会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 3. 发明授权
    • High accuracy flow restrictor using crystal
    • 高精度限流器采用水晶
    • US06446513B1
    • 2002-09-10
    • US09593833
    • 2000-06-13
    • Richard C. Henderson
    • Richard C. Henderson
    • G01F137
    • G01F1/42
    • A flow meter for use in a flow stream with a tubular housing, including a fluid inlet and a fluid outlet, in the flow stream, with the inlet pressure exceeding the outlet pressure. The interior has an orifice defined in a crystalline silicon membrane, along crystal planes of the silicon so that the geometry of the orifices is precisely known and has a sharp knife edge rim profile. Where the fluid is a gas, pressure and temperature transducers measure conditions inside of the housing for application of gas law principles. By using instantaneous pressure and temperature in the chamber, mass flow through the outlet orifices of the chamber is computed and delivered as an output signal.
    • 一种用于流动流的流量计,其具有流体流中的管状壳体,包括流体入口和流体出口,入口压力超过出口压力。 内部具有限定在晶体硅膜中的孔,沿着硅的晶面,使得孔的几何形状是精确已知的并且具有锋利的刀刃边缘轮廓。 在流体是气体的情况下,压力和温度传感器测量壳体内的条件以应用气体法则原理。 通过在腔室中使用瞬时压力和温度,计算出通过腔室的出口孔的质量流量并作为输出信号传送。
    • 4. 发明授权
    • Method of controlling MOSFET threshold voltage with self-aligned channel
stop
    • 通过自对准通道停止来控制MOSFET阈值电压的方法
    • US4315781A
    • 1982-02-16
    • US142902
    • 1980-04-23
    • Richard C. Henderson
    • Richard C. Henderson
    • H01L21/033H01L21/265H01L21/266H01L21/76H01L21/8236H01L27/088H01L29/78H01L21/263H01L27/04
    • H01L21/266H01L21/033H01L21/26513H01L21/2652H01L21/8236
    • A process is provided for fabricating MOSFET devices having field source, gate and drain regions. The threshold voltage of both the channel and field regions of such devices is controlled by forming a comparatively thick oxide film on a semiconductor surface, defining enhancement mode transistor regions in the oxide film to expose portions of the semiconductor surface, implanting p-type ions under conditions such that the peak distribution of p-type atoms lies in the semi-conductor substrate just beneath the semiconductor/-oxide interface and counter-doping with n-type ions under conditions such that no implanted ions penetrate the oxide film. As a consequence, a desirably high threshold voltage is obtained in the field region, while a desirably low threshold voltage is obtained in the channel region. Depletion mode transistors are fabricated on the same wafer by masking the enhancement mode regions, defining depletion mode transistor regions in the oxide film to expose portions of the semiconductor surface and implanting n-type ions under conditions such that no ions penetrate the mask or oxide film. Metal gate or refractory gate technology is then employed to fabricate source, gate and drain regions and electrical contacts thereto. Parasitic conduction paths between neighboring transistors are substantially eliminated due to the peak distribution of p-type atoms in the field region.
    • 提供了一种用于制造具有场源,栅极和漏极区域的MOSFET器件的工艺。 通过在半导体表面上形成比较厚的氧化膜来控制这些器件的沟道和场区的阈值电压,在氧化物膜中限定增强模式晶体管区域以暴露半导体表面的部分,将p型离子注入 条件使得p型原子的峰分布位于刚好在半导体/ - 氧化物界面正下方的半导体衬底中,并且在没有注入离子穿透氧化物膜的条件下与n型离子相反掺杂的条件。 结果,在场区域中获得期望的高阈值电压,而在沟道区域中获得期望的低阈值电压。 消耗模式晶体管通过掩蔽增强模式区域而制造在相同的晶片上,限定氧化物膜中的耗尽型晶体管区域以暴露半导体表面的部分并且在没有离子穿透掩模或氧化物膜的条件下注入n型离子 。 然后使用金属栅极或难熔栅极技术来制造源极,栅极和漏极区域以及与其接触的电极。 由于场区域中p型原子的峰分布,相邻晶体管之间的寄生导电路径基本上被消除。
    • 5. 发明授权
    • Process for fabricating insulated-gate field-effect transistors with
self-aligned contacts
    • 制造具有自对准触点的绝缘栅场效应晶体管的工艺
    • US4149307A
    • 1979-04-17
    • US865355
    • 1977-12-28
    • Richard C. Henderson
    • Richard C. Henderson
    • H01L21/033H01L21/336H01L21/26
    • H01L29/66575H01L21/033Y10S148/02Y10S148/10Y10S148/103Y10S148/141
    • The specification describes a process for making an insulated-gate field-effect transistor wherein a silicon nitride mask is deposited above the surface of a semiconductor body and is used in one embodiment of the invention in conjunction with a refractory gate member (1) as a mask in the formation of the source and drain regions by the ion implantation of conductivity-type-determining impurities on both sides of the gate and (2) as a mask in the formation of contact holes to the source and drain regions of the transistor for the subsequent provision of metal contacts to these regions. In another embodiment, there is described a process for forming source and drain contacts wherein the mask for the formation of contact holes by oxide etching is also the pattern definition and lift-off mask for the formation of metal contacts to the transistor.
    • 本说明书描述了一种用于制造绝缘栅场效应晶体管的工艺,其中氮化硅掩模沉积在半导体主体的表面上方,并且在本发明的一个实施例中与耐火门构件(1)一起使用,作为 通过离子注入栅极两侧的导电型确定杂质形成源极和漏极区域的掩模,以及(2)作为形成与晶体管的源极和漏极区域的接触孔的掩模, 随后向这些地区提供金属接触。 在另一个实施例中,描述了用于形成源极和漏极接触的方法,其中用于通过氧化物蚀刻形成接触孔的掩模也是用于形成到晶体管的金属接触的图案定义和剥离掩模。
    • 7. 发明授权
    • Miniature pulsatile flow controller
    • 微型脉动流量控制器
    • US06247493B1
    • 2001-06-19
    • US09521298
    • 2000-03-09
    • Richard C. Henderson
    • Richard C. Henderson
    • F16K3102
    • G05D7/0641Y10T137/0379Y10T137/7761
    • A miniature flow controller housing a fluid inlet and a fluid outlet, with the inlet pressure exceeding the outlet pressure. The outlet has orifices defined in a crystalline silicon membrane, along crystal planes of the silicon so that the geometry of the orifices is precisely known. The inlet and outlet are throttled by poppets which can seal the orifices on command of a device controller. The poppets are driven by shape retentive membranes which have two states, an open state and a closed state with a state change caused by application of small amounts of current to a resistive element in contact with the membrane. Rapid actuation of the poppets causes operation of the valve in a pulse mode. Where the fluid is a gas, pressure and temperature transducers measure conditions inside of the housing for application of gas law principles. By recording instantaneous pressure and temperature in the chamber, as the poppets are actuated, mass flow through the outlet orifices of the chamber is computed.
    • 容纳流体入口和流体出口的微型流量控制器,其入口压力超过出口压力。 出口具有限定在晶体硅膜中的孔,沿着硅的晶面定义,使得孔的几何形状是精确已知的。 入口和出口通过可以根据设备控制器的命令密封孔的弹簧节流。 弹簧由形状保持膜驱动,其具有两种状态,即通过向与膜接触的电阻元件施加少量电流而导致状态变化的打开状态和闭合状态。 弹簧的快速致动导致阀处于脉冲模式。 在流体是气体的情况下,压力和温度传感器测量壳体内的条件以应用气体法则原理。 通过在室中记录瞬时压力和温度,当弹簧被致动时,计算通过腔室的出口孔的质量流量。