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    • 2. 发明授权
    • Solder material test method and apparatus, control program and computer-readable recording medium
    • 焊料测试方法和装置,控制程序和计算机可读记录介质
    • US07531801B2
    • 2009-05-12
    • US11356437
    • 2006-02-17
    • Katsumi OhashiMasanobu HorinoYasuhiro Onishi
    • Katsumi OhashiMasanobu HorinoYasuhiro Onishi
    • G01J5/02
    • G01N21/276G01N21/3563G01N21/95684
    • Provided is a solder material test method that reduces labor and time and is preferred in operation hygiene. Detected are a first intensity at a particular wave number of infrared radiation reflected from a test-sample solder material by illuminating light to the test-sample solder material and a second intensity at the particular wave number of infrared radiation reflected from a comparative-sample solder material by illuminating light to the comparative-sample solder material. Depending upon the first and second intensities detected, intensity differences and ratios are determined. Those may be absorbance differences or intensities of between an infrared radiation absorbance to test-sample solder material and an infrared radiation absorbance to comparative-sample solder material. From the intensity difference, intensity ratio, absorbance difference and absorbance ratio, the test-sample solder material is tested for deterioration degree relatively to the comparative sample.
    • 提供了一种减少劳动和时间并且在操作卫生中优选的焊料测试方法。 检测到的是通过向测试样品焊料材料照射光而从测试样品焊料材料反射的特定波数的红外辐射的第一强度,以及从比较样品焊料反射的特定波数的红外辐射的第二强度 通过将光照射到比较样品焊料材料上。 根据检测到的第一和第二强度,确定强度差异和比率。 那些可能是测试样品焊料材料的红外辐射吸收率与对比样品焊料材料的红外辐射吸收率之间的吸光度差异或强度。 从强度差,强度比,吸光度差和吸光度比,测试样品焊料材料相对于比较样品进行劣化度测试。
    • 3. 发明申请
    • System for searching intersections and method thereof
    • 搜索交叉点的系统及其方法
    • US20080040032A1
    • 2008-02-14
    • US11783610
    • 2007-04-10
    • Katsumi Ohashi
    • Katsumi Ohashi
    • G01C21/26
    • G01C21/3611G01C21/3682
    • A system for searching an intersection according to a user's request is included in a navigation system mounted on an automotive vehicle. An intersection is searched from an intersection database stored in an on-board memory medium based on an intersection pattern designated by the user. The intersection pattern includes the number of branches included in an intersection and a shape of the intersection. To make the search more precise, the user may additionally input a location of the intersection and buildings located around the intersection, if those are known to the user. After the intersection search is completed, the intersection is shown on a display panel together with a map showing the vicinity of the intersection. According to the present invention, the desired intersection can be searched even if the name of the intersection is unknown to the user.
    • 根据用户的要求搜索路口的系统包括在安装在机动车辆上的导航系统中。 基于由用户指定的交叉图案,从存储在板载存储介质中的交叉点数据库搜索交叉路口。 交叉图案包括交叉点中包括的分支数和交叉点的形状。 为了使搜索更精确,用户可以另外输入交叉点的位置和位于交叉点周围的建筑物(如果用户已知的那样)。 交叉搜索完成后,显示面板上显示交叉路口以及显示交叉口附近的地图。 根据本发明,即使用户的交叉点的名称是未知的,也可以搜索所需的交叉路口。
    • 4. 发明授权
    • Solder material test apparatus, and method of controlling the same
    • 焊料测试装置及其控制方法
    • US07660643B2
    • 2010-02-09
    • US11501240
    • 2006-08-09
    • Yasuhiro OnishiMasanobu HorinoKatsumi Ohashi
    • Yasuhiro OnishiMasanobu HorinoKatsumi Ohashi
    • G06F19/00
    • H05K3/1233H05K3/3484H05K2203/162H05K2203/163
    • A solder material test apparatus includes a control unit and a storage unit which stores master data in advance in which a printing process time when a printing process is performed by using a test-sample solder material is associated with deterioration degree data of the test-sample solder material at the printing process time. The control unit includes a deterioration degree data acquiring unit which acquires deterioration degree data for indicating a deterioration degree of a test-sample solder material, a reading unit which reads a printing process time associated with deterioration degree data set as a limit value with reference to master data and reads a printing process time associated with the deterioration degree data acquired by the deterioration degree data acquiring unit, an operating unit which operates an available remaining time that indicates difference between the printing process times, and a display control unit which informs the available remaining time to a user.
    • 焊料测试装置包括控制单元和存储单元,其预先存储主数据,其中通过使用测试样品焊料进行打印处理的打印处理时间与测试样品的劣化程度数据相关联 焊料在印刷过程中的时间。 控制单元包括劣化度数据获取单元,其获取用于指示测试样品焊料材料的劣化程度的劣化度数据,读取单元,其读取与设置为极限值的劣化度数据相关联的打印处理时间,参考 读取与恶化度数据获取单元获取的劣化度数据相关联的打印处理时间,操作指示打印处理时间之间的差异的可用剩余时间的操作单元和通知可用的显示控制单元 留给用户的时间。
    • 5. 发明申请
    • Solder Material Inspecting Device
    • 焊料检测设备
    • US20090122306A1
    • 2009-05-14
    • US12084980
    • 2006-11-09
    • Katsumi OhashiMasanobu HorinoYasuhiro Onishi
    • Katsumi OhashiMasanobu HorinoYasuhiro Onishi
    • G01N21/35
    • G01N21/95684G01N21/3563G01N21/55H05K1/0269H05K3/1216H05K3/3484
    • Before an electronic component is mounted on a board 2, only a cream solder 3 printed on the board 2 is irradiated with a light beam which the board 2 is scanned based on printing position information obtained by printing position obtaining means such as CAD data, and thereby inspection object intensity of an infrared ray having a specific wave number, which is reflected from the cream solder 3, is detected by the irradiation of the cream solder 3 with the light beam. The cream solder 3 printed on the board 2 is set to an inspection object, and a deterioration parameter indicating a relative degree of deterioration of the cream solder 3 of the inspection object to a cream solder 3 of a comparison object is computed based on comparison object intensity of the infrared ray having the specific wave number and the inspection object intensity. The comparison object intensity of the infrared ray is detected as a reflected light beam when the cream solder 3 of the comparison object is irradiated with the light beam.
    • 在将电子部件安装在基板2上之前,基于通过CAD数据等打印位置取得单元得到的打印位置信息,仅对印刷在基板2上的膏状焊料3照射基板2被扫描的光束, 从而通过用光束照射膏状焊膏3来检测从膏状焊料3反射的具有特定波数的红外线的检测对象强度。 将印刷在板2上的膏状焊料3设定为检查对象,并且根据比较对象计算表示检查对象的膏状焊膏3与比较对象的膏状焊膏3的相对退化程度的劣化参数 具有特定波数的红外线的强度和检查对象强度。 当比较对象的膏状焊料3被光束照射时,红外线的比较对象强度被检测为反射光束。
    • 6. 发明申请
    • Solder material test method and apparatus, control program and computer-readable recording medium
    • 焊料测试方法和装置,控制程序和计算机可读记录介质
    • US20080156990A1
    • 2008-07-03
    • US11356437
    • 2006-02-17
    • Katsumi OhashiMasanobu HorinoYasuhiro Onishi
    • Katsumi OhashiMasanobu HorinoYasuhiro Onishi
    • G01N21/35
    • G01N21/276G01N21/3563G01N21/95684
    • Provided is a solder material test method that reduces labor and time and is preferred in operation hygiene. Detected are a first intensity at a particular wave number of infrared radiation reflected from a test-sample solder material by illuminating light to the test-sample solder material and a second intensity at the particular wave number of infrared radiation reflected from a comparative-sample solder material by illuminating light to the comparative-sample solder material. Depending upon the first and second intensities detected, intensity differences and ratios are determined. Those may be absorbance differences or intensities of between an infrared radiation absorbance to test-sample solder material and an infrared radiation absorbance to comparative-sample solder material. From the intensity difference, intensity ratio, absorbance difference and absorbance ratio, the test-sample solder material is tested for deterioration degree relatively to the comparative sample.
    • 提供了一种减少劳动和时间并且在操作卫生中优选的焊料测试方法。 检测到的是通过向测试样品焊料材料照射光而从测试样品焊料材料反射的特定波数的红外辐射的第一强度,以及从比较样品焊料反射的特定波数的红外辐射的第二强度 通过将光照射到比较样品焊料材料上。 根据检测到的第一和第二强度,确定强度差异和比率。 那些可能是测试样品焊料材料的红外辐射吸收率与对比样品焊料材料的红外辐射吸收率之间的吸光度差异或强度。 从强度差,强度比,吸光度差和吸光度比,测试样品焊料材料相对于比较样品进行劣化度测试。
    • 8. 发明申请
    • Solder material test apparatus, and method of controlling the same
    • 焊料测试装置及其控制方法
    • US20070046283A1
    • 2007-03-01
    • US11501240
    • 2006-08-09
    • Yasuhiro OnishiMasanobu HorinoKatsumi Ohashi
    • Yasuhiro OnishiMasanobu HorinoKatsumi Ohashi
    • G01R31/28
    • H05K3/1233H05K3/3484H05K2203/162H05K2203/163
    • A solder material test apparatus includes a control unit and a storage unit which stores master data in advance in which a printing process time when a printing process is performed by using a test-sample solder material is associated with deterioration degree data of the test-sample solder material at the printing process time. The control unit includes a deterioration degree data acquiring unit which acquires deterioration degree data for indicating a deterioration degree of a test-sample solder material, a reading unit which reads a printing process time associated with deterioration degree data set as a limit value with reference to master data and reads a printing process time associated with the deterioration degree data acquired by the deterioration degree data acquiring unit, an operating unit which operates an available remaining time that indicates difference between the printing process times, and a display control unit which informs the available remaining time to a user.
    • 焊料测试装置包括控制单元和存储单元,其预先存储主数据,其中通过使用测试样品焊料进行打印处理的打印处理时间与测试样品的劣化程度数据相关联 焊料在印刷过程中的时间。 控制单元包括劣化度数据获取单元,其获取用于指示测试样品焊料材料的劣化程度的劣化度数据,读取单元,其读取与设置为极限值的劣化度数据相关联的打印处理时间,参考 读取与恶化度数据获取单元获取的劣化度数据相关联的打印处理时间,操作指示打印处理时间之间的差异的可用剩余时间的操作单元和通知可用的显示控制单元 留给用户的时间。
    • 9. 发明申请
    • Device for searching sub-facility included in facility
    • 用于搜索设施中包括的设备
    • US20060224313A1
    • 2006-10-05
    • US11370947
    • 2006-03-09
    • Yasuko OhashiKatsumi Ohashi
    • Yasuko OhashiKatsumi Ohashi
    • G01C21/00
    • G01C21/3611
    • A searching device of the present invention searches a sub-facility included in a large compound facility based on information stored in the device. A large compound facility is first searched, and then a sub-facility included in the large compound is searched if a user specifies the sub-facility. The user may specify the sub-facility to be searched by inputting certain keywords even when he/she does not know the exact name of the sub-facility. The searching device may be advantageously included in a navigation system such as a car navigation system. The specified sub-facility included in a large compound facility may be set as a target destination and a driving route from a starting point to the target destination can be exactly calculated.
    • 本发明的搜索装置基于存储在该装置中的信息来搜索包含在大型复合设施中的子设备。 首先搜索大的复合设施,然后如果用户指定子设施,则搜索包含在大型化合物中的子设施。 即使他/她不知道子设施的确切名称,用户也可以通过输入某些关键字来指定要搜索的子设施。 搜索装置可以有利地包括在例如汽车导航系统的导航系统中。 包括在大型复合设施中的指定的子设备可以被设置为目标目的地,并且可以精确地计算从起始点到目标目的地的行驶路线。
    • 10. 发明授权
    • Apparatus and method for examining images
    • US07003162B2
    • 2006-02-21
    • US09995204
    • 2001-11-27
    • Katsumi Ohashi
    • Katsumi Ohashi
    • G06K9/68
    • G06K9/036
    • An apparatus for examining printed characters is disclosed. The apparatus includes a database storing standard characters, means for inputting and storing a reference character, means for acquiring an actual image of a printed character, means for calculating a similarity degree between the actual image of the printed character and an image of a standard character stored in the database, and means for retrieving a first candidate character having a highest similarity degree to the printed character from the standard characters stored in the database and comparing the first candidate character with the reference character. If the first candidate character retrieved from the database equates to the reference character, the printed character is determined to be correct. If the first candidate character retrieved from the database does not equate to the reference character, the printed character is determined to be incorrect.