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    • 1. 发明授权
    • Method for screening laser diodes
    • 激光二极管筛选方法
    • US4489477A
    • 1984-12-25
    • US582956
    • 1984-02-23
    • Kiu-Chi D. ChikTibor F. DevenyiJohn C. Dyment
    • Kiu-Chi D. ChikTibor F. DevenyiJohn C. Dyment
    • G01R31/26H01S5/00H01S5/40G01R31/36
    • G01R31/2642G01R31/2635H01S5/0014H01S5/0021H01S5/4025
    • A method for screening double heterostructure laser diodes before mounting and packaging is disclosed. At a normal laser diode operating temperature, a range of pulsed current is passed through the laser diode and the lasing threshold current and slope efficiency of the laser diode are monitored. The laser diode is then subjected to a burn-in process in which it is driven at a high junction temperature for an extended time period. Subsequently the lasing threshold current and slope efficiency are again monitored by applying the same range of pulsed current at the normal operating temperature. If either the threshold current or the slope efficiency have changed by more than a predetermined amount, the laser diode is rejected. Otherwise, the laser diode is gauged as likely to have a lifetime greater than a predetermined value at normal operating conditions so warranting further testing prior to installation into a laser package.
    • 公开了在安装和包装之前筛选双异质结激光二极管的方法。 在正常的激光二极管工作温度下,脉冲电流的范围通过激光二极管,并监测激光二极管的激光阈值电流和斜率效率。 然后激光二极管进行老化过程,其中它在高结温下延长时间段。 随后,通过在正常工作温度下施加相同的脉冲电流范围,再次监测激光阈值电流和斜率效率。 如果阈值电流或斜率效率已经改变了超过预定量,则激光二极管被拒绝。 否则,激光二极管在正常操作条件下被测量为可能具有大于预定值的寿命,因此在安装到激光器封装之前需要进一步的测试。