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    • 1. 发明授权
    • Optical transmission system
    • 光传输系统
    • US5543952A
    • 1996-08-06
    • US526277
    • 1995-09-11
    • Kazushige YonenagaShigeru KuwanoNori ShibataSeiji Norimatsu
    • Kazushige YonenagaShigeru KuwanoNori ShibataSeiji Norimatsu
    • H04B10/50H04B10/508H04B10/516H04B10/54H04B10/04
    • H04B10/505H04B10/5051H04B10/508H04B10/5167H04B10/541
    • In a transmitter side in an optical transmission system, an input binary signal is converted into a duobinary signal, and the duobinary signal is applied to an optical modulation device which provides an optical intensity modulation signal, wherein the optical intensity for a center value of the duobinary signal is a minimum, the optical intensity for the other two values of the duobinary signal is a maximum, and an optical phase for those two values is opposite to each other. In a receiver side, simple direct detection is carried out for receiving optical signal through an optical transmission line to provide a demodulated binary signal. Thus, an original binary signal is recovered without a duobinary decoder and receiver sensitivity degradation. In the optical transmission system, an optical carrier frequency component in a signal spectrum is suppressed, a signal bandwidth of the modulated light is reduced in half to that of a prior art, so an optical transmission system for long distance, high bit rate and large traffic capacity is obtained.
    • 在光传输系统的发射机侧,输入二进制信号被转换为双二进制信号,并且双二进制信号被施加到提供光强度调制信号的光调制装置,其中,用于中心值的光强度 双二进制信号是最小的,双二进制信号的其他两个值的光强度是最大的,并且这两个值的光学相位彼此相反。 在接收机侧,进行简单的直接检测,以通过光传输线接收光信号以提供解调的二进制信号。 因此,原始二进制信号被恢复而没有双二进制解码器和接收机灵敏度降级。 在光传输系统中,信号频谱中的光载波频率分量被抑制,调制光的信号带宽减小到现有技术的一半,因此用于长距离,高比特率和大的光传输系统 获得交通容量。
    • 2. 发明授权
    • Apparatus and method for testing electronic devices
    • 用于测试电子设备的装置和方法
    • US5289116A
    • 1994-02-22
    • US952469
    • 1992-09-28
    • Jun KuritaKiyoyasu HiwadaNobuyuki KasugaYoichiro YamadaShigeru KuwanoKeita GunjiTomoya Yamazaki
    • Jun KuritaKiyoyasu HiwadaNobuyuki KasugaYoichiro YamadaShigeru KuwanoKeita GunjiTomoya Yamazaki
    • G01R31/3167G01R31/319G01R31/3193G01R31/28
    • G01R31/3167G01R31/31922G01R31/3193
    • An apparatus 1 for testing mixed signal electronic devices (i.e., devices, such as LSI devices, whose input/output signals include direct current signals, digital signals and analog signals, where the time relationship between the various input and output signals may be either synchronous or asynchronous) includes a master clock subsystem (MCLK-SS) 11, a subsystem group comprised of a digital master subsystem (DM-SS) 12, a digital slave subsystem (DS-SS) 13, a waveform generator subsystem (WG-SS) 14, a waveform digitizer subsystem (WD-SS) 15, a time measuring module (TMM) 16, and a direct current subsystem (DC-SS) 17, and an interfacing test head 18. The MCLK-SS 11 receives a master clock from a timing generator 21 or DSP 23 of the device under test (DUT) 186 and generates a first master clock MCLK1 and a second master clock MCLK2, each of which is synchronized with the master clock from the DUT. A reference clock generator 111, which receives the output of the buffer 181, supplies a standard clock to the first and second clock generators 112, 113, which in turn generate the first and second master clock signals.
    • 一种用于测试混合信号电子装置(即诸如LSI装置的装置,其输入/输出信号包括直流信号,数字信号和模拟信号的装置1),其中各种输入和输出信号之间的时间关系可以是同步的 或异步)包括主时钟子系统(MCLK-SS)11,由数字主子系统(DM-SS)12,数字从属子系统(DS-SS)13,波形发生器子系统(WG-SS) )14,波形数字化器子系统(WD-SS)15,时间测量模块(TMM)16和直流子系统(DC-SS)17以及接口测试头18.MCLK-SS11接收主机 来自被测器件(DUT)186的定时发生器21或DSP 23的时钟,并且产生第一主时钟MCLK1和第二主时钟MCLK2,其中每一个与来自DUT的主时钟同步。 接收缓冲器181的输出的参考时钟发生器111将标准时钟提供给第一和第二时钟发生器112,113,第一和第二时钟发生器112,113又产生第一和第二主时钟信号。