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1. 发明授权

US08139231B2 Machine vision technique for manufacturing semiconductor wafers 有权
标题翻译：用于制造半导体晶片的机器视觉技术
公开(公告)号：US08139231B2
公开(公告)日：2012-03-20
申请号：US12113492
申请日：2008-05-01
申请人： John W. Schwab , Gang Liu , David J. Michael
发明人： John W. Schwab , Gang Liu , David J. Michael
IPC分类号： G01B11/14
CPC分类号： H01L31/022425 , H01L21/681 , H01L21/682 , H01L31/18 , Y02E10/50
摘要： A vision system is provided to determine a positional relationship between a photovoltaic device wafer on a platen and a printing element, such as a printing screen, on a remote side of the photovoltaic device wafer from the platen. A source emits ultraviolet light along a path that is transverse to a longitudinal axis of an aperture through the platen, and a diffuser panel is located along that path. A reflector directs the light from the diffuser panel toward the aperture. A video camera is located along the longitudinal axis of the aperture and produces an image using light received from the platen aperture, wherein some of that received light was reflected by the wafer. A band-pass filter is placed in front of the camera to block ambient light. The use of diffused ultraviolet light enhances contrast in the image between the wafer and the printing element.
摘要翻译：提供了一种视觉系统，用于确定平台上的光伏器件晶片与光伏器件晶片远离印版的远程侧的印刷元件（例如印刷丝网）之间的位置关系。源沿着与穿过压板的孔的纵向轴线横向的路径发射紫外光，并且漫射板位于沿着该路径的位置。反射器将来自扩散板的光引向光圈。摄像机沿着孔的纵向轴线定位，并使用从压板孔接收的光产生图像，其中一些接收的光被晶片反射。带通滤波器放置在相机的前面以阻挡环境光。使用扩散的紫外光增强了晶片和印刷元件之间的图像的对比度。

2. 发明申请

US20090274361A1 MACHINE VISION TECHNIQUE FOR MANUFACTURING SEMICONDUCTOR WAFERS 有权
标题翻译：制造半导体波长的机器视觉技术
公开(公告)号：US20090274361A1
公开(公告)日：2009-11-05
申请号：US12113492
申请日：2008-05-01
申请人： John W. Schwab , Gang Liu , David J. Michael
发明人： John W. Schwab , Gang Liu , David J. Michael
IPC分类号： G06K9/00
CPC分类号： H01L31/022425 , H01L21/681 , H01L21/682 , H01L31/18 , Y02E10/50
摘要： A vision system is provided to determine a positional relationship between a photovoltaic device wafer on a platen and a printing element, such as a printing screen, on a remote side of the photovoltaic device wafer from the platen. A source emits ultraviolet light along a path that is transverse to a longitudinal axis of an aperture through the platen, and a diffuser panel is located along that path. A reflector directs the light from the diffuser panel toward the aperture. A video camera is located along the longitudinal axis of the aperture and produces an image using light received from the platen aperture, wherein some of that received light was reflected by the wafer. A band-pass filter is placed in front of the camera to block ambient light. The use of diffused ultraviolet light enhances contrast in the image between the wafer and the printing element.
摘要翻译：提供了一种视觉系统，用于确定平台上的光伏器件晶片与光伏器件晶片远离印版的远程侧的印刷元件（例如印刷丝网）之间的位置关系。源沿着与穿过压板的孔的纵向轴线横向的路径发射紫外光，并且漫射板位于沿着该路径的位置。反射器将来自扩散板的光引向光圈。摄像机沿着孔的纵向轴线定位，并使用从压板孔接收的光产生图像，其中一些接收的光被晶片反射。带通滤波器放置在相机的前面以阻挡环境光。使用扩散的紫外光增强了晶片和印刷元件之间的图像的对比度。

3. 发明授权

US08189194B2 Direct illumination machine vision technique for processing semiconductor wafers 有权
标题翻译：用于处理半导体晶片的直接照明机器视觉技术
公开(公告)号：US08189194B2
公开(公告)日：2012-05-29
申请号：US12209248
申请日：2008-09-12
申请人： John W. Schwab , Gang Liu , David J. Michael , Lei Wang
发明人： John W. Schwab , Gang Liu , David J. Michael , Lei Wang
IPC分类号： G01B11/00
CPC分类号： G03F9/00 , G03F9/7065 , G03F9/7084 , G03F9/7088
摘要： A vision system is provided to determine a positional relationship between a semiconductor wafer on a platen and an element on a processing machine, such as a printing screen, on a remote side of the semiconductor wafer from the platen. A source directs ultraviolet light through an aperture in the platen to illuminate the semiconductor wafer and cast a shadow onto the element adjacent an edge of the semiconductor wafer. A video camera produces an image using light received from the platen aperture, wherein some of that received light was reflected by the wafer. The edge of the semiconductor wafer in the image is well defined by a dark/light transition.
摘要翻译：提供了一种视觉系统，用于确定压板上的半导体晶片与半导体晶片的远离压纸台的诸如印刷屏幕的处理机器上的元件之间的位置关系。光源通过压板中的孔引导紫外光照射半导体晶片并将阴影投射到与半导体晶片的边缘相邻的元件上。摄像机使用从压板孔接收的光产生图像，其中一些所接收的光被晶片反射。图像中的半导体晶片的边缘由暗/光转变很好地限定。

4. 发明申请

US20100065757A1 DIRECT ILLUMINATION MACHINE VISION TECHNIQUE FOR PROCESSING SEMICONDUCTOR WAFERS 有权
标题翻译：直接照明机器视觉技术处理半导体波形
公开(公告)号：US20100065757A1
公开(公告)日：2010-03-18
申请号：US12209248
申请日：2008-09-12
申请人： John W. Schwab , Gang Liu , David J. Michael , Lei Wang
发明人： John W. Schwab , Gang Liu , David J. Michael , Lei Wang
IPC分类号： G01N23/00 , G01B11/00 , G02B27/30
CPC分类号： G03F9/00 , G03F9/7065 , G03F9/7084 , G03F9/7088
摘要： A vision system is provided to determine a positional relationship between a semiconductor wafer on a platen and an element on a processing machine, such as a printing screen, on a remote side of the semiconductor wafer from the platen. A source directs ultraviolet light through an aperture in the platen to illuminate the semiconductor wafer and cast a shadow onto the element adjacent an edge of the semiconductor wafer. A video camera produces an image using light received from the platen aperture, wherein some of that received light was reflected by the wafer. The edge of the semiconductor wafer in the image is well defined by a dark/light transition.
摘要翻译：提供了一种视觉系统，用于确定压板上的半导体晶片与半导体晶片的远离压纸台的诸如印刷屏幕的处理机器上的元件之间的位置关系。光源通过压板中的孔引导紫外光照射半导体晶片并将阴影投射到与半导体晶片的边缘相邻的元件上。摄像机使用从压板孔接收的光产生图像，其中一些所接收的光被晶片反射。图像中的半导体晶片的边缘由暗/光转变很好地限定。

5. 发明申请

US20080050006A1 Method and apparatus for semiconductor wafer alignment 有权
标题翻译：用于半导体晶片对准的方法和装置
公开(公告)号：US20080050006A1
公开(公告)日：2008-02-28
申请号：US11508551
申请日：2006-08-23
申请人： David J. Michael , James Clark , Gang Liu
发明人： David J. Michael , James Clark , Gang Liu
IPC分类号： G06K9/00
CPC分类号： H01L21/681 , G06T7/73
摘要： The invention provides, in some aspects, a wafer alignment system comprising an image acquisition device, an illumination source, a rotatable wafer platform, and an image processor that includes functionality for mapping coordinates in an image of an article (such as a wafer) on the platform to a “world” frame of reference at each of a plurality of angles of rotation of the platform.
摘要翻译：本发明在一些方面提供了一种晶片对准系统，其包括图像获取装置，照明源，可旋转晶片平台和图像处理器，该图像处理器包括用于将物品（例如晶片）的图像中的坐标映射到平台在平台的多个旋转角度的每一个处以“世界”参照系。

6. 发明授权

US08588511B2 Method and apparatus for automatic measurement of pad geometry and inspection thereof 有权
标题翻译：用于自动测量垫几何形状和检查方法和装置
公开(公告)号：US08588511B2
公开(公告)日：2013-11-19
申请号：US11613087
申请日：2006-12-19
申请人： Gang Liu , Aaron S. Wallack , David J. Michael
发明人： Gang Liu , Aaron S. Wallack , David J. Michael
IPC分类号： G06K9/00 , G06K9/48 , H04N7/18
CPC分类号： G06T7/0006 , G01N21/956 , G06T2207/30148 , H01L22/12
摘要： An image of a semiconductor interconnection pad is analyzed to determine a geometric description of the zone regions of a multiple zone semiconductor interconnection pad. Edge detection machine vision tools are used to extract features in the image. The extracted features are analyzed to derive geometric descriptions of the zone regions of the pad, that are applied in semiconductor device inspection, fabrication, and assembly operations.
摘要翻译：分析半导体互连焊盘的图像以确定多区域半导体互连焊盘的区域区域的几何描述。边缘检测机视觉工具用于提取图像中的特征。分析所提取的特征以得出在半导体器件检查，制造和组装操作中应用的焊盘区域的几何描述。

7. 发明授权

US08162584B2 Method and apparatus for semiconductor wafer alignment 有权
标题翻译：用于半导体晶片对准的方法和装置
公开(公告)号：US08162584B2
公开(公告)日：2012-04-24
申请号：US11508551
申请日：2006-08-23
申请人： David J. Michael , James Clark , Gang Liu
发明人： David J. Michael , James Clark , Gang Liu
IPC分类号： G06K9/00 , H01L21/677
CPC分类号： H01L21/681 , G06T7/73
摘要： The invention provides, in some aspects, a wafer alignment system comprising an image acquisition device, an illumination source, a rotatable wafer platform, and an image processor that includes functionality for mapping coordinates in an image of an article (such as a wafer) on the platform to a “world” frame of reference at each of a plurality of angles of rotation of the platform.
摘要翻译：本发明在一些方面提供了一种晶片对准系统，其包括图像获取装置，照明源，可旋转晶片平台和图像处理器，该图像处理器包括用于将物品（例如晶片）的图像中的坐标映射到平台在平台的多个旋转角度的每一个处以“世界”参照系。

8. 发明授权

US10914361B2 Multi-gear torquer 有权
公开(公告)号：US10914361B2
公开(公告)日：2021-02-09
申请号：US16201979
申请日：2018-11-27
申请人： Gang Liu
发明人： Gang Liu
IPC分类号： F16H1/28 , F16H57/04 , F16H3/44 , F16H57/031 , F16H57/038
摘要： Disclosed is a multi-gear torquer with end covers on both sides of the casing. An input shaft and an output shaft are respectively arranged at the center of the two end covers. A sun gear is fixed on the input shaft and moves along a planet gear engaged in the transmission mechanism. The planet gear meshes with a gear ring and moves around the sun gear, then the planet gear drives the turntable centrally fixed with the output shaft connected to the load end. The multi-gear torquer disclosed herein has the following advantages: large output torque and high mechanical efficiency, and it can be used as power transmission equipment for a car or a train and used as other mechanical transmission equipment.

9. 发明授权

US10670143B2 Motor 审中-公开
公开(公告)号：US10670143B2
公开(公告)日：2020-06-02
申请号：US15939342
申请日：2018-03-29
申请人： Gang Liu
发明人： Gang Liu
IPC分类号： F16H1/32 , F16H61/662 , H02K7/116 , H02K1/27 , F16H61/14 , H02K21/16 , F16H57/02
摘要： A motor with a variable-speed torque converter is disclosed. A rotor of the motor has a common permanent magnet structure. Permanent magnets are disposed on the rotor. The variable-speed torque converter includes a wheel disc, a wheel ring, a roller, a transmission gear II, a transmission gear III, a round wheel, an annular gear, a driving gear, turning discs, a transmission shaft, and an output shaft. The driving gear fixedly connected to the transmission shaft of the motor drives the transmission gear. The transmission gear is in contact with the annular gear. The transmission gear rotates around the driving gear to drive the wheel disc to rotate together. The wheel disc is fixedly connected to the output shaft to drive a driving wheel to rotate. Therefore, a working capability of the motor is enhanced. The converter can be applied to an electromotor, a generator, or any other power device.

10. 发明授权

US09883797B1 System and method for automatically tracking a contact lens in a wearer's eye 有权
公开(公告)号：US09883797B1
公开(公告)日：2018-02-06
申请号：US14277139
申请日：2014-05-14
申请人： Gang Liu , Lei Wang , Lowell D. Jacobson
发明人： Gang Liu , Lei Wang , Lowell D. Jacobson
IPC分类号： A61B3/14 , A61B3/10 , A61B3/00 , A61B3/113
CPC分类号： A61B3/113 , A61B3/0041 , A61B3/14 , G06K9/0061
摘要： A system and method for automated determination of position and movement of a contact lens with respect to a subject wearer's eye based upon a complimentary pair of images, acquired in rapid succession, in which one image of the pair is acquired using light that allows viewing of the pupil and/or limbus through the lens and the other image is acquired using light that is absorbed by the lens to generate an opaque image with a defined edge relative to the surrounding sclera. The images of the pair are acquired in close enough temporal proximity to ensure that eye movement in the interval therebetween is insignificant and both images are in the same approximate reference frame. Thus, the location of the pupil and limbus in one image can be accurately compared with the location of the contact lens edge in the other image.

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