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    • 1. 发明授权
    • Beam homogenizer, laser irradiation apparatus, and method for manufacturing semiconductor device
    • 光束均化器,激光照射装置以及半导体装置的制造方法
    • US08457463B2
    • 2013-06-04
    • US13116381
    • 2011-05-26
    • Koichiro TanakaTomoaki Moriwaka
    • Koichiro TanakaTomoaki Moriwaka
    • G02B6/10
    • G02B27/0966G02B6/4204G02B27/0994H01S3/005
    • The present invention provides a beam homogenizer being able to form a rectangular beam spot having homogeneous energy distribution in a direction of its major axis without using the optical lens requiring to be manufactured with high accuracy. In addition, the present invention provides a laser irradiation apparatus being able to irradiate the laser beam having homogeneous energy distribution in a direction of its major axis. Furthermore, the present invention provides a method for manufacturing a semiconductor device being able to enhance crystallinity in the surface of the substrate and to manufacture TFT with a high operating characteristic.The beam homogenizer, one of the present invention, is to shape the beam spot on the surface to be irradiated into a rectangular spot having an aspect ratio of 10 or more, preferably 100 or more, and comprises an optical waveguide for homogenizing the energy distribution of the rectangular beam spot in the direction of its major axis.
    • 本发明提供一种光束均化器,其能够在不需要以高精度制造的光学透镜的情况下形成在其长轴方向上具有均匀能量分布的矩形束斑。 此外,本发明提供一种激光照射装置,其能够照射具有在其长轴方向上具有均匀能量分布的激光束。 此外,本发明提供了一种能够提高基板表面的结晶度并制造具有高工作特性的TFT的半导体器件的制造方法。 本发明之一的光束均化器是将待照射的表面上的束斑成形为纵横比为10以上,优选为100以上的矩形斑点,并且包括用于使能量分布均匀化的光波导 的矩形束斑在其长轴方向上。
    • 2. 发明申请
    • Method for manufacturing crystalline semiconductor film and semiconductor device
    • 制造晶体半导体膜和半导体器件的方法
    • US20080318398A1
    • 2008-12-25
    • US11892968
    • 2007-08-28
    • Tomoaki MoriwakaKoichiro Tanaka
    • Tomoaki MoriwakaKoichiro Tanaka
    • H01L21/20
    • H01L21/02532H01L21/02683H01L21/02686H01L21/02691H01L27/1285H01L29/4908
    • There is provided a method for manufacturing a crystalline semiconductor film. An insulating film is formed over a substrate; an amorphous semiconductor film is formed over the insulating film; a cap film is formed over the amorphous semiconductor film; the amorphous semiconductor film is scanned and irradiated with a continuous wave laser beam or a laser beam with a repetition rate of greater than or equal to 10 MHz, through the cap film; and the amorphous semiconductor film is melted and crystallized. At that time, an energy period in a length direction in a laser beam spot of the laser beam is 0.5 μm to 10 μm, preferably, 1 μm to 5 μm; an energy distribution in a width direction in a laser beam spot of the laser beam is a Gaussian distribution; and the amorphous semiconductor film is scanned with the laser beam so as to be irradiated with the laser beam for a period of greater than or equal to 5 microseconds and less than or equal to 100 microseconds per region.
    • 提供一种制造结晶半导体膜的方法。 在基板上形成绝缘膜; 在绝缘膜上形成非晶半导体膜; 在非晶半导体膜上形成盖膜; 通过盖膜扫描并照射具有大于或等于10MHz的重复率的连续波激光束或激光束的非晶半导体膜; 并使非晶半导体膜熔融并结晶。 此时,激光束的激光束点的长度方向的能量周期为0.5μm〜10μm,优选为1〜5μm, 激光束的激光束点的宽度方向的能量分布为高斯分布; 并且用激光束扫描非晶半导体膜,以便用激光束照射大于或等于5微秒且小于或等于每个区域100微秒的周期。
    • 4. 发明授权
    • Beam homogenizer, laser irradiation apparatus, and method for manufacturing semiconductor device
    • 光束均化器,激光照射装置以及半导体装置的制造方法
    • US07953310B2
    • 2011-05-31
    • US12153720
    • 2008-05-23
    • Koichiro TanakaTomoaki Moriwaka
    • Koichiro TanakaTomoaki Moriwaka
    • G02B6/10
    • G02B27/0966G02B6/4204G02B27/0994H01S3/005
    • The present invention provides a beam homogenizer being able to form a rectangular beam spot having homogeneous energy distribution in a direction of its major axis without using the optical lens requiring to be manufactured with high accuracy. In addition, the present invention provides a laser irradiation apparatus being able to irradiate the laser beam having homogeneous energy distribution in a direction of its major axis. Furthermore, the present invention provides a method for manufacturing a semiconductor device being able to enhance crystallinity in the surface of the substrate and to manufacture TFT with a high operating characteristic.The beam homogenizer, one of the present invention, is to shape the beam spot on the surface to be irradiated into a rectangular spot having an aspect ratio of 10 or more, preferably 100 or more, and comprises an optical waveguide for homogenizing the energy distribution of the rectangular beam spot in the direction of its major axis.
    • 本发明提供一种光束均化器,其能够在不需要以高精度制造的光学透镜的情况下形成在其长轴方向上具有均匀能量分布的矩形束斑。 此外,本发明提供一种激光照射装置,其能够照射具有在其长轴方向上具有均匀能量分布的激光束。 此外,本发明提供了一种能够提高基板表面的结晶度并制造具有高工作特性的TFT的半导体器件的制造方法。 本发明之一的光束均化器是将待照射的表面上的束斑成形为纵横比为10以上,优选为100以上的矩形斑点,并且包括用于使能量分布均匀化的光波导 的矩形束斑在其长轴方向上。