R1/073 , G01R1/07307 , H01R13/2428 , H01R43/16
摘要： A connector includes multiple probes and a first insulator part and a second insulator part joined to cover the probes. Each of the probes has a monolithic structure of a single bent metal plate.Each of the probes includes an end part configured to come into contact with an electrode terminal; a spring part having a meandering shape and connected to the end part; a housing part bent to enclose the spring part; and a bent part provided between the spring part and the housing part. The end parts of the probes are at least partially projecting outward from first openings provided in the first insulator part, and the bent parts of the probes are at least partially projecting outward from second openings provided in the second insulator part.
摘要翻译：连接器包括多个探针和连接以覆盖探针的第一绝缘体部分和第二绝缘体部分。每个探针具有单个弯曲金属板的整体结构。每个探针包括构造成与电极端子接触的端部; 具有弯曲形状并连接到端部的弹簧部分; 弯曲以包围弹簧部分的壳体部分; 以及设置在弹簧部和壳体部之间的弯曲部。探针的端部至少部分地从设置在第一绝缘体部分中的第一开口向外突出，并且探针的弯曲部分至少部分地从设置在第二绝缘体部分中的第二开口向外突出。

5. 发明授权

US08901920B2 Connector, probe, and method of manufacturing probe 有权
标题翻译：连接器，探头和探头制造方法
公开(公告)号：US08901920B2
公开(公告)日：2014-12-02
申请号：US13353377
申请日：2012-01-19
申请人： Koki Takahashi , Koki Sato , Mitsuru Kobayashi
发明人： Koki Takahashi , Koki Sato , Mitsuru Kobayashi
IPC分类号： G01R1/06 , G01R31/20 , H01R13/24 , H01R43/16 , G01R1/067 , G01R1/073
CPC分类号： G01R1/0416 , G01R1/06716 , G01R1/073 , G01R1/07307 , H01R13/2428 , H01R43/16
摘要： A connector includes multiple probes and a first insulator part and a second insulator part joined to cover the probes. Each of the probes has a monolithic structure of a single bent metal plate. Each of the probes includes an end part configured to come into contact with an electrode terminal; a spring part having a meandering shape and connected to the end part; a housing part bent to enclose the spring part; and a bent part provided between the spring part and the housing part. The end parts of the probes are at least partially projecting outward from first openings provided in the first insulator part, and the bent parts of the probes are at least partially projecting outward from second openings provided in the second insulator part.
摘要翻译：连接器包括多个探针和连接以覆盖探针的第一绝缘体部分和第二绝缘体部分。每个探针具有单个弯曲金属板的整体结构。每个探针包括构造成与电极端子接触的端部; 具有弯曲形状并连接到端部的弹簧部分; 弯曲以包围弹簧部分的壳体部分; 以及设置在弹簧部和壳体部之间的弯曲部。探针的端部至少部分地从设置在第一绝缘体部分中的第一开口向外突出，并且探针的弯曲部分至少部分地从设置在第二绝缘体部分中的第二开口向外突出。

6. 发明授权

US08471578B2 Probe and method of manufacturing probe 有权
标题翻译：探头和探头的制造方法
公开(公告)号：US08471578B2
公开(公告)日：2013-06-25
申请号：US12870895
申请日：2010-08-30
申请人： Koki Sato , Yasuyuki Miki , Keita Harada , Mitsuru Kobayashi , Hideo Miyazawa , Koki Takahashi
发明人： Koki Sato , Yasuyuki Miki , Keita Harada , Mitsuru Kobayashi , Hideo Miyazawa , Koki Takahashi
IPC分类号： G01R31/20
CPC分类号： H05K13/00 , G01R1/067 , G01R1/06722 , G01R3/00 , H01L21/67005 , Y10T29/49002 , Y10T29/49204
摘要： A probe is made to contact an electrode terminal in an electric circuit or an electronic part for an electric measurement of the electric circuit or the electronic part. The probe includes a terminal portion which is brought in contact with the electrode terminal at one end of the probe, a spring portion in which U-shaped unit portions are arrayed in a zigzag formation, and a housing portion which surrounds the spring portion. The probe is formed of a sheet of a sheet-metal plate which is bent multiple times, the sheet-metal plate having a predetermined configuration in which a portion corresponding to the terminal portion, a portion corresponding to the spring portion, and a portion corresponding to the housing portion are continuously linked together.
摘要翻译：探针用于接触电路或电子部件中的电极端子，用于电路或电子部件的电测量。探针包括在探针的一端与电极端子接触的端子部分，其中U形单元部分以锯齿形阵列排列的弹簧部分和围绕弹簧部分的壳体部分。探针由多次弯曲的片状金属板形成，片状金属板具有预定的构造，其中对应于端子部分的部分，对应于弹簧部分的部分和对应于该部分的部分连接到壳体部分。

7. 发明授权

US08587333B2 Probe and method of manufacturing probe 有权
标题翻译：探头和探头的制造方法
公开(公告)号：US08587333B2
公开(公告)日：2013-11-19
申请号：US13084801
申请日：2011-04-12
申请人： Koki Sato , Koki Takahashi
发明人： Koki Sato , Koki Takahashi
IPC分类号： G01R31/00 , G01R31/20
CPC分类号： B21D5/16 , G01R1/06716 , G01R1/06733 , G01R3/00 , H01R13/2428 , H01R43/16 , H01R2201/20
摘要： A probe used for electrical measurement includes first and second internal electrically-conductive parts; first and second terminal contact parts configured to contact first and second external electrode terminals, respectively; first and second spring parts each having a meandering pattern; a housing part configured to surround the first and second internal electrically-conductive parts. The first internal electrically-conductive part, the first terminal contact part, the first spring part, the housing part, the second spring part, the second terminal contact part, and the second internal electrically-conductive part are successively connected in a single metal plate from a first end to a second end thereof. The first and second terminal contact parts are in first and second bent portions, respectively, of the single metal plate. The first and second internal electrically-conductive parts are configured to contact each other at the time of performing the electrical measurement.
摘要翻译：用于电测量的探针包括第一和第二内部导电部件; 分别与第一和第二外部电极端子接触的第一和第二端子接触部分; 第一和第二弹簧部件各自具有曲折图案; 壳体部分，其构造成围绕所述第一和第二内部导电部件。第一内部导电部分，第一端子接触部分，第一弹簧部分，壳体部分，第二弹簧部分，第二端子接触部分和第二内部导电部分连续地连接在单个金属板从第一端到第二端。第一和第二端子接触部分分别在单个金属板的第一和第二弯曲部分中。第一和第二内部导电部件被配置为在执行电测量时彼此接触。

8. 发明申请

US20110252657A1 PROBE AND METHOD OF MANUFACTURING PROBE 有权
标题翻译：探索和制造探针的方法
公开(公告)号：US20110252657A1
公开(公告)日：2011-10-20
申请号：US13084801
申请日：2011-04-12
申请人： Koki Sato , Koki Takahashi
发明人： Koki Sato , Koki Takahashi
IPC分类号： G01B7/00 , H01R43/16
CPC分类号： B21D5/16 , G01R1/06716 , G01R1/06733 , G01R3/00 , H01R13/2428 , H01R43/16 , H01R2201/20
摘要： A probe used for electrical measurement includes first and second internal electrically-conductive parts; first and second terminal contact parts configured to contact first and second external electrode terminals, respectively; first and second spring parts each having a meandering pattern; a housing part configured to surround the first and second internal electrically-conductive parts. The first internal electrically-conductive part, the first terminal contact part, the first spring part, the housing part, the second spring part, the second terminal contact part, and the second internal electrically-conductive part are successively connected in a single metal plate from a first end to a second end thereof. The first and second terminal contact parts are in first and second bent portions, respectively, of the single metal plate. The first and second internal electrically-conductive parts are configured to contact each other at the time of performing the electrical measurement.
摘要翻译：用于电测量的探针包括第一和第二内部导电部件; 分别与第一和第二外部电极端子接触的第一和第二端子接触部分; 第一和第二弹簧部件各自具有曲折图案; 壳体部分，其构造成围绕所述第一和第二内部导电部件。第一内部导电部分，第一端子接触部分，第一弹簧部分，壳体部分，第二弹簧部分，第二端子接触部分和第二内部导电部分连续地连接在单个金属板从第一端到第二端。第一和第二端子接触部分分别在单个金属板的第一和第二弯曲部分中。第一和第二内部导电部件被配置为在执行电测量时彼此接触。

9. 发明授权

US07135647B2 Keyboard 失效
公开(公告)号：US07135647B2
公开(公告)日：2006-11-14
申请号：US11226239
申请日：2005-09-15
申请人： Koki Takahashi
发明人： Koki Takahashi
IPC分类号： H01H9/26 , H01H13/72 , H01H13/76
CPC分类号： H01H13/702 , H01H3/125 , H01H2215/006 , H01H2227/036
摘要： A keyboard has a base plate, a membrane sheet, a housing, a key-top, a link mechanism disposed between the housing and the key-top, and a switch operating member disposed under the key-top and operated by the key-top. The housing, the membrane sheet and the base plate have slits at a position corresponding to a surrounding portion of the key-top. Consequently, the distance between the key-top and the housing can be decreased even if the skirt part of the key-top is long. Furthermore, the slit of the housing is formed as a discontinuous annular shape to surround the link mechanism, and the surrounding portion of the key-top has a slit corresponding to the bridge shaped portion of the housing.

10. 发明授权

US08113872B2 Flat-cable connector, production process thereof, and locking device 失效
标题翻译：扁平电缆连接器，其制造过程和锁定装置
公开(公告)号：US08113872B2
公开(公告)日：2012-02-14
申请号：US12974905
申请日：2010-12-21
申请人： Koki Takahashi , Manabu Shimizu , Kazuya Orui
发明人： Koki Takahashi , Manabu Shimizu , Kazuya Orui
IPC分类号： H01R13/54
CPC分类号： H01R12/79 , H01R12/721 , Y10T29/49204
摘要： A flat cable connector includes an insulated housing, a plurality of conductor contacts regularly arranged in the housing at a predetermined interval pads of a flat cable are connected with the contacts, respectively, when the flat cable is inserted into the housing. The conductor contact includes a stationary portion secured to the housing and a movable portion integrally formed with the stationary portion being resiliently moved with respect to the stationary portion, the conductive pads of the flat cable come into contact therewith.
摘要翻译：扁平电缆连接器包括绝缘壳体，当扁平电缆插入壳体中时，分别与扁平电缆的预定间隔焊盘规则地布置在壳体中的多个导体触头分别与触头连接。导体接触件包括固定在壳体上的固定部分和与固定部分一体形成的可移动部分，该固定部分相对于固定部分弹性移动，扁平电缆的导电焊盘与其接触。

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