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    • 3. 发明申请
    • Differential Measurement Probe Having a Ground Clip System for the Probing Tips
    • 差分测量探头具有用于探测技巧的地面剪辑系统
    • US20080309356A1
    • 2008-12-18
    • US12196226
    • 2008-08-21
    • Kei-Wean C. YangMark W. NightingalePaul G. Chastain
    • Kei-Wean C. YangMark W. NightingalePaul G. Chastain
    • G01R1/067
    • G01R1/06788G01R1/06772
    • A differential measurement probe has a ground clip system for electrically coupling outer shielding conductors of differential probing tips together. In one embodiment, the probing tips independently move vertically relative to each other with the ground clip system secured to each of the outer shielding conductors of the probing tips. In a further embodiment, the probing tips move both vertically and horizontally and the ground clip system has a spring wire member that is secured to the probe. The spring wire member is formed with various sections having various angles to each other that allows one section to slidably engage one of the outer shielding conductors on one of the probing tips and another section to slidably engage the outer shielding conductor of the other probing tip.
    • 差分测量探头具有接地夹系统,用于将差分探针的外部屏蔽导体电耦合在一起。 在一个实施例中,探测尖端独立地相对于彼此移动,而接地夹系统固定到探测尖端的每个外屏蔽导体。 在另一个实施例中,探测尖端垂直和水平地移动,并且接地夹系统具有固定到探针的弹簧线构件。 弹簧线构件形成为具有彼此具有各种角度的各种部分,其允许一个部分在一个探测尖端和另一个部分上滑动地接合外部屏蔽导体中的一个,以可滑动地接合另一个探测尖端的外部屏蔽导体。
    • 5. 发明授权
    • Probe tip adapter for a measurement probe
    • 用于测量探头的探头尖端适配器
    • US06400167B1
    • 2002-06-04
    • US09668753
    • 2000-09-22
    • Marc A. GessfordMark W. NightingaleGary W. Reed
    • Marc A. GessfordMark W. NightingaleGary W. Reed
    • G01R3102
    • G01R1/06788G01R1/0416G01R1/06705G01R1/06738
    • A probe tip adapter for a measurement probe has at least a first electrically conductive element with a bore at one end and a probing contact formed on the other end. The bore of the electrically conductive element has an electrically conductive elastomer disposed therein having sufficient tensile strength, compression set, hardness, deflection force, elongation and percent recovery for repeatably securing the electrically conductive element to the probing tip of the measurement probe. An element holder is positionable on the measurement probe and has a cavity formed in one end for receiving the measurement probe. At least a first bore is formed in the other end of the element holder extending to the cavity and aligned with the probing tip of the measurement probe. The electrically conductive element is positioned in the holder bore such that the probing tip penetrates the elastomer and the probing contact extends from the holder. The probing contact may be configured as a probing tip having a shaft that tapers at one end to a point and as a square pin adapter with a bore formed in the electrically conductive element that receives a spring contact. The probe tip adapter is useable with both single ended and differential measurement probes.
    • 用于测量探头的探针尖端适配器具有至少第一导电元件,其一端具有孔,另一端形成探测触点。 导电元件的孔具有设置在其中的导电弹性体,其具有足够的拉伸强度,压缩永久变形,硬度,偏转力,伸长率和百分比恢复,用于将导电元件重复地固定到测量探针的探测尖端。 元件保持器可定位在测量探针上,并且在一端形成有用于接收测量探针的空腔。 至少第一孔形成在元件保持器的另一端延伸到空腔并与测量探针的探测尖端对准。 导电元件定位在保持器孔中,使得探针尖端穿透弹性体,并且探测接触件从保持器延伸。 探测触点可以被配置为具有在一端到一点渐缩的轴的探针尖端,以及具有形成在导电元件中形成的接收弹簧触点的孔的方形销适配器。 探头尖适配器可用于单端和差分测量探头。
    • 6. 发明授权
    • Positioning aid for a hand-held electrical test probe
    • 定位辅助手持式电气测试探头
    • US5387872A
    • 1995-02-07
    • US86698
    • 1993-07-02
    • Mark W. Nightingale
    • Mark W. Nightingale
    • G01R1/06G01R1/067G01R1/04
    • G01R1/06738G01R1/06788
    • An apparatus for directly positioning a hand-held electrical test probe onto leads of a surface mounted integrated circuit, IC, device has a housing with a central bore therethrough for receiving the probing tip of the test probe, which is coupled to compensation circuitry in the probing head. One end of the housing which is normal to the central bore has at least four teeth extending therefrom defining slots for engaging the leads of the IC. The central bore is exposed in the central slot of the housing for exposing the probing tip therein for providing an electrical connection between one of the leads on the IC and the electrical circuitry of the probing head.
    • 用于将手持电测试探针直接定位在表面安装集成电路IC器件的引线上的装置具有壳体,其具有穿过其中的中心孔,用于接收测试探针的探测尖端,其耦合到测试探针中的补偿电路 探头。 壳体的与中心孔垂直的一端具有从其延伸的至少四个齿限定用于接合IC的引线的槽。 中心孔暴露在壳体的中心狭槽中,用于暴露其中的探测尖端,以提供IC上的引线之一和探测头的电路之间的电连接。
    • 7. 发明授权
    • Variable spacing probe tip adapter for a measurement probe
    • 用于测量探头的可变间距探头尖端适配器
    • US06404215B1
    • 2002-06-11
    • US09715375
    • 2000-11-16
    • Mark W. NightingaleR. Kenneth PriceWilliam Q. Law
    • Mark W. NightingaleR. Kenneth PriceWilliam Q. Law
    • G01R3102
    • G01R1/07364
    • A variable spacing probe tip adapter for a differential measurement probe has a measurement probe head with first and second probe tips extending from the probe head. Ribs and grooves formed in the probe head that extend radially from around each of the probe tips. Each of first and second first probing tips have an electrically conductive shaft that has a bore formed in one end for engaging the probe tips of the measurement probe. Each shaft has ribs and grooves formed therein that extend radially from the bore for engaging the corresponding grooves and ribs in the probe head. The other end of the conductive shaft tapers to a probing point with and a portion of the shaft toward the tapered end of the shaft being angled such that the probing tips. The conductive shafts are rotatable on measurement probe tips and locked into position by the engagement of the ribs and grooves in the probe head and the probing tips.
    • 用于差分测量探头的可变间距探针尖​​端适配器具有测量探针头,其具有从探头延伸的第一和第二探针尖端。 形成在探针头中的肋和凹槽,其围绕每个探针尖端径向延伸。 第一和第二第一探测尖端中的每一个具有导电轴,其具有在一端形成的孔,用于接合测量探针的探针尖端。 每个轴具有形成在其中的肋和槽,其从孔径向延伸,用于接合探针头中的相应凹槽和肋。 导电轴的另一端对于探测点而变浅,并且轴的朝向轴的锥形端部的一部分成角度,使得探测尖端。 导电轴可以在测量探针尖端上旋转,并通过探针头和探测尖端中的肋和凹槽的接合而锁定到位。