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    • 3. 发明授权
    • Key for musical instrument
    • 乐器钥匙
    • US06693235B2
    • 2004-02-17
    • US10261603
    • 2002-10-02
    • Kenichi Ookubo
    • Kenichi Ookubo
    • G10C312
    • G10C3/12
    • A key for a musical instrument is provided for effectively giving a touch load to the key, while employing an alternative material having a specific gravity equal to or larger than a predetermined value, instead of lead, as a material for the weight, simplifying works involved in fixing the weight in a key body, and reducing the frequency of troubles such as cracking of the key body, thereby reducing the manufacturing cost. The key comprises a swingable key body formed with an embedding hole which extends through a front plate in the vertical direction to reach the key body, and a weight made of an alternative material other than lead. The weight has a smooth portion and a knurled portion on the outer peripheral surface thereof. The weight is press-fitted into the embedding hole from the smooth portion and thereby fixed in the key body.
    • 提供一种用于乐器的钥匙,用于有效地给钥匙提供触摸负载,同时使用具有等于或大于预定值的比重的替代材料代替铅,作为重量的材料,简化工程 在将重量固定在钥匙体中,并且减少诸如钥匙体的开裂的麻烦的频率,从而降低制造成本。 该钥匙包括形成有嵌入孔的可摆动键体,该嵌入孔在垂直方向上延伸穿过前板,以到达键体,以及由除铅以外的替代材料制成的重量。 该重量在其外周面上具有平滑部分和滚花部分。 重量从平滑部分压入嵌入孔中,从而固定在钥匙体内。
    • 4. 发明授权
    • Semiconductor device and method of fabricating same
    • 半导体装置及其制造方法
    • US07009259B2
    • 2006-03-07
    • US11100440
    • 2005-04-07
    • Kenichi OokuboHideki MoriShigeru Kanematsu
    • Kenichi OokuboHideki MoriShigeru Kanematsu
    • H01L31/119
    • H01L27/0623H01L21/8249H01L27/0922
    • A semiconductor device (100) according to the present invention comprises a vertical PNP bipolar transistor (20), an NMOS transistor (50) and a PMOS transistor (60) that are of high dielectric strength, and a P-type semiconductor substrate 1, as shown in FIG. 2. A substrate isolation layer (21) of the PNP bipolar transistor (20), a drain buried layer (51) of the NMOS transistor (50), and a back gate buried layer (61) of the PMOS transistor (60) are formed simultaneously by selectively implanting N-type impurities, such as phosphorous, in the semiconductor substrate (1). This invention greatly contributes to curtailing the processes of fabricating BiCMOS ICs and the like including vertical bipolar transistors with easily controllable performance characteristics, such as a current amplification factor, and MOS transistors with high dielectric strength and makes even more miniaturization of such ICs achievable.
    • 根据本发明的半导体器件(100)包括具有高介电强度的垂直PNP双极晶体管(20),NMOS晶体管(50)和PMOS晶体管(60),以及P型半导体衬底1, 如图所示。 2 。 同时形成PNP双极晶体管(20)的衬底隔离层(21),NMOS晶体管(50)的漏埋层(51)和PMOS晶体管(60)的背栅掩埋层(61) 通过在半导体衬底(1)中选择性地注入诸如磷的N型杂质。 本发明大大有助于减少制造BiCMOS IC等的工艺,其中包括具有容易控制的性能特征的垂直双极晶体管,例如电流放大因子,以及具有高介电强度的MOS晶体管,并且使得这种IC的更小型化成为可能。
    • 5. 发明申请
    • Semiconductor device and method of fabricating same
    • 半导体装置及其制造方法
    • US20050230762A1
    • 2005-10-20
    • US11100590
    • 2005-04-07
    • Kenichi OokuboHideki MoriShigeru Kanematsu
    • Kenichi OokuboHideki MoriShigeru Kanematsu
    • H01L21/8222H01L21/8228H01L21/8248H01L21/8249H01L27/06H01L27/082H01L27/092H01L31/119
    • H01L27/0623H01L21/8249H01L27/0922
    • A semiconductor device (100) according to the present invention comprises a vertical PNP bipolar transistor (20), an NMOS transistor (50) and a PMOS transistor (60) that are of high dielectric strength, and a P-type semiconductor substrate 1, as shown in FIG. 2. A substrate isolation layer (21) of the PNP bipolar transistor (20), a drain buried layer (51) of the NMOS transistor (50), and a back gate buried layer (61) of the PMOS transistor (60) are formed simultaneously by selectively implanting N-type impurities, such as phosphorous, in the semiconductor substrate (1). This invention greatly contributes to curtailing the processes of fabricating BiCMOS ICs and the like including vertical bipolar transistors with easily controllable performance characteristics, such as a current amplification factor, and MOS transistors with high dielectric strength and makes even more miniaturization of such ICs achievable.
    • 根据本发明的半导体器件(100)包括具有高介电强度的垂直PNP双极晶体管(20),NMOS晶体管(50)和PMOS晶体管(60),以及P型半导体衬底1, 如图1所示。 2。 同时形成PNP双极晶体管(20)的衬底隔离层(21),NMOS晶体管(50)的漏埋层(51)和PMOS晶体管(60)的背栅掩埋层(61) 通过在半导体衬底(1)中选择性地注入诸如磷的N型杂质。 本发明大大有助于减少制造BiCMOS IC等的工艺,其中包括具有容易控制的性能特征的垂直双极晶体管,例如电流放大因子,以及具有高介电强度的MOS晶体管,并且使得这种IC的更小型化成为可能。
    • 6. 发明授权
    • Semiconductor device and its manufacturing method
    • 半导体器件及其制造方法
    • US06903424B2
    • 2005-06-07
    • US10474125
    • 2003-02-03
    • Kenichi OokuboHideki MoriShigeru Kanematsu
    • Kenichi OokuboHideki MoriShigeru Kanematsu
    • H01L21/8222H01L21/8228H01L21/8248H01L21/8249H01L27/06H01L27/082H01L27/092H01L31/119
    • H01L27/0623H01L21/8249H01L27/0922
    • A semiconductor device (100) according to the present invention comprises a vertical PNP bipolar transistor (20), an NMOS transistor (50) and a PMOS transistor (60) that are of high dielectric strength, and a P-type semiconductor substrate 1, as shown in FIG. 2. A substrate isolation layer (21) of the PNP bipolar transistor (20), a drain buried layer (51) of the NMOS transistor (50), and a back gate buried layer (61) of the PMOS transistor (60) are formed simultaneously by selectively implanting N-type impurities, such as phosphorous, in the semiconductor substrate (1). This invention greatly contributes to curtailing the processes of fabricating BiCMOS ICs and the like including vertical bipolar transistors with easily controllable performance characteristics, such as a current amplification factor, and MOS transistors with high dielectric strength and makes even more miniaturization of such ICs achievable.
    • 根据本发明的半导体器件(100)包括具有高介电强度的垂直PNP双极晶体管(20),NMOS晶体管(50)和PMOS晶体管(60),以及P型半导体衬底1, 如图1所示。 2。 同时形成PNP双极晶体管(20)的衬底隔离层(21),NMOS晶体管(50)的漏埋层(51)和PMOS晶体管(60)的背栅掩埋层(61) 通过在半导体衬底(1)中选择性地注入诸如磷的N型杂质。 本发明大大有助于减少制造BiCMOS IC等的工艺,其中包括具有容易控制的性能特征的垂直双极晶体管,例如电流放大因子,以及具有高介电强度的MOS晶体管,并且使得这种IC的更小型化成为可能。
    • 7. 发明授权
    • Semiconductor device and method of fabricating same
    • 半导体装置及其制造方法
    • US07015551B2
    • 2006-03-21
    • US11100590
    • 2005-04-07
    • Kenichi OokuboHideki MoriShigeru Kanematsu
    • Kenichi OokuboHideki MoriShigeru Kanematsu
    • H01L31/119
    • H01L27/0623H01L21/8249H01L27/0922
    • A semiconductor device (100) according to the present invention comprises a vertical PNP bipolar transistor (20), an NMOS transistor (50) and a PMOS transistor (60) that are of high dielectric strength, and a P-type semiconductor substrate 1, as shown in FIG. 2. A substrate isolation layer (21) of the PNP bipolar transistor (20), a drain buried layer (51) of the NMOS transistor (50), and a back gate buried layer (61) of the PMOS transistor (60) are formed simultaneously by selectively implanting N-type impurities, such as phosphorous, in the semiconductor substrate (1). This invention greatly contributes to curtailing the processes of fabricating BiCMOS ICs and the like including vertical bipolar transistors with easily controllable performance characteristics, such as a current amplification factor, and MOS transistors with high dielectric strength and makes even more miniaturization of such ICs achievable.
    • 根据本发明的半导体器件(100)包括具有高介电强度的垂直PNP双极晶体管(20),NMOS晶体管(50)和PMOS晶体管(60),以及P型半导体衬底1, 如图1所示。 2。 同时形成PNP双极晶体管(20)的衬底隔离层(21),NMOS晶体管(50)的漏埋层(51)和PMOS晶体管(60)的背栅掩埋层(61) 通过在半导体衬底(1)中选择性地注入诸如磷的N型杂质。 本发明大大有助于减少制造BiCMOS IC等的工艺,其中包括具有容易控制的性能特征的垂直双极晶体管,例如电流放大因子,以及具有高介电强度的MOS晶体管,并且使得这种IC的更小型化成为可能。
    • 8. 发明申请
    • Semiconductor device and method of fabricating same
    • 半导体装置及其制造方法
    • US20050202623A1
    • 2005-09-15
    • US11100440
    • 2005-04-07
    • Kenichi OokuboHideki MoriShigeru Kanematsu
    • Kenichi OokuboHideki MoriShigeru Kanematsu
    • H01L21/8222H01L21/8228H01L21/8248H01L21/8249H01L27/06H01L27/082H01L27/092H01L31/119H01L21/8238
    • H01L27/0623H01L21/8249H01L27/0922
    • A semiconductor device (100) according to the present invention comprises a vertical PNP bipolar transistor (20), an NMOS transistor (50) and a PMOS transistor (60) that are of high dielectric strength, and a P-type semiconductor substrate 1, as shown in FIG. 2. A substrate isolation layer (21) of the PNP bipolar transistor (20), a drain buried layer (51) of the NMOS transistor (50), and a back gate buried layer (61) of the PMOS transistor (60) are formed simultaneously by selectively implanting N-type impurities, such as phosphorous, in the semiconductor substrate (1). This invention greatly contributes to curtailing the processes of fabricating BiCMOS ICs and the like including vertical bipolar transistors with easily controllable performance characteristics, such as a current amplification factor, and MOS transistors with high dielectric strength and makes even more miniaturization of such ICs achievable.
    • 根据本发明的半导体器件(100)包括具有高介电强度的垂直PNP双极晶体管(20),NMOS晶体管(50)和PMOS晶体管(60),以及P型半导体衬底1, 如图1所示。 PNP双极晶体管(20)的衬底隔离层(21),NMOS晶体管(50)的漏极埋层(51)和PMOS晶体管(60)的背栅极埋层(61) 通过在半导体衬底(1)中选择性地注入N型杂质(例如磷)而同时形成。 本发明大大有助于减少制造BiCMOS IC等的工艺,其中包括具有容易控制的性能特征的垂直双极晶体管,例如电流放大因子,以及具有高介电强度的MOS晶体管,并且使得这种IC的更小型化成为可能。
    • 9. 发明授权
    • Key for musical instrument
    • 乐器钥匙
    • US06774294B2
    • 2004-08-10
    • US10201283
    • 2002-07-24
    • Hidenori KugimotoJun IshiiKenichi Ookubo
    • Hidenori KugimotoJun IshiiKenichi Ookubo
    • G10C312
    • G10C3/12
    • A key for a musical instrument is provided for facilitating the attachment of a weight, and adjustments of a touch load, while using an alternative material for substitution for lead as a material for the weight. The key comprises a swingable key body formed with embedding holes, and weights each made of a material other than lead and having a threaded outer peripheral surface. The weight is screwed into the embedding hole for removable fit into the key body to give a load to the key body. A plurality of types of weights different in load from one another are provided for selecting one having an appropriate load therefrom to adjust the touch load.
    • 提供乐器的一个关键是为了便于重量的附着和触摸负载的调整,同时使用替代材料来代替铅作为重量的材料。 钥匙包括形成有嵌入孔的可摆动钥匙主体,并且每个由除了引线之外的材料制成并具有螺纹外周表面的重量。 重量被拧入嵌入孔中以便可拆卸地装配到钥匙体中,从而给钥匙体加载。 提供了彼此负载不同的多种类型的重量,用于选择具有适当负载的重量以调节触摸负载。