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1. 发明申请

US20130278279A1 METHOD FOR THERMAL STABILIZATION OF PROBE CARD AND INSPECTION APPARATUS 有权
标题翻译：探针卡和检查装置的热稳定方法
公开(公告)号：US20130278279A1
公开(公告)日：2013-10-24
申请号：US13978411
申请日：2011-12-09
申请人： Kazunari Ishii , Tetsuji Watanabe , Shinya Koizumi , Koichi Matsuzaki
发明人： Kazunari Ishii , Tetsuji Watanabe , Shinya Koizumi , Koichi Matsuzaki
IPC分类号： G01R1/073
CPC分类号： G01R1/07342 , G01R31/2863 , G01R31/2891
摘要： In a method for thermal stabilization of a probe card, a probe card is adjusted to a prescribed temperature in a short time by making a heat source directly contact the probe card and is accurately determined whether the probe card is thermally stable. A heat transfer substrate is mounted on a mounting table. The temperature of the heat transfer substrate is adjusted through the mounting table. The mounting table is raised, and a plurality of probes is brought into contact with the heat transfer substrate at a prescribed target load. The contact load between the heat transfer substrate and the probes, which changes according to the thermal changes in the probe card, is detected. The mounting table is controlled vertically through a vertical drive mechanism such that the contact load becomes the target load until the probe card is thermally stable.
摘要翻译：在探针卡的热稳定化方法中，通过使热源与探针卡直接接触，将探针卡在短时间内调整为规定的温度，并且准确地确定探针卡是否热稳定。传热基板安装在安装台上。通过安装台调节传热基板的温度。安装台升起，多个探针以规定的目标载荷与传热基板接触。检测传感基板和探针之间根据探针卡的热变化而变化的接触负载。安装台通过垂直驱动机构垂直控制，使得接触负载成为目标负载，直到探针卡热稳定。

2. 发明授权

US09030218B2 Method for thermal stabilization of probe card and inspection apparatus 有权
标题翻译：探针卡和检查装置的热稳定方法
公开(公告)号：US09030218B2
公开(公告)日：2015-05-12
申请号：US13978411
申请日：2011-12-09
申请人： Kazunari Ishii , Tetsuji Watanabe , Shinya Koizumi , Koichi Matsuzaki
发明人： Kazunari Ishii , Tetsuji Watanabe , Shinya Koizumi , Koichi Matsuzaki
IPC分类号： G01R1/073 , G01R31/28
CPC分类号： G01R1/07342 , G01R31/2863 , G01R31/2891
摘要： In a method for thermal stabilization of a probe card, a probe card is adjusted to a prescribed temperature in a short time by making a heat source directly contact the probe card and is accurately determined whether the probe card is thermally stable. A heat transfer substrate is mounted on a mounting table. The temperature of the heat transfer substrate is adjusted through the mounting table. The mounting table is raised, and a plurality of probes is brought into contact with the heat transfer substrate at a prescribed target load. The contact load between the heat transfer substrate and the probes, which changes according to the thermal changes in the probe card, is detected. The mounting table is controlled vertically through a vertical drive mechanism such that the contact load becomes the target load until the probe card is thermally stable.
摘要翻译：在探针卡的热稳定化方法中，通过使热源与探针卡直接接触，将探针卡在短时间内调整到规定的温度，并且准确地确定探针卡是否热稳定。传热基板安装在安装台上。通过安装台调节传热基板的温度。安装台升起，多个探针以规定的目标载荷与传热基板接触。检测传感基板和探针之间根据探针卡的热变化而变化的接触负载。安装台通过垂直驱动机构垂直控制，使得接触负载成为目标负载，直到探针卡热稳定。

3. 发明授权

US08055924B2 Semiconductor integrated circuit and electric power supply controlling method thereof 失效
标题翻译：半导体集成电路及其电源控制方法
公开(公告)号：US08055924B2
公开(公告)日：2011-11-08
申请号：US11968848
申请日：2008-01-03
申请人： Shinya Koizumi
发明人： Shinya Koizumi
IPC分类号： G06F1/32
CPC分类号： G06F1/3203 , G06F1/3296 , Y02D10/172
摘要： An interrupt power supply control unit 5 monitors interrupts 11, 21, 31 issued from function blocks 1, 2, 3, and also, a power supply control instruction 41 issued from a CPU 4. When either an interrupt or an instruction is issued, the interrupt power supply control unit 5 performs a power supply control operation in accordance with a content of an interrupt power supply control table 50. In the power supply control operation, ON/OFF-control operations of power supply switches 12, 22, 32, 42 are carried out, and also, control signals 581 and 582 are outputted to power supply cutoff solving elements 81 and 82. When electric power of the power supply is supplied to a necessary function block in accordance with the power supply control operation, the interrupt power supply control unit 5 initiates the relevant function block in accordance with the content of the interrupt power supply control table 50.
摘要翻译：中断电源控制单元5监视从功能块1,2,3发出的中断11,21,31以及从CPU4发出的电源控制指令41。当发出中断或指令时，中断电源控制单元5根据中断电源控制表50的内容执行电源控制操作。在电源控制操作中，电源开关12,22,32,42的ON / OFF控制操作并且还将控制信号581和582输出到电源切断解决元件81和82.当根据电源控制操作将电源的电力供应到必要的功能块时，中断功率电源控制单元5根据中断电源控制表50的内容启动相关的功能块。

4. 发明申请

US20120109348A1 CROSS FADER UNIT, MIXER AND PROGRAM 审中-公开
标题翻译：交叉淡化装置，混合器和程序
公开(公告)号：US20120109348A1
公开(公告)日：2012-05-03
申请号：US13322521
申请日：2009-05-25
申请人： Satoko Matsunaga , Shogo Suzuki , Shinya Koizumi , Shinji Takahashi
发明人： Satoko Matsunaga , Shogo Suzuki , Shinya Koizumi , Shinji Takahashi
IPC分类号： G06F17/00
CPC分类号： G11B27/038 , G06F3/04847 , G11B27/34 , H03G5/025 , H04H60/04
摘要： A cross fader unit, a mixer and a program which can achieve various music expressions with a simple manipulation are provided. A cross fader unit CF has an adjustment device by band 50 that adjusts a mixing rate of the audio signal in each frequency band by moving a plurality of the manipulation members each of which is a manipulation member by frequency band divided into a plurality of bands of the audio signal on a corresponding line 52.
摘要翻译：提供了可以通过简单操作实现各种音乐表达的十字推子单元，混音器和程序。交叉推子单元CF具有通过频带50的调整装置，其通过将每个作为操纵构件的多个操作构件通过分成多个频带的频带来调整每个频带中的音频信号的混合速率相应线路52上的音频信号。

5. 发明申请

US20100050106A1 LEVEL ADJUSTING DEVICE, SIGNAL PROCESSOR, AV PROCESSOR AND PROGRAM 审中-公开
标题翻译：级别调整设备，信号处理器，AV处理程序和程序
公开(公告)号：US20100050106A1
公开(公告)日：2010-02-25
申请号：US12530492
申请日：2007-03-09
申请人： Shinya Koizumi , Toru Ebata
发明人： Shinya Koizumi , Toru Ebata
IPC分类号： G06F3/048
CPC分类号： H04N5/262 , G06F3/04847 , G06F3/0485 , G06F3/04855 , G06F3/0488
摘要： Provided herein is an AV processing apparatus which displays through a GUI a fader F capable of adjusting an output level by moving an operation element along a predetermined track on a touch panel TP. When an arbitrary position on the track is designated as a point by an operation of a user, the operation element is moved at a constant speed over a predetermined required moving time from a moving start position which is a position of the operation element before the designation to the designated arbitrary position.
摘要翻译：本文提供了一种AV处理装置，其通过GUI显示能够通过沿着触摸面板TP沿着预定轨道移动操作元件来调整输出电平的推子F. 当通过用户的操作将轨道上的任意位置指定为点时，操作元件在从指定位置之前的操作元素的位置的移动开始位置起以预定的所需移动时间以恒定速度移动到指定的任意位置。

6. 发明授权

US08130004B2 Probe apparatus and method for correcting contact position by adjusting overdriving amount 有权
标题翻译：用于通过调节过驱动量校正接触位置的探头装置和方法
公开(公告)号：US08130004B2
公开(公告)日：2012-03-06
申请号：US12466107
申请日：2009-05-14
申请人： Hiroshi Yamada , Tomoya Endo , Shinya Koizumi
发明人： Hiroshi Yamada , Tomoya Endo , Shinya Koizumi
IPC分类号： G01R31/00 , G01R31/02
CPC分类号： G01R31/2891
摘要： A probe apparatus includes a movable mounting table for supporting an object to be tested; a probe card disposed above the mounting table and having a plurality of probes to come into contact with electrodes of the object; a support body for supporting the probe card; and a control unit for controlling the mounting table. Electrical characteristics of the object are tested based on a signal from a tester by bringing the object and the probes into electrical contact with each other by overdriving the mounting table in a state where a test head is electrically connected with the probe card by a predetermined load. Further, one or more distance measuring devices for measuring a current overdriving amount of the mounting table are provided at one or more locations of the test head or the probe card.
摘要翻译：探针装置包括用于支撑待测物体的可移动安装台; 探针卡，其设置在所述安装台的上方，并且具有多个探针以与所述物体的电极接触; 用于支撑探针卡的支撑体; 以及用于控制安装台的控制单元。通过在测试头与探针卡电连接预定负载的状态下，通过过载驱动安装台来使来自测试者的信号通过使物体和探针彼此电接触来测试物体的电特性。此外，在测试头或探针卡的一个或多个位置处设置有用于测量安装台的电流过驱动量的一个或多个测距装置。

7. 发明申请

US20120126841A1 PROBE APPARATUS AND METHOD FOR CORRECTING CONTACT POSITION 审中-公开
标题翻译：用于校正接触位置的探测器和方法
公开(公告)号：US20120126841A1
公开(公告)日：2012-05-24
申请号：US13358635
申请日：2012-01-26
申请人： Hiroshi Yamada , Tomoya Endo , Shinya Koizumi
发明人： Hiroshi Yamada , Tomoya Endo , Shinya Koizumi
IPC分类号： G01R1/02
CPC分类号： G01R31/2891
摘要： A probe apparatus includes a movable mounting table for supporting an object to be tested; a probe card disposed above the mounting table and having a plurality of probes to come into contact with electrodes of the object; a support body for supporting the probe card; and a control unit for controlling the mounting table. Electrical characteristics of the object are tested based on a signal from a tester by bringing the object and the probes into electrical contact with each other by overdriving the mounting table in a state where a test head is electrically connected with the probe card by a predetermined load. Further, one or more distance measuring devices for measuring a current overdriving amount of the mounting table are provided at one or more locations of the test head or the probe card.
摘要翻译：探针装置包括用于支撑待测物体的可移动安装台; 探针卡，其设置在所述安装台的上方，并且具有多个探针以与所述物体的电极接触; 用于支撑探针卡的支撑体; 以及用于控制安装台的控制单元。通过在测试头与探针卡电连接预定负载的状态下，通过过载驱动安装台来使来自测试者的信号通过使物体和探针彼此电接触来测试物体的电特性。此外，在测试头或探针卡的一个或多个位置处设置有用于测量安装台的电流过驱动量的一个或多个测距装置。

8. 发明申请

US20120119766A1 PROBE APPARATUS AND METHOD FOR CORRECTING CONTACT POSITION 审中-公开
公开(公告)号：US20120119766A1
公开(公告)日：2012-05-17
申请号：US13358669
申请日：2012-01-26
申请人： Hiroshi Yamada , Tomoya Endo , Shinya Koizumi
发明人： Hiroshi Yamada , Tomoya Endo , Shinya Koizumi
IPC分类号： G01R35/00 , G01R31/20
CPC分类号： G01R31/2891
摘要： A probe apparatus includes a movable mounting table for supporting an object to be tested; a probe card disposed above the mounting table and having a plurality of probes to come into contact with electrodes of the object; a support body for supporting the probe card; and a control unit for controlling the mounting table. Electrical characteristics of the object are tested based on a signal from a tester by bringing the object and the probes into electrical contact with each other by overdriving the mounting table in a state where a test head is electrically connected with the probe card by a predetermined load. Further, one or more distance measuring devices for measuring a current overdriving amount of the mounting table are provided at one or more locations of the test head or the probe card.

9. 发明申请

US20100085379A1 EFFECT DEVICE, AV PROCESSING DEVICE AND PROGRAM 审中-公开
标题翻译：影响设备，AV处理设备和程序
公开(公告)号：US20100085379A1
公开(公告)日：2010-04-08
申请号：US12530571
申请日：2007-03-09
申请人： Yasumasa Hishikawa , Shinji Takahashi , Shinya Koizumi , Takeo Miyakura , Sumie Ajiki
发明人： Yasumasa Hishikawa , Shinji Takahashi , Shinya Koizumi , Takeo Miyakura , Sumie Ajiki
IPC分类号： G09G5/00 , H04R3/00
CPC分类号： G11B27/105 , G06F3/017 , G06F3/04883 , H04N5/85 , H04S7/30
摘要： Provided herein is an AV processing apparatus applied with an effect apparatus of the invention stores a plurality of video control programs for implementing a plurality types of video effects corresponding to a plurality types of audio effects to provide the same impression as each audio effect can give. The AV processing apparatus implements a video control program corresponding to a selected audio effect from the plurality types of video effects, thereby a video effect which can provide the same impression as the audio effect can give is achieved.
摘要翻译：这里提供一种应用了本发明的效果装置的AV处理装置，存储用于实现与多种音频效果对应的多种类型的视频效果的多个视频控制程序，以提供与每个音频效果可以给出的相同的印象。 AV处理装置从多种类型的视频效果中实现对应于所选择的音频效果的视频控制程序，从而实现可以提供与音频效果相同的印象的视频效果。

10. 发明申请

US20090284277A1 PROBE APPARATUS AND METHOD FOR CORRECTING CONTACT POSITION 有权
标题翻译：用于校正接触位置的探测器和方法
公开(公告)号：US20090284277A1
公开(公告)日：2009-11-19
申请号：US12466107
申请日：2009-05-14
申请人： Hiroshi Yamada , Tomoya Endo , Shinya Koizumi
发明人： Hiroshi Yamada , Tomoya Endo , Shinya Koizumi
IPC分类号： G01R31/02
CPC分类号： G01R31/2891
摘要： A probe apparatus includes a movable mounting table for supporting an object to be tested; a probe card disposed above the mounting table and having a plurality of probes to come into contact with electrodes of the object; a support body for supporting the probe card; and a control unit for controlling the mounting table. Electrical characteristics of the object are tested based on a signal from a tester by bringing the object and the probes into electrical contact with each other by overdriving the mounting table in a state where a test head is electrically connected with the probe card by a predetermined load. Further, one or more distance measuring devices for measuring a current overdriving amount of the mounting table are provided at one or more locations of the test head or the probe card.
摘要翻译：探针装置包括用于支撑待测物体的可移动安装台; 探针卡，其设置在所述安装台的上方，并且具有多个探针以与所述物体的电极接触; 用于支撑探针卡的支撑体; 以及用于控制安装台的控制单元。通过在测试头与探针卡电连接预定负载的状态下，通过过载驱动安装台来使来自测试者的信号通过使物体和探针彼此电接触来测试物体的电特性。此外，在测试头或探针卡的一个或多个位置处设置有用于测量安装台的电流过驱动量的一个或多个测距装置。

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