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    • 9. 发明授权
    • Electron beam column using high numerical aperture photocathode source illumination
    • 电子束柱采用高数值孔径光电阴极源照明
    • US06448568B1
    • 2002-09-10
    • US09365604
    • 1999-07-30
    • Paul C. AllenXiaolan ChenDouglas E. HolmgrenSamuel C. Howells
    • Paul C. AllenXiaolan ChenDouglas E. HolmgrenSamuel C. Howells
    • H01J4006
    • B82Y10/00G03F7/70325G03F7/70375G03F7/70808H01J37/073H01J2237/3175
    • A lithography apparatus including both a laser beam source and an electron beam column, where the electron beam column has a support(in one embodiment a window in the column housing) having an index of refraction n. The support, having a photocathode source material disposed on its remote surface, is located in some embodiments such that the internal angle of the incident laser beam is &thgr; with respect to a line perpendicular to the remote surface. The numerical aperture of the substrate(equal to nsin &thgr;) is greater than one in one embodiment, resulting in a high resolution spot size diameter incident on the photocathode source material at the remote surface. Incident energy from the laser beam thereby emits a corresponding high resolution electron beam from the photocathode source material. Electromagnetic lens components are disposed downstream in the electron beam column to demagnify the electron beam. This apparatus allows the continuously decreasing minimum feature dimension sizes for semiconductor electron beam lithography.
    • 包括激光束源和电子束列的光刻设备,其中电子束柱具有折射率n的支撑(在一个实施例中为柱壳体中的窗口)。 具有设置在其远程表面上的光电阴极源材料的支撑件位于一些实施例中,使得入射激光束的内角相对于垂直于远程表面的线是θ。 在一个实施例中,衬底的数值孔径(等于nsinθ)大于一个,导致入射到远端表面的光电阴极源材料上的高分辨率光斑尺寸直径。 因此来自激光束的入射能量由此从光电阴极源材料发射出相应的高分辨率电子束。 电磁透镜部件设置在电子束列的下游,以使电子束缩小。 该装置允许连续减小用于半导体电子束光刻的最小特征尺寸尺寸。