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    • 1. 发明授权
    • Power-aware debugging
    • 电源感知调试
    • US08176453B2
    • 2012-05-08
    • US12558259
    • 2009-09-11
    • Kai YangTayung LiuFurshing TsaiTing Shih AngChih Neng HsuJun Zhao
    • Kai YangTayung LiuFurshing TsaiTing Shih AngChih Neng HsuJun Zhao
    • G06F17/50
    • G06F17/5022G06F2217/78
    • A debugging system produces displays in response to an IC design and results of a logic simulation of IC behavior based on the IC design. The IC design includes a hardware description language (HDL) model of the IC describing the IC as comprising cell instances communicating via data signals and power sources for supplying power to the cell instances. The IC design also includes power definition markup language (PDML) model describing a power intent of the IC design. The debugging system generates displays representing HDL code that are annotated to indicate how the power intent of the IC design described by the PDML model relates to the portion of the HDL model represented by the display. The debugging system also generates signals trace displays indicating how both the logic and power intent of the IC design affect the value of a user-selected signal at a user-selected time during the logic simulation.
    • 调试系统根据IC设计和基于IC设计的IC行为的逻辑仿真结果生成显示器。 该IC设计包括描述IC的IC的硬件描述语言(HDL)模型,其包括经由数据信号进行通信的小区实例和用于向小区实例供电的电源。 IC设计还包括描述IC设计的功率意图的功率定义标记语言(PDML)模型。 调试系统产生表示HDL代码的显示器,其被注释以指示由PDML模型描述的IC设计的功率意图与由显示器表示的HDL模型的部分有关。 调试系统还生成信号跟踪显示,指示IC设计的逻辑和电源意图如何在逻辑模拟期间在用户选择的时间影响用户选择的信号的值。
    • 2. 发明申请
    • POWER-AWARE DEBUGGING
    • 功率检测
    • US20100192115A1
    • 2010-07-29
    • US12558259
    • 2009-09-11
    • Kai YangTayung LiuFurshing TsaiTing Shih AngChih Neng Hsu
    • Kai YangTayung LiuFurshing TsaiTing Shih AngChih Neng Hsu
    • G06F17/50
    • G06F17/5022G06F2217/78
    • A debugging system produces displays in response to an IC design and results of a logic simulation of IC behavior based on the IC design. The IC design includes a hardware description language (HDL) model of the IC describing the IC as comprising cell instances communicating via data signals and power sources for supplying power to the cell instances. The IC design also includes power definition markup language (PDML) model describing a power intent of the IC design. The debugging system generates displays representing HDL code that are annotated to indicate how the power intent of the IC design described by the PDML model relates to the portion of the HDL model represented by the display. The debugging system also generates signals trace displays indicating how both the logic and power intent of the IC design affect the value of a user-selected signal at a user-selected time during the logic simulation.
    • 调试系统根据IC设计和基于IC设计的IC行为的逻辑仿真结果生成显示器。 该IC设计包括描述IC的IC的硬件描述语言(HDL)模型,其包括经由数据信号进行通信的小区实例和用于向小区实例供电的电源。 IC设计还包括描述IC设计的功率意图的功率定义标记语言(PDML)模型。 调试系统产生表示HDL代码的显示器,其被注释以指示由PDML模型描述的IC设计的功率意图与由显示器表示的HDL模型的部分有关。 调试系统还生成信号跟踪显示,指示IC设计的逻辑和电源意图如何在逻辑模拟期间在用户选择的时间影响用户选择的信号的值。
    • 6. 发明授权
    • Methods and systems for evaluating checker quality of a verification environment
    • 用于评估验证环境的检验质量的方法和系统
    • US08359559B2
    • 2013-01-22
    • US12977376
    • 2010-12-23
    • Kai YangMichael LyonsKuo-Ching LinWei-Ting TuChih-Wen ChangTein-Chun Wei
    • Kai YangMichael LyonsKuo-Ching LinWei-Ting TuChih-Wen ChangTein-Chun Wei
    • G06F17/50G06F9/455
    • G06F17/5022G06F17/504G06F2217/10
    • Methods and systems for evaluating checker quality of a verification environment are provided. In some embodiments, an overall sensitivity for the verification environment and an individual sensitivity for a respective checker are calculated. The overall sensitivity is a probability that a plurality of problematic design behaviors, which are propagated to a checker system including at least one checker, can be detected by the verification environment. The individual sensitivity is a probability that a plurality of problematic design behaviors, which are propagated to at least one specific probe among a plurality of probes of a design, can be detected by the checker corresponding to the specific probe. The overall checker sensitivity numbers can show the robustness of the check system. The individual checker sensitivity can guide the user which individual checker or checkers to improve.
    • 提供了用于评估验证环境的检查器质量的方法和系统。 在一些实施例中,计算验证环境的总体灵敏度和相应检查器的个体灵敏度。 总体灵敏度是通过验证环境可以检测到传播到包括至少一个检验器的检查系统的多个有问题的设计行为的概率。 个体敏感度是通过与特定探针对应的检查器可以检测到在设计的多个探针中传播到至少一个特定探针的多个有问题的设计行为的概率。 整体检查灵敏度数字可以显示检查系统的稳健性。 单独的检查灵敏度可以指导用户哪个单独的检查器或检查器改进。
    • 9. 发明申请
    • Cutting machine
    • 切割机
    • US20090223070A1
    • 2009-09-10
    • US12379996
    • 2009-03-05
    • Kai YangKenji Abe
    • Kai YangKenji Abe
    • B27B9/00
    • B23D59/006
    • It is, accordingly, an object of the present invention to provide a technique which is effective in preventing chips generated during cutting operation on a workpiece from being accumulated in a region ahead in a cutting direction. A representative cutting machine includes a motor, a blade, a body housing having a first region that houses the motor and a second region that covers the blade and projects forward of a front surface of the first region, a base, an angular plate, an outlet formed in the body housing, an opening and a blocking part. The blocking part prevents the air discharged from the outlet from flowing out laterally with respect to the moving direction of the base through a clearance between a front end of the second region and the one end of the angular plate and thereby helps the air discharged from the outlet flow into the opening.
    • 因此,本发明的目的是提供一种技术,其有效地防止在切割操作期间在工件上产生的碎屑积聚在切割方向上的区域中。 代表性的切割机包括马达,叶片,具有容纳马达的第一区域的主体壳体和覆盖叶片并在第一区域的前表面向前突出的第二区域,基座,角板, 出口形成在主体壳体中,一个开口和一个阻挡部分。 阻挡部防止从出口排出的空气相对于基座的移动方向横向流过第二区域的前端和角板的一端之间的间隙,从而有助于从 出口流入开口。