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1. 发明授权

US06957910B1 Synchronized delta-VBE measurement system 有权
标题翻译：同步delta-VBE测量系统
公开(公告)号：US06957910B1
公开(公告)日：2005-10-25
申请号：US10835478
申请日：2004-04-28
申请人： Jun Wan , Peter R. Holloway , Gary E. Sheehan
发明人： Jun Wan , Peter R. Holloway , Gary E. Sheehan
IPC分类号： G01K7/01 , G01K7/16 , H01L35/00 , H03K17/06
CPC分类号： H03K17/063 , G01K7/01
摘要： A circuit in an integrated circuit for measuring temperature dependent voltages of a temperature sensing element includes a voltage generator circuit providing the temperature dependent voltages, a first sampling switch and a second sampling switch. The voltage generator circuit includes a temperature sensing element being excited by a first switched current and a second switched current. The first and second sampling switches sample a first voltage and a second voltage at the temperature sensing element while the temperature sensing element is being excited by the second current and the first current, respectively. Each of the first and second sampling switches includes a boosted switch circuit incorporating a pedestal voltage compensation circuit. The sampled first and second voltages are coupled to be stored on capacitors external to the integrated circuit. The difference between the first voltage and the second voltage is measured to determine the temperature of the integrated circuit.
摘要翻译：用于测量温度感测元件的温度相关电压的集成电路中的电路包括提供温度相关电压的电压发生器电路，第一采样开关和第二采样开关。电压发生器电路包括由第一开关电流和第二开关电流激励的温度感测元件。第一和第二采样开关分别在第二电流和第一电流激发温度感测元件时在温度感测元件处采样第一电压和第二电压。第一采样开关和第二采样开关中的每一个包括具有基座电压补偿电路的升压开关电路。采样的第一和第二电压被耦合以存储在集成电路外部的电容器上。测量第一电压和第二电压之间的差以确定集成电路的温度。

2. 发明授权

US06736540B1 Method for synchronized delta-VBE measurement for calculating die temperature 有权
标题翻译：用于计算模具温度的同步delta-VBE测量方法
公开(公告)号：US06736540B1
公开(公告)日：2004-05-18
申请号：US10375297
申请日：2003-02-26
申请人： Gary E. Sheehan , Jun Wan
发明人： Gary E. Sheehan , Jun Wan
IPC分类号： G01K701
CPC分类号： G01K7/01
摘要： A method for measuring a temperature of an integrated circuit is disclosed. The integrated circuit includes a temperature sensing element being excited by a first switched current and a second switched current. The method includes coupling a first capacitor to the temperature sensing element through a first switch and coupling a second capacitor to the temperature sensing element through a second switch. The first and second capacitors are external to the integrated circuit. The method further includes charging the first capacitor through the first switch to a first voltage when the temperature sensing element is being excited by the first switched current, charging the second capacitor through the second switch to a second voltage when the temperature sensing element is being excited by the second switched current, and measuring a difference between the first voltage and the second voltage to determine the temperature of the integrated circuit.
摘要翻译：公开了一种用于测量集成电路的温度的方法。集成电路包括由第一开关电流和第二开关电流激发的温度感测元件。该方法包括通过第一开关将第一电容器耦合到温度感测元件，并通过第二开关将第二电容器耦合到温度感测元件。第一和第二电容器在集成电路外部。该方法还包括当温度感测元件被第一开关电流激励时，将第一电容器通过第一开关充电到第一电压，当温度感测元件被激发时，通过第二开关将第二电容器充电到第二电压通过第二开关电流，并且测量第一电压和第二电压之间的差以确定集成电路的温度。

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