会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 3. 发明授权
    • Sub-word line driver circuit and semiconductor memory device having the same
    • 子字线驱动电路和半导体存储器件
    • US08279703B2
    • 2012-10-02
    • US12839454
    • 2010-07-20
    • Hyang-Ja YangJeong-Soo Park
    • Hyang-Ja YangJeong-Soo Park
    • G11C8/00H01L29/76H01L21/70
    • G11C8/08
    • A sub-word line driver includes a substrate, a plurality of gate lines and at least one gate tab. The substrate includes a plurality of isolation areas and a plurality of active areas, where the two active areas are separated by each isolation area, and the isolation areas and the active areas are extended in a first direction and are arranged in a second direction perpendicular to the first direction. The plurality of gate lines are formed on the substrate, where the gate lines are extended in a second direction and are arranged in the first direction. The at least one gate tab is formed on the substrate, where the at least one gate tab is extended in the first direction to cover the isolation area. Incorrect operation of the sub-word line driver may be prevented, and a power consumption of the sub-word line driver may be reduced.
    • 子字线驱动器包括衬底,多个栅极线和至少一个栅极突起。 衬底包括多个隔离区域和多个有效区域,其中两个有源区域由每个隔离区域分开,并且隔离区域和有源区域在第一方向上延伸并且沿垂直于 第一个方向。 多个栅极线形成在基板上,其中栅极线沿第二方向延伸并且沿第一方向布置。 所述至少一个栅极突片形成在所述基板上,其中所述至少一个栅极突片在所述第一方向上延伸以覆盖所述隔离区域。 可以防止子字线驱动器的不正确的操作,并且可以减少子字线驱动器的功耗。
    • 4. 发明授权
    • Semiconductor memory device and layout method thereof
    • 半导体存储器件及其布局方法
    • US07808852B2
    • 2010-10-05
    • US12230570
    • 2008-09-02
    • Hyang-Ja YangWol-Jin Lee
    • Hyang-Ja YangWol-Jin Lee
    • G11C7/00
    • G11C7/12G11C7/18
    • Example embodiments relate to a semiconductor memory device, for example, a semiconductor memory device including an efficient layout circuit and method thereof. The method may include sharing a first active area between a first precharger and a second precharger and sharing a second active area between a third precharger and a fourth precharger. The semiconductor memory device may include a level shifter configured to receive a first precharge control signal and boost a logic high level of the first precharge control signal to an external power supply voltage level to output a boosted first precharge control signal. The semiconductor memory device may further include first, second, third and fourth prechargers. The first and third prechargers may be configured to precharge data signals transmitted to a first and second pair of local input/output data lines to the first precharge voltage in response to the boosted first precharge control signal during a data read operation.
    • 示例性实施例涉及半导体存储器件,例如包括有效布局电路的半导体存储器件及其方法。 该方法可以包括在第一预充电器和第二预充电器之间共享第一有效区域并且在第三预充电器和第四预充电器之间共享第二有效区域。 半导体存储器件可以包括电平移位器,其被配置为接收第一预充电控制信号并将第一预充电控制信号的逻辑高电平升高到外部电源电压电平以输出升压的第一预充电控制信号。 半导体存储器件还可以包括第一,第二,第三和第四预充电器。 第一和第三预充电器可以被配置为在数据读取操作期间响应于升压的第一预充电控制信号而将传输到第一和第二对本地输入/输出数据线的数据信号预充电到第一预充电电压。
    • 9. 发明授权
    • Electrostatic discharge protection transistor for a semiconductor chip
    • 用于半导体芯片的静电放电保护晶体管
    • US06359313B1
    • 2002-03-19
    • US09313882
    • 1999-05-18
    • Hyang-Ja YangKook-Hwan Kwon
    • Hyang-Ja YangKook-Hwan Kwon
    • H01L2362
    • H01L27/0266H01L23/60H01L2924/0002H01L2924/00
    • An electrostatic discharge (ESD) protection transistor for discharging current from an ESD event present on an input/output pad. The ESD protection transistor is capable of improved discharging of excessive current without damage to the semiconductor device and to the ESD protection transistor itself. The ESD protection transistor includes a first conductive line connecting an input/output pad to the source and drain of the transistor at multiple points preventing the convergence of an excessive current at a certain point and ESD damage to the transistor. The transistor also includes a second conductive line formed on an insulating layer such that it does not overlap with the first conductive line.
    • 用于从存在于输入/输出焊盘上的ESD事件放电的静电放电(ESD)保护晶体管。 ESD保护晶体管能够改善对过电流的放电,而不损坏半导体器件和ESD保护晶体管本身。 ESD保护晶体管包括在多个点处将输入/输出焊盘连接到晶体管的源极和漏极的第一导线,以防止某一点处的过大电流的会聚和对晶体管的ESD损坏。 晶体管还包括形成在绝缘层上的第二导线,使得其不与第一导线重叠。