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    • 6. 发明授权
    • Information reproducing apparatus and secure module
    • 信息再现装置和安全模块
    • US07913094B2
    • 2011-03-22
    • US10305187
    • 2002-11-27
    • Kiyoshi KohiyamaTakayuki Hasebe
    • Kiyoshi KohiyamaTakayuki Hasebe
    • G06F11/30G06F12/14
    • G06F21/33G06F21/10
    • In an information reproducing apparatus having an open architecture, a secure module stores first information, and has a structure which does not allow access to the first information from outside, and a memory has a structure which can be accessed from outside. A decryption unit loaded in the memory decrypts an encryption applied to the first information by using a predetermined key. A key supply unit implemented in the secure module supplies the predetermined key to the decryption unit. An authentication unit implemented in the secure module supplies second information to the decryption unit, refers to third information returned in response to the second information, and checks for authenticity of the decryption unit. A key-supply stop unit implemented in the secure module stops supply of the predetermined key by the key supply unit when the authentication unit does not authenticate the decryption unit.
    • 在具有开放架构的信息再现装置中,安全模块存储第一信息,并且具有不允许从外部访问第一信息的结构,并且存储器具有可从外部访问的结构。 加载在存储器中的解密单元通过使用预定密钥解密应用于第一信息的加密。 在安全模块中实现的密钥提供单元将预定密钥提供给解密单元。 在安全模块中实现的认证单元将第二信息提供给解密单元,参考响应于第二信息返回的第三信息,并检查解密单元的真实性。 当认证单元不认证解密单元时,在安全模块中实现的按键供应停止单元停止由密钥提供单元提供预定密钥。
    • 10. 发明授权
    • Method and apparatus for testing terminal connections of semiconductor
integrated circuits
    • 用于测试半导体集成电路端子连接的方法和装置
    • US5621741A
    • 1997-04-15
    • US115138
    • 1993-09-01
    • Kiyoshi Kohiyama
    • Kiyoshi Kohiyama
    • G01R31/02G01R31/04G01R31/28G01R31/30G01R31/3185G06F11/267H01L21/66
    • G06F11/221G01R31/046G01R31/318505G01R31/30
    • A method tests connections between terminal of a first semiconductor integrated circuit and terminals of a second semiconductor integrated circuit. These first and second semiconductor integrated circuits are mounted on a printed circuit board. The first semiconductor integrated circuit has a test data generator for generating test data for the terminal connection test, a selector for selecting outputs of the test data generator during the terminal connection test, and a test data output unit for providing the test data from the selector to the outside. The second semiconductor integrated circuit has a test data fetch-hold unit for fetching and holding the test data provided by the first semiconductor integrated circuit. This method is characterized by verifying whether or not an output of the test data fetch-hold unit represents a predetermined value, to thereby test the terminal connections of the first and second semiconductor integrated circuits and the AC characteristics thereof.
    • 一种方法测试第一半导体集成电路的端子与第二半导体集成电路的端子之间的连接。 这些第一和第二半导体集成电路安装在印刷电路板上。 第一半导体集成电路具有用于生成终端连接测试的测试数据的测试数据发生器,用于在终端连接测试期间选择测试数据生成器的输出的选择器,以及用于从选择器提供测试数据的测试数据输出单元 到外面 第二半导体集成电路具有用于取出并保持由第一半导体集成电路提供的测试数据的测试数据获取保持单元。 该方法的特征在于,验证测试数据取出保持单元的输出是否为预定值,从而测试第一和第二半导体集成电路的端子连接及其AC特性。