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1. 发明授权

US07583907B2 Method for adjusting a fusing device of a digital printing machine by determining the humidity of printing material and measuring device to detect the reflectance of microwave signals at a print material 失效
标题翻译：通过确定打印材料的湿度和测量装置来检测打印材料中的微波信号的反射率来调整数字印刷机的定影装置的方法
公开(公告)号：US07583907B2
公开(公告)日：2009-09-01
申请号：US10586982
申请日：2005-01-19
申请人： Knut Behnke , Bernd Geck , Frank-Michael Morgenweck , Domingo Rohde , Lars Seimetz , Oliver Klemp
发明人： Knut Behnke , Bernd Geck , Frank-Michael Morgenweck , Domingo Rohde , Lars Seimetz , Oliver Klemp
IPC分类号： G03G15/00
CPC分类号： G03G15/2007 , G03G2215/00776
摘要： It is an object of the present invention to provide a high-quality printed image in a printing machine. To achieve this, a method for adjusting a fusing device 100 of a digital printing machine has been provided, in which case microwave signals of a specific frequency or frequency range are directed at a printing material 5, a change between the microwave signals reflected by the printing material and the emitted microwave signals is detected, and in which case the fusing device is adjusted based on the change between said microwave signals. Furthermore, a measuring device 20 for a printing machine is provided, said device preferably being used for carrying out the said method, whereby the measuring device is configured so as to detect a change between a microwave signal reflected by the printing material 5 and a microwave signal directed at said printing material.
摘要翻译：本发明的目的是提供一种印刷机中的高品质印刷图像。为了实现这一点，已经提供了一种用于调整数字印刷机的定影装置100的方法，在这种情况下，特定频率或频率范围的微波信号针对打印材料5，由微波信号反射的微波信号之间的变化检测出打印材料和发射的微波信号，在这种情况下，基于所述微波信号之间的变化调整定影装置。此外，提供了一种用于印刷机的测量装置20，所述装置优选地用于执行所述方法，由此测量装置被配置为检测由打印材料5反射的微波信号与微波之间的变化信号指向所述打印材料。

2. 发明申请

US20070292151A1 Method For Adjusting A Fusing Device Of A Digital Printing Machine by Determining The Humidity Of Printing Material And Measuring Device To Detect The Reflectance Of Microwave Signals At A Print Material 失效
标题翻译：通过确定打印材料的湿度和测量装置来检测数字印刷机的定影装置以检测微波信号在打印材料上的反射率的方法
公开(公告)号：US20070292151A1
公开(公告)日：2007-12-20
申请号：US10586982
申请日：2005-01-19
申请人： Knut Behnke , Bernd Geck , Frank-Michael Morgenweck , Domingo Rohde , Lars Seimetz , Oliver Klemp
发明人： Knut Behnke , Bernd Geck , Frank-Michael Morgenweck , Domingo Rohde , Lars Seimetz , Oliver Klemp
IPC分类号： G03G15/00 , G03G15/20
CPC分类号： G03G15/2007 , G03G2215/00776
摘要： It is an object of the present invention to provide a high-quality printed image in a printing machine. To achieve this, a method for adjusting a fusing device 100 of a digital printing machine has been provided, in which case microwave signals of a specific frequency or frequency range are directed at a printing material 5, a change between the microwave signals reflected by the printing material and the emitted microwave signals is detected, and in which case the fusing device is adjusted based on the change between said microwave signals. Furthermore, a measuring device 20 for a printing machine is provided, said device preferably being used for carrying out the said method, whereby the measuring device is configured so as to detect a change between a microwave signal reflected by the printing material 5 and a microwave signal directed at said printing material.
摘要翻译：本发明的目的是提供一种印刷机中的高品质印刷图像。为了实现这一点，已经提供了一种用于调整数字印刷机的定影装置100的方法，在这种情况下，特定频率或频率范围的微波信号针对打印材料5，由微波信号反射的微波信号之间的变化检测出打印材料和发射的微波信号，在这种情况下，基于所述微波信号之间的变化调整定影装置。此外，提供了一种用于印刷机的测量装置20，所述装置优选地用于执行所述方法，由此测量装置被配置为检测由打印材料5反射的微波信号与微波之间的变化信号指向所述打印材料。

3. 发明授权

US08791705B2 Measurement arrangement having a calibration substrate and electronic circuit 有权
标题翻译：具有校准基板和电子电路的测量装置
公开(公告)号：US08791705B2
公开(公告)日：2014-07-29
申请号：US13123114
申请日：2009-09-29
申请人： Thomas Zelder , Bernd Geck
发明人： Thomas Zelder , Bernd Geck
IPC分类号： G01R35/04 , G01R27/32 , G01R35/00 , G01D18/00
CPC分类号： G01R1/0416 , G01D18/00 , G01R27/32 , G01R31/00 , G01R35/005
摘要： A calibration substrate having at least one calibration standard with at least two electrical connection points, each for one measurement gate of a vector network analyzer. At least one electrical connection point is formed of at least one calibration standard having a switch, wherein the switch has a first electrical contact electrically connected to an electrical connection point of the calibration standard, a second electrical contact designed for electrically connecting to a measurement gate of the vector network analyzer, and a third electrical contact, wherein the switch is designed such that an electrical contact is established either between the first and third electrical contact or between the first and second electrical contact.
摘要翻译：具有至少一个具有至少两个电连接点的校准标准的校准基板，每一个用于矢量网络分析器的一个测量门。至少一个电连接点由具有开关的至少一个校准标准形成，其中开关具有电连接到校准标准的电连接点的第一电触点，被设计用于电连接到测量门矢量网络分析器和第三电触点，其中开关被设计成使得在第一和第三电触头之间或者在第一和第二电触点之间建立电接触。

4. 发明授权

US08760184B2 Measuring probe for a vector network analysis system 有权
标题翻译：矢量网络分析系统的测量探头
公开(公告)号：US08760184B2
公开(公告)日：2014-06-24
申请号：US13003704
申请日：2009-06-23
申请人： Thomas Zelder , Bernd Geck
发明人： Thomas Zelder , Bernd Geck
IPC分类号： G01R31/302
CPC分类号： G01R29/0878 , G01R1/07 , G01R31/002
摘要： A measuring probe, particularly for a non-contacting vector network analysis system, having a housing and at least one coupling structure disposed on the housing and designed for coupling an HF signal from a signal line, such that at least one additional signal probe is disposed on the housing for coupling an electrical signal into the signal line.
摘要翻译：一种测量探针，特别是用于非接触矢量网络分析系统的测量探针，其具有壳体和设置在壳体上并被设计用于耦合来自信号线的HF信号的至少一个耦合结构，使得设置至少一个附加信号探针在壳体上用于将电信号耦合到信号线中。

5. 发明申请

US20110163773A1 MEASURING PROBE 有权
标题翻译：测量探头
公开(公告)号：US20110163773A1
公开(公告)日：2011-07-07
申请号：US13003704
申请日：2009-06-23
申请人： Thomas Zelder , Bernd Geck
发明人： Thomas Zelder , Bernd Geck
IPC分类号： G01R31/302
CPC分类号： G01R29/0878 , G01R1/07 , G01R31/002
摘要： A measuring probe, particularly for a non-contacting vector network analysis system, having a housing and at least one coupling structure disposed on the housing and designed for coupling an HF signal from a signal line, such that at least one additional signal probe is disposed on the housing for coupling an electrical signal into the signal line.
摘要翻译：一种测量探针，特别是用于非接触矢量网络分析系统的测量探针，其具有壳体和设置在壳体上并被设计用于耦合来自信号线的HF信号的至少一个耦合结构，使得设置至少一个附加信号探针在壳体上用于将电信号耦合到信号线中。

6. 发明授权

US09116189B2 Measuring system for determining scatter parameters 有权
标题翻译：用于确定散射参数的测量系统
公开(公告)号：US09116189B2
公开(公告)日：2015-08-25
申请号：US13122504
申请日：2009-09-29
申请人： Thomas Zelder , Bernd Geck
发明人： Thomas Zelder , Bernd Geck
IPC分类号： G01R31/00 , G01R27/28
CPC分类号： G01R27/28
摘要： A measuring system for determining scatter parameters of an electrical measurement object on a substrate, having a measuring machine having at least one measuring channel and at least one measuring probe electrically connected to at least one measuring channel and designed for non-contacting or contacting connection to an electrical signal line of the electrical measurement in the electronic circuit. A first positioning device is provided for at least one measuring probe, wherein at least one sensor detects a position of at least one measuring probe and outputs a position signal.
摘要翻译：一种用于确定基板上的电测量对象的散射参数的测量系统，其具有测量机，所述测量机具有至少一个测量通道，以及至少一个测量探头，电连接到至少一个测量通道，并被设计用于非接触或接触连接电子电路中的电测量的电信号线。为至少一个测量探针提供第一定位装置，其中至少一个传感器检测至少一个测量探针的位置并输出位置信号。

7. 发明授权

US08963570B2 Contactless loop probe 有权
标题翻译：非接触式环路探头
公开(公告)号：US08963570B2
公开(公告)日：2015-02-24
申请号：US13057900
申请日：2009-07-15
申请人： Thomas Zelder , Bernd Geck
发明人： Thomas Zelder , Bernd Geck
IPC分类号： G01R1/067 , G01R1/07 , G01R31/315
CPC分类号： G01R1/07 , G01R1/06772 , G01R31/315
摘要： The invention relates to a contactless loop probe for the contactless decoupling of an HF signal for a contactless measuring system, comprising at least one coupling structure (10) and at least one first signal conductor (12) electrically connected to the coupling structure (10) by a first transition (20), said signal conductor being electrically connected by a second transition (22) to an output (14) for electrically connecting to the measuring system, wherein the coupling structure (10) is designed as an HF waveguide comprising at least one signal conductor (24; 30) and at least one reference conductor (26; 32).
摘要翻译：本发明涉及一种用于非接触式测量系统的HF信号的非接触去耦的非接触式环路探针，包括至少一个耦合结构（10）和至少一个电连接到耦合结构（10）的第一信号导体（12）通过第一过渡（20），所述信号导体通过第二过渡（22）电连接到用于电连接到测量系统的输出（14），其中耦合结构（10）被设计为HF波导，其包括至少一个信号导体（24; 30）和至少一个参考导体（26; 32）。

8. 发明申请

US20110267088A1 CONTACTLESS LOOP PROBE 有权
标题翻译：无接触环路探测器
公开(公告)号：US20110267088A1
公开(公告)日：2011-11-03
申请号：US13057900
申请日：2009-07-15
申请人： Thomas Zelder , Bernd Geck
发明人： Thomas Zelder , Bernd Geck
IPC分类号： G01R1/07 , G01R31/302
CPC分类号： G01R1/07 , G01R1/06772 , G01R31/315
摘要： The invention relates to a contactless loop probe for the contactless decoupling of an HF signal for a contactless measuring system, comprising at least one coupling structure (10) and at least one first signal conductor (12) electrically connected to the coupling structure (10) by a first transition (20), said signal conductor being electrically connected by a second transition (22) to an output (14) for electrically connecting to the measuring system, wherein the coupling structure (10) is designed as an HF waveguide comprising at least one signal conductor (24; 30) and at least one reference conductor (26; 32).
摘要翻译：本发明涉及一种用于非接触式测量系统的HF信号的非接触去耦的非接触式环路探针，包括至少一个耦合结构（10）和至少一个电连接到耦合结构（10）的第一信号导体（12）通过第一过渡（20），所述信号导体通过第二过渡（22）电连接到用于电连接到测量系统的输出（14），其中耦合结构（10）被设计为HF波导，其包括至少一个信号导体（24; 30）和至少一个参考导体（26; 32）。

9. 发明申请

US20110254536A1 MEASUREMENT ARRANGEMENT HAVING A CALIBRATION SUBSTRATE AND ELECTRONIC CIRCUIT 有权
标题翻译：具有校准基板和电子电路的测量装置
公开(公告)号：US20110254536A1
公开(公告)日：2011-10-20
申请号：US13123114
申请日：2009-09-29
申请人： Thomas Zelder , Bernd Geck
发明人： Thomas Zelder , Bernd Geck
IPC分类号： G01R35/04
CPC分类号： G01R1/0416 , G01D18/00 , G01R27/32 , G01R31/00 , G01R35/005
摘要： A calibration substrate having at least one calibration standard with at least two electrical connection points, each for one measurement gate of a vector network analyzer. At least one electrical connection point is formed of at least one calibration standard having a switch, wherein the switch has a first electrical contact electrically connected to an electrical connection point of the calibration standard, a second electrical contact designed for electrically connecting to a measurement gate of the vector network analyzer, and a third electrical contact, wherein the switch is designed such that an electrical contact is established either between the first and third electrical contact or between the first and second electrical contact.
摘要翻译：具有至少一个具有至少两个电连接点的校准标准的校准基板，每一个用于矢量网络分析器的一个测量门。至少一个电连接点由具有开关的至少一个校准标准形成，其中开关具有电连接到校准标准的电连接点的第一电触点，被设计用于电连接到测量门矢量网络分析器和第三电触点，其中开关被设计成使得在第一和第三电触头之间或者在第一和第二电触点之间建立电接触。

10. 发明申请

US20110241712A1 MEASURING SYSTEM FOR DETERMINING SCATTER PARAMETERS 有权
标题翻译：用于确定散射参数的测量系统
公开(公告)号：US20110241712A1
公开(公告)日：2011-10-06
申请号：US13122504
申请日：2009-09-29
申请人： Thomas Zelder , Bernd Geck
发明人： Thomas Zelder , Bernd Geck
IPC分类号： G01R31/00
CPC分类号： G01R27/28
摘要： A measuring system for determining scatter parameters of an electrical measurement object on a substrate, having a measuring machine having at least one measuring channel and at least one measuring probe electrically connected to at least one measuring channel and designed for non-contacting or contacting connection to an electrical signal line of the electrical measurement in the electronic circuit. A first positioning device is provided for at least one measuring probe, wherein at least one sensor detects a position of at least one measuring probe and outputs a position signal.
摘要翻译：一种用于确定基板上的电测量对象的散射参数的测量系统，其具有测量机，所述测量机具有至少一个测量通道，以及至少一个测量探头，电连接到至少一个测量通道，并被设计用于非接触或接触连接电子电路中的电测量的电信号线。为至少一个测量探针提供第一定位装置，其中至少一个传感器检测至少一个测量探针的位置并输出位置信号。

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