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    • 3. 发明授权
    • Power conversion apparatus
    • 电力转换装置
    • US08351224B2
    • 2013-01-08
    • US12506535
    • 2009-07-21
    • Hiromichi OhashiKyungmin SungMasamu KamagaMitsuaki Shimizu
    • Hiromichi OhashiKyungmin SungMasamu KamagaMitsuaki Shimizu
    • H02M5/45H02J3/00
    • H02M5/4585H02M5/271
    • A power conversion apparatus includes a main circuit with switches, and performs power conversion to generate power to a three-phase AC load from a three- or single-phase AC power supply. Some of the switches are configured, using a bidirectional switch including a normally-on device that is turned OFF when a gate circuit is provided with a positive or negative voltage, and a normally-off device that is turned ON when the gate circuit is provided with a positive or negative voltage, to provide only a specific unidirectional current flow when the gate circuit is not activated, and when the gate circuit is activated, provide and control a bidirectional current flow to direct only in an arbitrary unidirectional way. By providing the power conversion apparatus with a capability of directing back, to a load (motor), any power coming therefrom, the conversion apparatus requires no direct-current link capacitor and a diode clamping circuit.
    • 电力转换装置包括具有开关的主电路,并且进行电力转换以从三相或单相交流电源向三相交流负载产生电力。 一些开关被配置为使用包括在门电路被提供正或负电压时被关断的常开装置的双向开关和当提供门电路时被接通的常关装置 具有正或负电压,仅在门电路未激活时仅提供特定的单向电流,并且当门电路被激活时,提供和控制双向电流仅以任意的单向方式引导。 通过为电力转换装置提供向负载(电动机)提供来自其的任何电力的能力,转换装置不需要直流链路电容器和二极管钳位电路。
    • 7. 发明授权
    • Power semiconductor device
    • 功率半导体器件
    • US5714775A
    • 1998-02-03
    • US633688
    • 1996-04-19
    • Tomoki InoueIchiro OmuraHiromichi Ohashi
    • Tomoki InoueIchiro OmuraHiromichi Ohashi
    • H01L29/06H01L29/10H01L29/32H01L29/739H01L29/74H01L31/111
    • H01L29/7397H01L29/0696H01L29/1095H01L29/32
    • A p-type emitter layer having a low resistivity is arranged on a bottom surface of an n-type base layer having a high resistivity. A p-type base layer is formed in a top surface of the n-type base layer. Trenches are formed in the p-type base layer and the n-type base layer such that each trench penetrates the p-type base layer and reaches down to a halfway depth in the n-type base layer. Inter-trench regions made of semiconductor are defined between the trenches. An n-type emitter layer having a low resistivity is formed in a surface of the p-type base layer to be in contact with the upper part of each trench. A gate electrode is buried via a gate insulating film in each trench. That side surface of each inter-trench region which faces the gate electrode consists of a {100} plane.
    • 具有低电阻率的p型发射极层布置在具有高电阻率的n型基极层的底表面上。 p型基底层形成在n型基底层的顶表面上。 在p型基底层和n型基底层中形成沟槽,使得每个沟槽穿过p型基底层并在n型基底层中下降到中间深度。 在沟槽之间限定由半导体制成的沟槽间区域。 在p型基底层的表面上形成具有低电阻率的n型发射极层,以与每个沟槽的上部接触。 每个沟槽中的栅极绝缘膜埋入栅电极。 面对栅电极的每个沟槽间区域的侧表面由{100}平面组成。
    • 10. 发明授权
    • Method of manufacturing semiconductor device wherein silicon substrates
are bonded together
    • 制造半导体器件的方法,其中硅衬底结合在一起
    • US4700466A
    • 1987-10-20
    • US825544
    • 1986-02-03
    • Akio NakagawaHiromichi OhashiTsuneo OguraMasaru Shimbo
    • Akio NakagawaHiromichi OhashiTsuneo OguraMasaru Shimbo
    • H01L29/78H01L21/02H01L21/18H01L21/20H01L21/306H01L21/336H01L27/12H01L29/74H01L29/861H01L21/461
    • H01L21/02052H01L21/187
    • A method of manufacturing a semiconductor device, wherein a semiconductor wafer having a first impurity-doped layer and a second impurity-doped layer having a higher impurity concentration than that of the first impurity-doped layer is formed. A first silicon substrate, having a first impurity-doped layer and a third impurity-doped layer which has a higher impurity concentration than that of the first impurity-doped layer and the same conductivity type as that of the second impurity-doped layer, and whose surface is mirror-polished, is brought into contact with a second silicon substrate which has a higher impurity concentration than that of the first impurity-doped layer and the same conductivity type as that of the second impurity-doped layer, and whose surface is mirror-polished, so that the mirror-polished surfaces thereof are in contact with each other. The contacting substrates are then placed in a clean atmosphere so that virtually no foreign substances are present therebetween, and annealed at a temperature of not less than 200.degree. C. so as to bond them together, thereby forming the second impurity-doped layer consisting of the third impurity doped layer and the second silicon substrate.
    • 一种制造半导体器件的方法,其中形成具有第一杂质掺杂层和杂质浓度高于第一杂质掺杂层的第二杂质掺杂层的半导体晶片。 具有第一杂质掺杂层和第三杂质掺杂层的第一硅衬底,其具有比第一杂质掺杂层高的杂质浓度和与第二杂质掺杂层相同的导电类型,以及 其表面经镜面抛光与第二硅衬底接触,第二硅衬底的杂质浓度高于第一杂质掺杂层的杂质浓度并且具有与第二杂质掺杂层相同的导电类型,并且其表面为 镜面抛光,使得其镜面抛光表面彼此接触。 然后将接触的基材放置在清洁的气氛中,实际上不存在异物,并在不低于200℃的温度下进行退火,以将它们结合在一起,由此形成第二杂质掺杂层,由 第三杂质掺杂层和第二硅衬底。