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    • 3. 发明授权
    • Structural analysis method employing finite element method
    • 采用有限元法的结构分析方法
    • US07730444B2
    • 2010-06-01
    • US11259272
    • 2005-10-27
    • Nobutaka ItohTetsuyuki KubotaMami NakadateAkira Tamura
    • Nobutaka ItohTetsuyuki KubotaMami NakadateAkira Tamura
    • G06F17/50H03K17/693
    • G06F17/5018G06F2217/16H05K1/0201H05K1/0271H05K1/0298H05K3/0005H05K3/4626H05K2203/162
    • A structural analysis method that saves analysis time without lowering the prediction accuracy is provided. The structural analysis method has dividing up the analysis target into a plurality of finite elements; defining a plurality of meshes that divide up the analysis target into units larger than the finite elements and calculating, for each mesh, the proportion of one material among the plurality of materials that occupy the finite element contained in the mesh; specifying a mesh in which the calculated proportion of the one material exceeds a predetermined threshold value and generating mesh data by substituting material information specifying materials other than the one material with material information of the materials of the finite elements contained in the specified mesh; and calculating the physical amount yielded in the analysis target on the basis of the generated mesh data.
    • 提供了一种节省分析时间而不降低预测精度的结构分析方法。 结构分析方法将分析目标划分为多个有限元; 定义将分析目标分成大于有限元的单位的多个网格,并且针对每个网格计算占据网格中包含的有限元素的多个材料中的一种材料的比例; 指定所述一种材料的计算比例超过预定阈值的网格,并且通过用指定包含在所述特定网格中的所述有限元素的材料的材料信息替换指定不同于所述一种材料的材料的材料信息来生成网格数据; 以及基于生成的网格数据计算分析对象中产生的物理量。
    • 8. 发明申请
    • Magnetic head and storage medium drive
    • 磁头和存储介质驱动
    • US20080055774A1
    • 2008-03-06
    • US11637910
    • 2006-12-13
    • Tetsuyuki Kubota
    • Tetsuyuki Kubota
    • G11B5/127
    • G11B5/10G11B5/11G11B5/3106G11B5/3912G11B5/3967
    • A read element is located between lower and upper shielding layers. The read element is connected separately to the lower and upper shielding layers. A first insulating layer and a second insulating layer are located between the lower shielding layer and the slider body. The first insulating layer has a first relative permittivity. The second insulating layer has a second relative permittivity larger than the first relative permittivity. Adjustment of the relative permittivities and/or the thicknesses of the first and second insulating layers allows a change in the relative permittivity of the insulating layer between the lower shielding layer and the slider body. This results in a change in the capacitance between the lower shielding layer and the slider body. The first and second insulating layers of the type contribute to an accurate readout of magnetic bit data irrespective of noise generated on the slider body.
    • 读取元件位于下屏蔽层和上屏蔽层之间。 读取元件分别连接到下屏蔽层和上屏蔽层。 第一绝缘层和第二绝缘层位于下屏蔽层和滑块体之间。 第一绝缘层具有第一相对介电常数。 第二绝缘层具有大于第一相对介电常数的第二相对介电常数。 第一绝缘层和第二绝缘层的相对介电常数和/或厚度的调整允许下屏蔽层和滑块体之间的绝缘层的相对介电常数的变化。 这导致下屏蔽层和滑块体之间的电容的变化。 该类型的第一和第二绝缘层有助于精确读出磁位数据,而与滑块体上产生的噪声无关。