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    • 1. 发明申请
    • METHOD AND EQUIPMENT FOR PRODUCING SAPPHIRE SINGLE CRYSTAL
    • 用于生产SAPPHIRE单晶的方法和设备
    • US20110017124A1
    • 2011-01-27
    • US12837201
    • 2010-07-15
    • Keigo HOSHIKAWAChihiro MiyagawaTaichi Nakamura
    • Keigo HOSHIKAWAChihiro MiyagawaTaichi Nakamura
    • C30B11/02C30B15/14
    • C30B29/20C30B11/002Y10T117/1024
    • The method is capable of producing a sapphire single crystal without forming cracks and without using an expensive crucible. The method comprises the steps of: putting a seed crystal and a raw material in a crucible; setting the crucible in a cylindrical heater; heating the crucible; and producing temperature gradient in the cylindrical heater so as to sequentially crystallize a melt. The crucible is composed of a material having a specific linear expansion coefficient which is capable of preventing mutual stress, which is caused by a difference between a linear expansion coefficient of the crucible and that of the sapphire single crystal in a direction perpendicular to a growth axis thereof, from generating in the crucible and the sapphire single crystal, or which is capable of preventing deformation of the crucible without generating a crystal defect caused by the mutual stress in the sapphire single crystal.
    • 该方法能够生产蓝宝石单晶而不形成裂纹,而不使用昂贵的坩埚。 该方法包括以下步骤:将晶种和原料放入坩埚中; 将坩埚放置在圆柱形加热器中; 加热坩埚; 并在圆筒形加热器中产生温度梯度,以使熔体顺序结晶。 坩埚由具有特定的线性膨胀系数的材料构成,该材料能够防止由坩埚的线性膨胀系数与蓝宝石单晶垂直于成长轴的方向的线膨胀系数之间的差异引起的相互应力 在坩埚和蓝宝石单晶中产生,或者能够防止坩埚变形而不产生由蓝宝石单晶中的相互应力引起的晶体缺陷。
    • 3. 发明授权
    • Flatness measuring equipment
    • 平整度测量设备
    • US06497047B1
    • 2002-12-24
    • US09517836
    • 2000-03-02
    • Chihiro MiyagawaYoshio Nakamura
    • Chihiro MiyagawaYoshio Nakamura
    • G01B525
    • G01B11/306
    • The flatness measuring equipment can highly precisely measure flatness of a surface of a large-sized planar member, e.g., an abrasive plate. In the equipment, an elongated member is provided above and parallel to the surface of the planar member to be measured. A movable member is provided to the elongated member and capable of moving along the elongated member. A distance sensor, which is provided to the movable member, measures distance between the movable member and the surface of the planar member. A laser beam source emits a laser beam, at a fixed level, toward the movable member. A light receiving sensor detects a variation of a level of the movable member with respect of the fixed level of the laser beam.
    • 平坦度测量设备可以高度精确地测量大尺寸平面构件(例如研磨板)的表面的平整度。 在设备中,细长构件设置在待测量的平面构件的表面上方并平行。 可动构件设置在细长构件上并且能够沿着细长构件移动。 设置在可动构件上的距离传感器测量可动构件与平面构件表面之间的距离。 激光束源朝向可移动部件发射固定水平的激光束。 光接收传感器检测可动构件相对于激光束的固定水平的水平的变化。