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    • 2. 发明授权
    • Semiconductor integrated circuit device formed by automatic layout wiring by use of standard cells and design method of fixing its well potential
    • 半导体集成电路器件通过使用标准单元自动布线布线形成,并设计方法固定其良好的电位
    • US07882476B2
    • 2011-02-01
    • US11886928
    • 2005-09-15
    • Yasuhito ItakaKoichi KinoshitaTakeshi Sugahara
    • Yasuhito ItakaKoichi KinoshitaTakeshi Sugahara
    • G06F17/50H01L27/118H01L27/092
    • G06F17/5068H01L27/0207H01L27/11807
    • Standard cells without a well potential fixing active region (4T-11 to 4T-14, 4T-21 to 4T-24, 4T-31 to 4T-34, 4T-41 to 4T-44) are read from a library and a circuit is temporarily designed by automatic layout wiring. Then, a change in the substrate potential is estimated from at least one of the number of transistors to be switched at the same timing in the temporarily designed circuit, the sizes of transistors, the transition probability, and the appearance probability. It is determined whether the estimated change in the substrate potential is within a reference value. If the estimated change in the substrate potential has exceeded the reference value, standard cells with a well potential fixing active region (2T-11, 2T-21, 2T-31 and 2T-41) are read from the library and placed in a region where the estimated change in the substrate potential exceeds the reference value. Thereafter, automatic layout wiring is done again, thereby forming a circuit.
    • 从库和电路读取不具有阱电位固定有源区(4T-11至4T-14,4T-21至4T-24,4T-31至4T-34,4T-41至4T-44)的标准单元 是通过自动布局布线临时设计的。 然后,从暂时设计的电路中的相同定时的晶体管的数量中的至少一个,晶体管的尺寸,转移概率和出现概率来估计衬底电位的变化。 确定基板电位的估计变化是否在参考值内。 如果估计的衬底电位变化超过参考值,则从库中读出具有阱电位固定有源区(2T-11,2T-21,2T-31和2T-41)的标准电池,放置在区域 其中估计的衬底电位变化超过参考值。 此后,再次进行自动布局布线,从而形成电路。
    • 3. 发明申请
    • Semiconductor integrated circuit device formed by automatic layout wiring by use of standard cells and design method of fixing its well potential
    • 半导体集成电路器件通过使用标准单元自动布线布线形成,并设计方法固定其良好的电位
    • US20090083686A1
    • 2009-03-26
    • US11886928
    • 2005-09-15
    • Yasuhito ItakaKoichi KinoshitaTakeshi Sugahara
    • Yasuhito ItakaKoichi KinoshitaTakeshi Sugahara
    • G06F17/50
    • G06F17/5068H01L27/0207H01L27/11807
    • Standard cells without a well potential fixing active region (4T-11 to 4T-14, 4T-21 to 4T-24, 4T-31 to 4T-34, 4T-41 to 4T-44) are read from a library and a circuit is temporarily designed by automatic layout wiring. Then, a change in the substrate potential is estimated from at least one of the number of transistors to be switched at the same timing in the temporarily designed circuit, the sizes of transistors, the transition probability, and the appearance probability. It is determined whether the estimated change in the substrate potential is within a reference value. If the estimated change in the substrate potential has exceeded the reference value, standard cells with a well potential fixing active region (2T-11, 2T-21, 2T-31 and 2T-41) are read from the library and placed in a region where the estimated change in the substrate potential exceeds the reference value. Thereafter, automatic layout wiring is done again, thereby forming a circuit.
    • 从库和电路读取不具有阱电位固定有源区(4T-11至4T-14,4T-21至4T-24,4T-31至4T-34,4T-41至4T-44)的标准单元 是通过自动布局布线临时设计的。 然后,从暂时设计的电路中的相同定时的晶体管的数量中的至少一个,晶体管的尺寸,转移概率和出现概率来估计衬底电位的变化。 确定基板电位的估计变化是否在参考值内。 如果估计的衬底电位变化超过参考值,则从库中读出具有阱电位固定有源区(2T-11,2T-21,2T-31和2T-41)的标准电池,放置在区域 其中估计的衬底电位变化超过参考值。 此后,再次进行自动布局布线,从而形成电路。
    • 9. 发明授权
    • Semiconductor integrated circuit
    • 半导体集成电路
    • US06844926B2
    • 2005-01-18
    • US10205423
    • 2002-07-26
    • Yasuhito Itaka
    • Yasuhito Itaka
    • G11C11/419G11C7/06G11C7/12G11C11/406G11C11/407G11C11/409G11C11/417H01L27/12G11C16/04
    • H01L27/1203G11C7/065G11C7/12G11C11/417G11C2207/005
    • There is disclosed a semiconductor integrated circuit in which an equalize circuit is connected between input nodes N1, bN1 of a differential sense amplifier. A latch circuit is connected between nodes N2, bN2. A data change circuit is connected between the nodes N1 and bN2 and between the nodes bN1 and N2. A disconnection circuit is connected between the nodes N1 and N2 and between the nodes bN1 and bN2. In a state in which potentials of the input nodes N1, bN1 are equal to each other, the differential sense amplifier is operated, and output data of the amplifier is reversed by the data change circuit and subsequently latched by the latch circuit. The latched data is supplied to the input nodes N1, bN1 of the differential sense amplifier.
    • 公开了一种半导体集成电路,其中均衡电路连接在差分读出放大器的输入节点N1,bN1之间。 节点N2,bN2之间连接锁存电路。 数据变换电路连接在节点N1和bN2之间,节点bN1和N2之间。 节点N1和N2之间以及节点bN1和bN2之间连接断开电路。 在输入节点N1,bN1的电位彼此相等的状态下,差分读出放大器动作,放大器的输出数据由数据变换电路反转,随后由锁存电路锁存。 锁存的数据被提供给差分读出放大器的输入节点N1,bN1。