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    • 4. 发明申请
    • PHOTODETECTOR AND COMPUTED TOMOGRAPHY APPARATUS
    • 照相机和计算机摄影装置
    • US20140367576A1
    • 2014-12-18
    • US14282048
    • 2014-05-20
    • KABUSHIKI KAISHA TOSHIBA
    • Keita SASAKIShunsuke Kimura
    • G01J1/44
    • G01T1/248G01J1/44G01T1/1647G01T1/2018
    • A photodetector according to an embodiment includes: a photodetector element unit including a first cell array including a plurality of first cells arranged in an array and a second cell array including a plurality of second cells arranged in an array, each of the first and second cells including a photoelectric conversion element, the second cell array being arranged to be adjacent to the first cell array; a first pulse height analyzer unit analyzing a pulse height of an electrical signal outputted from the first cell array; a second pulse height analyzer unit analyzing a pulse height of an electrical signal outputted from the second cell array; and a signal processing unit determining non-uniformity of a distribution of photons entering the first and second cell arrays using an output signal of the first pulse height analyzer unit and an output signal of the second pulse height analyzer unit.
    • 根据实施例的光电检测器包括:光电检测器元件单元,包括包括排列成阵列的多个第一单元的第一单元阵列和包括排列成阵列的多个第二单元的第二单元阵列,第一单元阵列和第二单元 包括光电转换元件,所述第二单元阵列布置成与所述第一单元阵列相邻; 第一脉冲高度分析器单元,分析从第一单元阵列输出的电信号的脉冲高度; 第二脉冲高度分析器单元,分析从第二单元阵列输出的电信号的脉冲高度; 以及信号处理单元,其使用第一脉冲高度分析器单元的输出信号和第二脉冲高度分析器单元的输出信号来确定进入第一和第二单元阵列的光子的分布的不均匀性。
    • 9. 发明申请
    • IMAGING DEVICE
    • 成像装置
    • US20150241282A1
    • 2015-08-27
    • US14693661
    • 2015-04-22
    • KABUSHIKI KAISHA TOSHIBA
    • Hiroto HONDAKazuhiro SUZUKIHideyuki FUNAKIMasaki ATSUTAKeita SASAKIKoichi ISHIIHonam KWON
    • G01J5/06G01J5/12G01J5/02H04N5/33G01J5/22
    • G01J5/12G01J5/023G01J5/20G01J5/22G01J2005/0077H01L27/14649H04N5/33
    • An imaging device according to an embodiment includes: a semiconductor substrate; a reference pixel with a first concave portion disposed in a first portion of a surface of the semiconductor substrate; and one or more infrared detection pixels each configured to detect light with a second concave portion disposed in a second portion of the surface of the semiconductor substrate, the reference pixel being directly connected to the semiconductor substrate at a position where the first concave portion is not present, and including a first thermoelectric conversion unit configured to convert heat to an electric signal, the first thermoelectric conversion unit being disposed in the first concave portion and including a first thermoelectric conversion element, each infrared detection pixel including a second thermoelectric conversion unit being disposed in the second concave portion and including a second thermoelectric conversion element.
    • 根据实施例的成像装置包括:半导体衬底; 参考像素,其具有设置在所述半导体衬底的表面的第一部分中的第一凹部; 以及一个或多个红外检测像素,每个红外检测像素被配置为利用设置在所述半导体衬底的表面的第二部分中的第二凹部来检测光,所述参考像素在所述第一凹部不在所述位置处直接连接到所述半导体衬底 存在并且包括被配置为将热量转换为电信号的第一热电转换单元,第一热电转换单元设置在第一凹部中并且包括第一热电转换元件,每个红外检测像素包括第二热电转换单元, 在第二凹部中并且包括第二热电转换元件。
    • 10. 发明申请
    • RADIATION DETECTOR AND RADIATION DETECTION APPARATUS
    • 辐射探测器和辐射检测装置
    • US20150084149A1
    • 2015-03-26
    • US14478424
    • 2014-09-05
    • KABUSHIKI KAISHA TOSHIBA
    • Hitoshi YAGIRei HASEGAWAMasaki ATSUTAYasuharu HOSONOKeita SASAKIGo KAWATA
    • H01L27/146H01L31/0224
    • H01L27/14663H01L27/1463H01L27/14636H01L31/0224
    • A radiation detector according to an embodiment includes: a semiconductor substrate; a light detecting unit provided on a side of a first surface of the semiconductor substrate; a first insulating film provided covering the light detecting unit; a second insulating film covering the first insulating film; a scintillator provided on the second insulating film; an interconnection provided between the first and second insulating films, and connected to the light detecting unit; a first electrode connected to the interconnection through a bottom portion of the first opening; a second electrode provided on a region in the second surface of the semiconductor substrate, the region opposing at least a part of the light detecting unit; a second opening provided in a region surrounding the first electrode and not surrounding the second electrode; and an insulating resin layer covering the first and second electrodes and the first and second openings.
    • 根据实施例的辐射检测器包括:半导体衬底; 设置在所述半导体衬底的第一表面侧的光检测单元; 提供覆盖光检测单元的第一绝缘膜; 覆盖所述第一绝缘膜的第二绝缘膜; 设置在第二绝缘膜上的闪烁体; 设置在第一和第二绝缘膜之间并连接到光检测单元的互连; 通过第一开口的底部连接到互连的第一电极; 设置在所述半导体衬底的第二表面中的区域上的第二电极,所述区域与所述光检测单元的至少一部分相对; 第二开口,设置在围绕所述第一电极且不包围所述第二电极的区域中; 以及覆盖第一和第二电极以及第一和第二开口的绝缘树脂层。