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1. 发明授权

US07589543B2 Probe card having a conductive thin film on the surface of an insulating film behind each of the alignment marks each marks comprises a plurality of second bumps 有权
标题翻译：在每个对准标记之后的绝缘膜的表面上具有导电薄膜的探针卡每个标记包括多个第二凸块
公开(公告)号：US07589543B2
公开(公告)日：2009-09-15
申请号：US11299656
申请日：2005-12-13
申请人： Kenji Yamada , Yoshirou Nakata
发明人： Kenji Yamada , Yoshirou Nakata
IPC分类号： G01R31/02
CPC分类号： G01R31/2891 , G01R1/07314 , G01R1/0735 , G01R3/00 , Y10T29/49117 , Y10T29/49151
摘要： A probe card for a wafer level test of electrical characteristics of a plurality of semiconductor integrated circuit devices formed on a semiconductor wafer. The card has a thin film with bumps on which a plurality of bumps to be respectively brought into contact with all of inspection electrodes of the semiconductor integrated circuit devices are formed, and which is held on a rigid ceramic ring. An alignment mark constituted by a bump formed simultaneously with the bumps for contact is added to the thin film with bumps. The desired position of the alignment mark relative to the bumps for contact is maintained. Therefore, a change in position accuracy of the bumps for contact can be easily measured by an image processor with reference to the alignment mark. An optimum position for contact between the wafer to be inspected and the inspection electrodes on the wafer can be computed from the measurement result.
摘要翻译：一种用于形成在半导体晶片上的多个半导体集成电路器件的电特性的晶片级测试的探针卡。该卡具有带有凸块的薄膜，多个凸起分别与半导体集成电路器件的所有检查电极接触，并且保持在刚性陶瓷环上。由与凸起接触形成的凸起构成的对准标记被加到具有凸块的薄膜上。保持对准标记相对于用于接触的凸块的期望位置。因此，可以通过参照对准标记的图像处理器容易地测量用于接触的凸块的位置精度的变化。可以从测量结果计算要检查的晶片与晶片上的检查电极之间的接触的最佳位置。

2. 发明申请

US20060132155A1 Probe card, method of manufacturing the probe card and alignment method 有权
标题翻译：探针卡，制造探针卡的方法和对准方法
公开(公告)号：US20060132155A1
公开(公告)日：2006-06-22
申请号：US11299656
申请日：2005-12-13
申请人： Kenji Yamada , Yoshirou Nakata
发明人： Kenji Yamada , Yoshirou Nakata
IPC分类号： G01R31/02
CPC分类号： G01R31/2891 , G01R1/07314 , G01R1/0735 , G01R3/00 , Y10T29/49117 , Y10T29/49151
摘要： A probe card for a wafer level test of electrical characteristics of a plurality of semiconductor integrated circuit devices formed on a semiconductor wafer. The card has a thin film with bumps on which a plurality of bumps to be respectively brought into contact with all of inspection electrodes of the semiconductor integrated circuit devices are formed, and which is held on a rigid ceramic ring. An alignment mark constituted by a bump formed simultaneously with the bumps for contact is added to the thin film with bumps. The desired position of the alignment mark relative to the bumps for contact is maintained. Therefore, a change in position accuracy of the bumps for contact can be easily measured by an image processor with reference to the alignment mark. An optimum position for contact between the wafer to be inspected and the inspection electrodes on the wafer can be computed from the measurement result.
摘要翻译：一种用于形成在半导体晶片上的多个半导体集成电路器件的电特性的晶片级测试的探针卡。该卡具有带有凸块的薄膜，多个凸起分别与半导体集成电路器件的所有检查电极接触，并且保持在刚性陶瓷环上。由与凸起接触形成的凸起构成的对准标记被加到具有凸块的薄膜上。保持对准标记相对于用于接触的凸块的期望位置。因此，可以通过参照对准标记的图像处理器容易地测量用于接触的凸块的位置精度的变化。可以从测量结果计算要检查的晶片与晶片上的检查电极之间的接触的最佳位置。

3. 发明申请

US20090183363A1 PROBE CARD, METHOD OF MANUFACTURING THE PROBE CARD AND ALIGNMENT METHOD 有权
标题翻译：探针卡，制造探针卡和对准方法
公开(公告)号：US20090183363A1
公开(公告)日：2009-07-23
申请号：US12412102
申请日：2009-03-26
申请人： Kenji Yamada , Yoshirou Nakata
发明人： Kenji Yamada , Yoshirou Nakata
IPC分类号： H01R43/00
CPC分类号： G01R31/2891 , G01R1/07314 , G01R1/0735 , G01R3/00 , Y10T29/49117 , Y10T29/49151
摘要： A probe card for a wafer level test of electrical characteristics of a plurality of semiconductor integrated circuit devices formed on a semiconductor wafer. The card has a thin film with bumps on which a plurality of bumps to be respectively brought into contact with all of inspection electrodes of the semiconductor integrated circuit devices are formed, and which is held on a rigid ceramic ring. An alignment mark constituted by a bump formed simultaneously with the bumps for contact is added to the thin film with bumps. The desired position of the alignment mark relative to the bumps for contact is maintained. Therefore, a change in position accuracy of the bumps for contact can be easily measured by an image processor with reference to the alignment mark. An optimum position for contact between the wafer to be inspected and the inspection electrodes on the wafer can be computed from the measurement result.
摘要翻译：一种用于形成在半导体晶片上的多个半导体集成电路器件的电特性的晶片级测试的探针卡。该卡具有带有凸块的薄膜，多个凸起分别与半导体集成电路器件的所有检查电极接触，并且保持在刚性陶瓷环上。由与凸起接触形成的凸起构成的对准标记被加到具有凸块的薄膜上。保持对准标记相对于用于接触的凸块的期望位置。因此，可以通过参照对准标记的图像处理器容易地测量接触用凸块的位置精度的变化。可以从测量结果计算要检查的晶片与晶片上的检查电极之间的接触的最佳位置。

4. 发明授权

US07982482B2 Probe card, method of manufacturing the probe card and alignment method 有权
标题翻译：探针卡，制造探针卡的方法和对准方法
公开(公告)号：US07982482B2
公开(公告)日：2011-07-19
申请号：US12412102
申请日：2009-03-26
申请人： Kenji Yamada , Yoshirou Nakata
发明人： Kenji Yamada , Yoshirou Nakata
IPC分类号： G01R31/00
CPC分类号： G01R31/2891 , G01R1/07314 , G01R1/0735 , G01R3/00 , Y10T29/49117 , Y10T29/49151
摘要： A probe card for a wafer level test of electrical characteristics of a plurality of semiconductor integrated circuit devices formed on a semiconductor wafer. The card has a thin film with bumps on which a plurality of bumps to be respectively brought into contact with all of inspection electrodes of the semiconductor integrated circuit devices are formed, and which is held on a rigid ceramic ring. An alignment mark constituted by a bump formed simultaneously with the bumps for contact is added to the thin film with bumps. The desired position of the alignment mark relative to the bumps for contact is maintained. Therefore, a change in position accuracy of the bumps for contact can be easily measured by an image processor with reference to the alignment mark. An optimum position for contact between the wafer to be inspected and the inspection electrodes on the wafer can be computed from the measurement result.
摘要翻译：一种用于形成在半导体晶片上的多个半导体集成电路器件的电特性的晶片级测试的探针卡。该卡具有带有凸块的薄膜，多个凸起分别与半导体集成电路器件的所有检查电极接触，并且保持在刚性陶瓷环上。由与凸起接触形成的凸起构成的对准标记被加到具有凸块的薄膜上。保持对准标记相对于用于接触的凸块的期望位置。因此，可以通过参照对准标记的图像处理器容易地测量用于接触的凸块的位置精度的变化。可以从测量结果计算要检查的晶片与晶片上的检查电极之间的接触的最佳位置。

5. 发明授权

US09302668B2 Control device for vehicle 有权
标题翻译：车辆控制装置
公开(公告)号：US09302668B2
公开(公告)日：2016-04-05
申请号：US14390843
申请日：2012-04-11
申请人： Hichirosai Oyobe , Kenji Yamada
发明人： Hichirosai Oyobe , Kenji Yamada
IPC分类号： B60W20/00 , B60K6/445 , B60W10/08
CPC分类号： B60W20/00 , B60K6/445 , B60W10/08 , B60W20/50 , B60W30/18054 , B60W2050/0215 , B60W2520/04 , B60Y2400/301 , Y02T10/6239
摘要： A control device of the invention is applied for a hybrid vehicle comprising an internal combustion engine, a motor and a rotational position detector to detect a rotational position of a rotary shaft of the motor. The control device performs a procedure for obtaining an offset amount according to a request for obtaining the offset amount, which offset amount is a difference between a detected rotational position of the rotary shaft with the rotational position detector and an actual rotational position of the rotary shaft. The control device is configured to perform the procedure for obtaining the offset amount while the engine is running, when the vehicle stops and the control device determines that there is the request for obtaining the offset amount.
摘要翻译：本发明的控制装置适用于包括内燃机，电动机和旋转位置检测器的混合动力车辆，以检测电动机的旋转轴的旋转位置。控制装置执行用于根据获得偏移量的请求获得偏移量的过程，该偏移量是旋转轴与旋转位置检测器的检测旋转位置与旋转轴的实际旋转位置之间的差。控制装置被构造成在发动机运行时，当车辆停止并且控制装置确定存在获得偏移量的请求时，执行获得偏移量的过程。

6. 发明授权

US09262114B2 Information apparatus and information processing system 有权
标题翻译：信息设备和信息处理系统
公开(公告)号：US09262114B2
公开(公告)日：2016-02-16
申请号：US14140628
申请日：2013-12-26
申请人： Kei Nakabayashi , Kenji Yamada
发明人： Kei Nakabayashi , Kenji Yamada
IPC分类号： G06F15/00 , G06F3/12 , H04N1/00
CPC分类号： G06F3/1288 , G06F3/1212 , G06F3/126 , G06F3/1291 , H04N1/00344 , H04N2201/0072 , H04N2201/0094
摘要： An information apparatus includes an apparatus information obtaining unit that obtains apparatus information from a plurality of apparatuses connected via a network to the information apparatus, an apparatus selection unit that selects a target apparatus from the plurality of apparatuses based on the obtained apparatus information, and a process result obtaining unit that sends a request to the target apparatus to request the target apparatus to perform a process corresponding to the request, and obtains a result of the performed process from the target apparatus.
摘要翻译：一种信息装置，包括：装置信息获取单元，其从通过网络连接的多个装置获取装置信息到信息装置;装置选择单元，基于获得的装置信息从多个装置中选择目标装置;以及处理结果获取单元，其向目标设备发送请求以请求目标设备执行与该请求对应的处理，并且从目标设备获得所执行的处理的结果。

7. 发明申请

US20150151639A1 CONTROL DEVICE FOR VEHICLE 有权
标题翻译：车辆控制装置
公开(公告)号：US20150151639A1
公开(公告)日：2015-06-04
申请号：US14382502
申请日：2012-03-22
申请人： Hichirosai Oyobe , Kenji Yamada
发明人： Hichirosai Oyobe , Kenji Yamada
IPC分类号： B60L11/18
CPC分类号： B60L11/18 , B60L3/0061 , B60L3/12 , B60L11/126 , B60L11/14 , B60L11/1868 , B60L2210/10 , B60L2210/40 , B60L2220/14 , B60L2240/12 , B60L2240/421 , B60L2240/423 , B60L2240/441 , B60L2240/445 , B60L2250/12 , B60L2250/26 , B60W10/08 , B60W10/26 , H02P6/16 , Y02T10/6217 , Y02T10/642 , Y02T10/7005 , Y02T10/7066 , Y02T10/7077 , Y02T10/7216 , Y02T10/7241
摘要： A control device is applied to a vehicle having a motor with a rotary shaft connected to a drive shaft of the vehicle, a rotational position detector to detect a rotational position of the rotary shaft of the motor, and a battery. The control device performs a procedure for obtaining an offset amount in response to a request for obtaining the offset amount, store the obtained offset amount, and keep the stored offset amount without relying on electric power supplied from the battery, which offset amount is a difference between a detected rotational position of the rotary shaft with the rotational position detector and an actual rotational position of the rotary shaft. The control device is configured to find an occurrence of the request for obtaining the offset amount when battery is dismounted from the vehicle.
摘要翻译：控制装置被应用于具有连接到车辆的驱动轴的旋转轴的电动机的车辆，用于检测电动机的旋转轴的旋转位置的旋转位置检测器和电池。控制装置执行用于响应于获得偏移量的请求获得偏移量的过程，存储所获得的偏移量，并且保持所存储的偏移量而不依赖于从电池提供的电力，该偏移量是差值在旋转轴与旋转位置检测器的检测旋转位置与旋转轴的实际旋转位置之间。控制装置被配置为在从车辆卸下电池时发现用于获得偏移量的请求的发生。

8. 发明授权

US08859411B2 Method for producing transistor 有权
标题翻译：晶体管的制造方法
公开(公告)号：US08859411B2
公开(公告)日：2014-10-14
申请号：US13817699
申请日：2011-07-26
申请人： Kenji Shimada , Hiroshi Matsunaga , Kojiro Abe , Kenji Yamada
发明人： Kenji Shimada , Hiroshi Matsunaga , Kojiro Abe , Kenji Yamada
IPC分类号： H01L29/76 , H01L21/28 , C09K13/08 , H01L21/8238 , H01L21/02 , H01L21/8234 , H01L29/66 , H01L21/311 , H01L29/40 , H01L21/3213 , C09K13/06
CPC分类号： H01L29/401 , C09K13/06 , C09K13/08 , H01L21/02068 , H01L21/28079 , H01L21/31111 , H01L21/32134 , H01L21/82345 , H01L21/823842 , H01L29/66545
摘要： According to the present invention, there is provided a process for producing a transistor having a high precision and a high quality with a high yield by selectively etching a natural silicon oxide film, and further by selectively etching a dummy gate made of silicon. The present invention relates to a process for producing a transistor using a structural body which includes a substrate, and a dummy gate laminate formed by laminating at least a high dielectric material film and a dummy gate made of silicon having a natural silicon oxide film on a surface thereof, a side wall disposed to cover a side surface of the laminate and an interlayer insulating film disposed to cover the side wall which are provided on the substrate, said process including an etching step using a specific etching solution and thereby replacing the dummy gate with an aluminum metal gate.
摘要翻译：根据本发明，通过选择性地蚀刻天然氧化硅膜，并且进一步通过选择性地蚀刻由硅制成的虚拟栅极，提供了以高产率制造具有高精度和高质量的晶体管的方法。本发明涉及一种使用包括基板的结构体制造晶体管的方法，以及通过将至少具有高介电材料膜和由硅制成的具有天然氧化硅膜的虚拟栅极层叠在一起而形成的虚拟栅极叠层表面，设置成覆盖层压体的侧表面的侧壁和设置成覆盖设置在基板上的侧壁的层间绝缘膜，所述工艺包括使用特定蚀刻溶液的蚀刻步骤，从而替换伪栅极与铝金属门。

9. 发明申请

US20140204780A1 WIRELESS DEVICE, ROUTER, WIRELESS SYSTEM, AND METHOD FOR HIGH-SPEED OPTIMIZATION OF WIRELESS TRANSMISSION 审中-公开
标题翻译：无线设备，路由器，无线系统和用于无线传输的高速优化的方法
公开(公告)号：US20140204780A1
公开(公告)日：2014-07-24
申请号：US14117299
申请日：2012-05-11
申请人： Kenji Yamada , Genichirou Sekine
发明人： Kenji Yamada , Genichirou Sekine
IPC分类号： H04W24/08
CPC分类号： H04W24/08 , H04L47/266 , H04W28/02 , H04W28/14
摘要： A wireless transmission path monitoring unit of a wireless device monitors the state of a wireless transmission path, transmits a PAUSE command stipulated in a MAC control protocol to a router, and performs a band limitation for the router regardless of a margin of a buffer when the state of the wireless transmission path has changed. In this way, it is possible to shorten the processing time until the band limitation is applied to the router after the state of the wireless transmission path changes, and to suppress transmission delay due to retransmission of transmission data.
摘要翻译：无线设备的无线传输路径监视单元监视无线传输路径的状态，向路由器发送MAC控制协议中规定的暂停命令，并且对于路由器执行频带限制，而不管缓冲区的边缘如何无线传输路径的状态已经改变。以这种方式，可以缩短在无线传输路径的状态改变之后对路由器应用频带限制的处理时间，并且抑制由于重传传输数据而造成的传输延迟。

10. 发明授权

US08536810B2 Control device and control method for alternating-current motor 有权
标题翻译：交流电机控制装置及控制方法
公开(公告)号：US08536810B2
公开(公告)日：2013-09-17
申请号：US13055610
申请日：2009-07-08
申请人： Kenji Yamada
发明人： Kenji Yamada
IPC分类号： H02P6/08
CPC分类号： H02P27/04
摘要： When performing PWM control in accordance with an overmodulation mode, an ECU variably sets a switching determination value, which is used for determination of switching control modes between the overmodulation mode and a sinusoidal wave modulation mode, based on a switching state of an inverter at present. Then, the ECU compares the degree of modulation, which is calculated from voltage command values, with the switching determination value so as to determine whether to switch to the sinusoidal wave modulation mode or to maintain the overmodulation mode. In particular, when an influence of a dead time is likely to cause generation of a voltage command that requires switching to the overmodulation mode just after switching to the sinusoidal wave modulation mode, the switching determination value is variably set to prevent the transition from the overmodulation mode to the sinusoidal wave modulation mode. This prevents chattering in which the control modes are frequently switched therebetween.
摘要翻译：当根据过调制模式执行PWM控制时，ECU基于目前的逆变器的开关状态可变地设置用于确定过调制模式和正弦波调制模式之间的开关控制模式的开关判定值。然后，ECU将根据电压指令值计算的调制度与切换判定值进行比较，以便确定是切换到正弦波调制模式还是维持过调制模式。特别地，当切换到正弦波调制模式之后，当死区时间的影响可能导致产生需要切换到过调制模式的电压指令时，切换判定值被可变地设置以防止过调制模式到正弦波调制模式。这防止其间经常切换控制模式的抖动。

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