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    • 1. 发明申请
    • SYSTEM FOR MEASURING CORTICAL THICKNESS FROM MR SCAN INFORMATION
    • 用于从扫描信息测量反射厚度的系统
    • US20160306023A1
    • 2016-10-20
    • US15038059
    • 2014-11-12
    • KONINKLIJKE PHILIPS N.V.
    • LYUBOMIR GEORGIEV ZAGORCHEVCARSTEN MEYERASTRID RUTH FRANZTHOMAS HEIKO STEHLEJUERGEN WEESEFABIAN WENZELMARCEL BREEUWERVELJKO POPOVSEBASTIAN FLACKE
    • G01R33/56G01R33/48
    • G01R33/5608G01R33/4828
    • A measurement apparatus (800) to measure cortical thickness, the measurement apparatus may include at least one controller (810) which may be configured to: obtain magnetic resonance (MR) scan information of a region-of-interest of at least a portion of a cerebral cortex of a subject; form first, second and third meshes each comprising a plurality of points situated apart from each other, the first and third meshes being situated at inner and outer cortical boundary layers, respectively, of the cerebral cortex and the second mesh being situated between the first and third meshes; and/or for each of a plurality of points of the second mesh: determine a closest point of the first mesh and a closest point of the third mesh, determine a distance between the corresponding closest point of the first mesh and the corresponding closest point of the third mesh, said distance being corresponding with a cortical thickness.
    • 一种测量皮质厚度的测量装置(800),所述测量装置可以包括至少一个控制器(810),所述至少一个控制器(810)可以被配置为:获得至少一部分感兴趣区域的磁共振(MR)扫描信息 受试者的大脑皮层; 形成第一,第二和第三网格,每个网格包括彼此分开的多个点,所述第一和第三网格分别位于所述大脑皮层和所述第二网格的内皮层边缘层和所述第二网格之间,所述第二网格位于所述第一和第二网格之间, 第三个网格 和/或对于第二网格的多个点中的每一个确定第一网格的最近点和第三网格的最近点,确定第一网格的对应最近点与相应的最近点之间的距离 所述第三网格,所述距离对应于皮质厚度。