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1. 发明授权

US06431071B1 Mems arm fire and safe and arm devices 失效
标题翻译：手臂防火，安全和手臂装置
公开(公告)号：US06431071B1
公开(公告)日：2002-08-13
申请号：US09665230
申请日：2000-09-18
申请人： Kathleen F. Hodge , David H. Lewis, Jr. , Steven D. Nelson , Victor W. Ruwe
发明人： Kathleen F. Hodge , David H. Lewis, Jr. , Steven D. Nelson , Victor W. Ruwe
IPC分类号： F42C1526
CPC分类号： F42C15/36 , F42C15/184 , F42C15/34 , F42C15/40
摘要： Miniature arm fire and safe and arm devices include an electrically operated pyrotechnic initiation device (5) to generate a detonation wave upon command and a movable pressure barrier (9) that blocks propagation of the detonation wave if the device is not intended to be fired and opens a window (12) to transfer the detonation wave externally of the device. The detonation wave may in alternate embodiments be a subsonic flame front and pressure wave or a supersonic shock wave, respectively. An electromagnet (7) may serve to move the pressure barrier. Detonation waves output from the device have application in igniting an explosive train, either directly or indirectly, the latter by operating an electrical switch. In the arm fire device, the barrier automatically prevents a detonation output when electrical power is removed from the device. In the safe and arm device, the barrier, once moved out of the way, remains out of the way, even when electrical power is removed. Various forms of miniature single operate electrical switches are described that may be operated by the foregoing devices.
摘要翻译：微型手臂式防火和安全和手臂装置包括电动式烟火引发装置（5），用于在命令时产生爆震波;以及可移动压力屏障（9），其阻止爆震波的传播，如果该装置不打算被点燃，打开窗口（12）以将设备外部的爆震波转移。在替代实施例中，爆震波分别是亚音速火焰前和压力波或超音速冲击波。电磁体（7）可用于移动压力屏障。从设备输出的爆震波可以通过操作电气开关直接或间接点燃爆炸火车。在手臂消防装置中，当从设备中取出电力时，屏障自动防止爆震输出。在安全和手臂装置中，障碍物一旦被移开，即使在电力消除的情况下仍然存在。描述了可由前述装置操作的各种形式的微型单操作电开关。

2. 发明授权

US4154092A Pneumatic gross leak detector 失效
标题翻译：气动检漏仪
公开(公告)号：US4154092A
公开(公告)日：1979-05-15
申请号：US902595
申请日：1978-05-04
申请人： James W. White , Victor W. Ruwe
发明人： James W. White , Victor W. Ruwe
IPC分类号： G01M3/32
CPC分类号： G01M3/329
摘要： A pneumatic gross leak detector for testing micro-electronic packages. Thepparatus includes a frame having a vertically movable upper section and a stationary lower section. A chamber is provided with walls which are secured to the upper section for movement therewith. The chamber includes upper, lower and intermediate portions disposed in communication. A test chamber base is secured to the lower stationary section to receive the microelectronic package therein. A first piston is provided in the upper chamber portion for moving the upper frame section downwardly for sealing engagement for the lower chamber portion with the test chamber base. A second piston is provided for compressing air in the lower chamber portion to a predetermined value. A readout device communicates into the test chamber to indicate if compressed air in the lower chamber leaks into the micro-electronic package.
摘要翻译：用于测试微电子封装的气动检漏仪。该装置包括具有可垂直移动的上部和固定的下部的框架。一个腔室设有壁，它们固定在上部上以便随之移动。该室包括设置成连通的上部，下部和中间部分。测试室基座固定到下固定部分以在其中接收微电子封装。第一活塞设置在上室部分中，用于使上框架部分向下移动，用于与测试室底座密封用于下室部分。第二活塞被提供用于将下腔室部分中的空气压缩到预定值。读出装置连通到测试室，以指示下腔室中的压缩空气是否泄漏到微电子封装中。

3. 发明授权

US4158960A Microcircuit fine leak test apparatus 失效
标题翻译：微电路精密检漏仪
公开(公告)号：US4158960A
公开(公告)日：1979-06-26
申请号：US902594
申请日：1978-05-04
申请人： James W. White , Victor W. Ruwe
发明人： James W. White , Victor W. Ruwe
IPC分类号： G01M3/20
CPC分类号： G01M3/202 , G01M3/205
摘要： A plurality of fine leak test chambers for fast individual testing of herically plated microelectronic devices. Each microcircuit component, having already been subjected to a controlled environment of 5 percent helium and 95 percent nitrogen and then assembled, is placed in the chambers and sealed therein. The chambers are evacuated and helium flow rate (if present) is measured by a spectrometer.
摘要翻译：多个精密泄漏测试室，用于快速单独测试气密微电子器件。已经经受5％氦和95％氮气的受控环境然后组装的每个微电路组件被放置在室中并密封在其中。将室抽真空，并通过光谱仪测量氦气流速（如果存在）。

4. 发明授权

US4133910A Thick film deposition of microelectronic circuit 失效
标题翻译：薄膜沉积微电子电路
公开(公告)号：US4133910A
公开(公告)日：1979-01-09
申请号：US856438
申请日：1977-12-01
申请人： Victor W. Ruwe , Thomas D. Graben
发明人： Victor W. Ruwe , Thomas D. Graben
IPC分类号： B05B13/06 , H01L21/70 , H05K1/00 , H05K3/12 , B41M3/08 , B05D5/12
CPC分类号： B05B13/0654 , H01L21/705 , H05K1/0284 , H05K3/12
摘要： A process for depositing thick film electronic material which forms elect circuits on the inside wall of right circular substrates. The process includes the determination of a circuit pattern wherein a light sensor is used to actuate electronics which in turn controls the flow of the thick film paste for deposition on the substrate inside wall. The substrate is rotated and translated in conjunction with the movement of a light sensor in the x-y plane.
摘要翻译：一种用于沉积在右圆形基底的内壁上形成电路的厚膜电子材料的方法。该过程包括确定电路图案，其中使用光传感器来致动电子器件，电子器件又控制用于沉积在衬底内壁上的厚膜糊料的流动。结合光传感器在x-y平面中的运动，旋转基板并平移。

5. 发明授权

US4399488A Right circular substrate packaging 失效
标题翻译：右圆形基材包装
公开(公告)号：US4399488A
公开(公告)日：1983-08-16
申请号：US289606
申请日：1981-08-03
申请人： Victor W. Ruwe , James A. Kerr , Rene F. Sandeau, Jr.
发明人： Victor W. Ruwe , James A. Kerr , Rene F. Sandeau, Jr.
IPC分类号： H05K1/00 , H05K1/14
CPC分类号： H05K1/14 , H05K1/0284 , H05K2201/09018 , H05K2201/0999
摘要： Packaging of microelectronics utilizing a series of various size cylindershich are assembled and sealed from the environment, providing electrical connections out opposite ends of the cylinders and providing for a center opening in the inner cylinder to allow other structure such as a warhead to be mounted therein are aspects of this invention.
摘要翻译：使用一系列各种尺寸的气瓶包装微型电池，这些气缸与环境组装和密封，提供电连接到气缸的相对端，并提供内筒中的中心开口以允许其他结构如弹头安装在其中是本发明的方面。

6. 发明授权

US4356721A Glass lead seal test apparatus 失效
标题翻译：玻璃铅封试验仪
公开(公告)号：US4356721A
公开(公告)日：1982-11-02
申请号：US218235
申请日：1980-12-19
申请人： James W. White , Victor W. Ruwe , Donald R. Davis
发明人： James W. White , Victor W. Ruwe , Donald R. Davis
IPC分类号： G01M3/22 , G01M3/20
CPC分类号： G01M3/223
摘要： Glass lead seal test apparatus in which a multiplicity of microcircuit pages with the leads sealed relative thereto by glass are checked for leakage between the glass seals and the microcircuit package structure and relative to the leads; this is accomplished by providing an apparatus for evacuating a chamber of the microcircuit packages and a chamber of the apparatus, and then injecting helium into the chamber of the apparatus and then utilizing test structure to test leakage around the glass seals if a perfect seal is not present. The device is designed to handle a multiplicity of microcircuit packages during a given test cycle.
摘要翻译：检查玻璃密封件和微电路封装结构之间并相对于引线漏电的玻璃引线密封测试装置，其中多个具有由玻璃密封的引线的微电路封装，这是通过提供一种用于抽空微电路组件的腔室和设备的腔室的装置来实现的，然后将氦气注入设备的腔室中，然后利用测试结构来测试玻璃密封件周围的泄漏，如果完美的密封不是当下。该器件被设计为在给定的测试周期期间处理多个微电路封装。

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