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1. 发明申请

US20140070828A1 METHOD AND APPARATUS FOR MASSIVELY PARALLEL MULTI-WAFER TEST 有权
标题翻译：用于大规模并行多波长测试的方法和装置
公开(公告)号：US20140070828A1
公开(公告)日：2014-03-13
申请号：US13609154
申请日：2012-09-10
申请人： John W. Andberg , Ira H. Leventhal , Matthew W. Losey , Yohannes Desta , Lakshmikanth Namburi , Vincent E. Lopopolo , Sanjeev Grover , Erik Volkerink
发明人： John W. Andberg , Ira H. Leventhal , Matthew W. Losey , Yohannes Desta , Lakshmikanth Namburi , Vincent E. Lopopolo , Sanjeev Grover , Erik Volkerink
IPC分类号： G01R1/073 , G01R35/00 , G01R1/04
CPC分类号： G01R1/073 , G01R1/0408 , G01R31/2891 , G01R31/2893 , G01R35/005
摘要： Disclosed herein is a cost effective, efficient, massively parallel multi-wafer test cell. Additionally, this test cell can be used for both single-touchdown and multiple-touchdown applications. The invention uses a novel “split-cartridge” design, combined with a method for aligning wafers when they are separated from the probe card assembly, to create a cost effective, efficient multi-wafer test cell. A “probe-card stops” design may be used within the cartridge to simplify the overall cartridge design and operation.
摘要翻译：本文公开了一种成本有效，高效，大规模并行的多晶圆测试电池。此外，该测试单元可用于单触地板和多触地应用。本发明使用新颖的“分离式墨盒”设计，结合将晶片与探针卡组件分离时对准的方法，以创建成本有效的，高效的多晶圆测试单元。可以在墨盒内使用“探针卡停止”设计，以简化总体墨盒的设计和操作。

2. 发明授权

US09335347B2 Method and apparatus for massively parallel multi-wafer test 有权
标题翻译：用于大规模并行多晶片测试的方法和装置
公开(公告)号：US09335347B2
公开(公告)日：2016-05-10
申请号：US13609154
申请日：2012-09-10
申请人： John W. Andberg , Ira H. Leventhal , Matthew W. Losey , Yohannes Desta , Lakshmikanth Namburi , Vincent E. Lopopolo , Sanjeev Grover , Erik Volkerink
发明人： John W. Andberg , Ira H. Leventhal , Matthew W. Losey , Yohannes Desta , Lakshmikanth Namburi , Vincent E. Lopopolo , Sanjeev Grover , Erik Volkerink
IPC分类号： G01R31/28 , G01R1/04 , G01R1/073 , G01R35/00
CPC分类号： G01R1/073 , G01R1/0408 , G01R31/2891 , G01R31/2893 , G01R35/005
摘要： Disclosed herein is a cost effective, efficient, massively parallel multi-wafer test cell. Additionally, this test cell can be used for both single-touchdown and multiple-touchdown applications. The invention uses a novel “split-cartridge” design, combined with a method for aligning wafers when they are separated from the probe card assembly, to create a cost effective, efficient multi-wafer test cell. A “probe-card stops” design may be used within the cartridge to simplify the overall cartridge design and operation.
摘要翻译：本文公开了一种成本有效，高效，大规模并行的多晶圆测试电池。此外，该测试单元可用于单触地板和多触地应用。本发明使用新颖的“分离式墨盒”设计，结合将晶片与探针卡组件分离时对准的方法，以创建成本有效的，高效的多晶圆测试单元。可以在墨盒内使用“探针卡停止”设计，以简化总体墨盒的设计和操作。

3. 发明申请

US20130135002A1 TEST ELECTRONICS TO DEVICE UNDER TEST INTERFACES, AND METHODS AND APPARATUS USING SAME 审中-公开
标题翻译：测试电子仪器在测试接口下的设备，以及使用它的方法和设备
公开(公告)号：US20130135002A1
公开(公告)日：2013-05-30
申请号：US13742183
申请日：2013-01-15
申请人： Sanjeev Grover , Donald W. Chiu , John W. Andberg
发明人： Sanjeev Grover , Donald W. Chiu , John W. Andberg
IPC分类号： G01R31/26
CPC分类号： G01R31/2601 , G01R31/2889
摘要： In one embodiment, an interface includes a plurality of test electronics to DUT interfaces. Each test electronics to DUT interface has at least one test electronics interface, at least one DUT interface, and an electrical coupling between the at least one test electronics interface and the at least one DUT interface. First and second subsets of the DUT interfaces are respectively positioned along the perimeters of first and second concentric shapes.
摘要翻译：在一个实施例中，接口包括多个测试电子器件到DUT接口。每个测试电子设备到DUT接口具有至少一个测试电子接口，至少一个DUT接口以及所述至少一个测试电子接口和所述至少一个DUT接口之间的电耦合。 DUT接口的第一和第二子集分别沿着第一和第二同心形状的周边定位。

4. 发明授权

US08354853B2 Test electronics to device under test interfaces, and methods and apparatus using same 有权
标题翻译：测试电子设备到被测设备的接口，以及使用它们的方法和设备
公开(公告)号：US08354853B2
公开(公告)日：2013-01-15
申请号：US12626506
申请日：2009-11-25
申请人： Sanjeev Grover , Donald W. Chiu , John W. Andberg
发明人： Sanjeev Grover , Donald W. Chiu , John W. Andberg
IPC分类号： G01R31/00
CPC分类号： G01R31/2601 , G01R31/2889
摘要： In one embodiment, a test system has a set of test electronics for testing a device under test (DUT). The test system also has at least one test electronics to DUT interface having a zero insertion force (ZIF) connector. Each ZIF connector has a ZIF connector to DUT clamping mechanism configured to i) apply a first orthogonal force to a probe card that interfaces with a DUT, by pressing the ZIF connector against the probe card, and simultaneously ii) exert at least one second orthogonal force on the probe card, the at least one second orthogonal force being opposite in direction to the first orthogonal force.
摘要翻译：在一个实施例中，测试系统具有用于测试被测设备（DUT）的一组测试电子装置。测试系统还具有至少一个具有零插入力（ZIF）连接器的DUT接口的测试电子器件。每个ZIF连接器具有ZIF连接器到DUT夹持机构，该ZIF连接器被配置为：i）通过将ZIF连接器压靠在探针卡上，向与DUT接口的探针卡施加第一正交力，并且同时施加至少一个第二正交所述至少一个第二正交力在与所述第一正交力相反的方向上相反。

5. 发明申请

US20100134134A1 TEST ELECTRONICS TO DEVICE UNDER TEST INTERFACES, AND METHODS AND APPARATUS USING SAME 有权
标题翻译：测试电子仪器在测试接口下的设备，以及使用它的方法和设备
公开(公告)号：US20100134134A1
公开(公告)日：2010-06-03
申请号：US12626506
申请日：2009-11-25
申请人： Sanjeev Grover , Donald W. Chiu , John W. Andberg
发明人： Sanjeev Grover , Donald W. Chiu , John W. Andberg
IPC分类号： G01R31/02
CPC分类号： G01R31/2601 , G01R31/2889
摘要： In one embodiment, a test system has a set of test electronics for testing a device under test (DUT). The test system also has at least one test electronics to DUT interface having a zero insertion force (ZIF) connector. Each ZIF connector has a ZIF connector to DUT clamping mechanism configured to i) apply a first orthogonal force to a probe card that interfaces with a DUT, by pressing the ZIF connector against the probe card, and simultaneously ii) exert at least one second orthogonal force on the probe card, the at least one second orthogonal force being opposite in direction to the first orthogonal force.
摘要翻译：在一个实施例中，测试系统具有用于测试被测设备（DUT）的一组测试电子装置。测试系统还具有至少一个具有零插入力（ZIF）连接器的DUT接口的测试电子器件。每个ZIF连接器具有ZIF连接器到DUT夹持机构，该ZIF连接器被配置为：i）通过将ZIF连接器压靠在探针卡上，向与DUT接口的探针卡施加第一正交力，并且同时施加至少一个第二正交所述至少一个第二正交力在与所述第一正交力相反的方向上相反。

6. 发明授权

US07717715B2 System, method and apparatus using at least one flex circuit to connect a printed circuit board and a socket card assembly that are oriented at a right angle to one another 有权
标题翻译：使用至少一个柔性电路来连接彼此成直角定向的印刷电路板和插座卡组件的系统，方法和装置
公开(公告)号：US07717715B2
公开(公告)日：2010-05-18
申请号：US11688757
申请日：2007-03-20
申请人： Sanjeev Grover , Benson Morris , Todd Sholl , Stephen Bellato , Kenneth D. Karklin
发明人： Sanjeev Grover , Benson Morris , Todd Sholl , Stephen Bellato , Kenneth D. Karklin
IPC分类号： H01R12/00
CPC分类号： G01R31/2889 , H01R12/7023 , H01R12/7082 , H01R31/005 , H05K1/147
摘要： There is disclosed apparatus for routing signals between at least one PCB within a test head and a socket card assembly. In an embodiment, the apparatus may include at least one flexible circuit electrically connecting first and second sides of the PCB and the socket card assembly with one another, and the flexible circuit having a defined shape configured to interface with the socket card assembly and the PCB along substantially perpendicular planes. Methods of routing signals between at least one PCB within a test head and a socket card assembly are disclosed. In one embodiment, a method may include electrically connecting first and second sides of the PCB and the socket card assembly with one another with at least one flexible circuit having a defined shape configured to interface with the socket card assembly and the PCB along substantially perpendicular planes. Other embodiments are also disclosed.
摘要翻译：公开了用于在测试头内的至少一个PCB和插座卡组件之间路由信号的装置。在一个实施例中，该装置可以包括将PCB和插座卡组件的第一和第二侧彼此电连接的至少一个柔性电路，并且柔性电路具有被配置为与插座卡组件和PCB 沿着基本垂直的平面。公开了在测试头内的至少一个PCB和插座卡组件之间路由信号的方法。在一个实施例中，一种方法可以包括将PCB和插座卡组件的第一和第二侧彼此电连接，其中至少一个柔性电路具有限定的形状，其被配置成与插座卡组件和PCB基本垂直的平面。还公开了其他实施例。

7. 发明授权

US07696744B2 Screw-less latching system for securing load boards 有权
标题翻译：无负载锁定系统，用于固定负载板
公开(公告)号：US07696744B2
公开(公告)日：2010-04-13
申请号：US11998614
申请日：2007-11-29
申请人： Todd James Sholl , Noriyuki Sugihara , Sanjeev Grover , Stephen Bellato , Benson Morris
发明人： Todd James Sholl , Noriyuki Sugihara , Sanjeev Grover , Stephen Bellato , Benson Morris
IPC分类号： G01R31/00 , G06F1/16
CPC分类号： H05K7/1407
摘要： A screw-less latching system for securing load boards comprises a frame and a backer plate. The frame includes a loading site for a device under test. The loading site includes a first tee clamp disposed along a first longitudinal axis and a second tee clamp disposed along a second longitudinal axis of the loading site. The loading site further includes a first spring plunger disposed along a first lateral axis of the loading site. The backer plate is configured to attach the device under test. The backer plate includes two lock tabs coupling with the first and second tee clamps. The backer plate further includes a first recess coupling with the first spring plunger.
摘要翻译：用于固定负载板的无螺纹锁定系统包括框架和支撑板。该框架包括被测设备的装载位置。装载位置包括沿着第一纵向轴线设置的第一T形夹具和沿着装载位置的第二纵向轴线设置的第二T形夹具。装载位置还包括沿着装载位置的第一横向轴线设置的第一弹簧柱塞。支撑板被配置为附接被测设备。支撑板包括与第一和第二T形夹相连的两个锁定片。支撑板还包括与第一弹簧柱塞联接的第一凹部。

8. 发明申请

US20090141463A1 Screw-less latching system for securing load boards 有权
标题翻译：无负载锁定系统，用于固定负载板
公开(公告)号：US20090141463A1
公开(公告)日：2009-06-04
申请号：US11998614
申请日：2007-11-29
申请人： Todd James Sholl , Noriyuki Sugihara , Sanjeev Grover , Stephen Bellato , Benson Morris
发明人： Todd James Sholl , Noriyuki Sugihara , Sanjeev Grover , Stephen Bellato , Benson Morris
IPC分类号： G06F1/16 , H05K5/00 , H02B1/20
CPC分类号： H05K7/1407
摘要： A screw-less latching system for securing load boards comprises a frame and a backer plate. The frame includes a loading site for a device under test. The loading site includes a first tee clamp disposed along a first longitudinal axis and a second tee clamp disposed along a second longitudinal axis of the loading site. The loading site further includes a first spring plunger disposed along a first lateral axis of the loading site. The backer plate is configured to attach the device under test. The backer plate includes two lock tabs coupling with the first and second tee clamps. The backer plate further includes a first recess coupling with the first spring plunger.
摘要翻译：用于固定负载板的无螺纹锁定系统包括框架和支撑板。该框架包括被测设备的装载位置。装载位置包括沿着第一纵向轴线设置的第一T形夹具和沿着装载位置的第二纵向轴线设置的第二T形夹具。装载位置还包括沿着装载位置的第一横向轴线设置的第一弹簧柱塞。支撑板被配置为附接被测设备。支撑板包括与第一和第二T形夹相连的两个锁定片。支撑板还包括与第一弹簧柱塞联接的第一凹部。

9. 发明申请

US20080233769A1 Right Angle Connection System for ATE Interface 有权
标题翻译：用于ATE接口的直角连接系统
公开(公告)号：US20080233769A1
公开(公告)日：2008-09-25
申请号：US11688757
申请日：2007-03-20
申请人： Sanjeev Grover , Benson Morris , Todd Sholl , Stephen Bellato , Kenneth D. Karklin
发明人： Sanjeev Grover , Benson Morris , Todd Sholl , Stephen Bellato , Kenneth D. Karklin
IPC分类号： H05K1/00
CPC分类号： G01R31/2889 , H01R12/7023 , H01R12/7082 , H01R31/005 , H05K1/147
摘要： There is disclosed apparatus for routing signals between at least one PCB within a test head and a socket card assembly. In an embodiment, the apparatus may include at least one flexible circuit electrically connecting first and second sides of the PCB and the socket card assembly with one another, and the flexible circuit having a defined shape configured to interface with the socket card assembly and the PCB along substantially perpendicular planes. Methods of routing signals between at least one PCB within a test head and a socket card assembly are disclosed. In one embodiment, a method may include electrically connecting first and second sides of the PCB and the socket card assembly with one another with at least one flexible circuit having a defined shape configured to interface with the socket card assembly and the PCB along substantially perpendicular planes. Other embodiments are also disclosed.
摘要翻译：公开了用于在测试头内的至少一个PCB和插座卡组件之间路由信号的装置。在一个实施例中，该装置可以包括将PCB和插座卡组件的第一和第二侧彼此电连接的至少一个柔性电路，并且柔性电路具有被配置为与插座卡组件和PCB 沿着基本垂直的平面。公开了在测试头内的至少一个PCB和插座卡组件之间路由信号的方法。在一个实施例中，一种方法可以包括将PCB和插座卡组件的第一和第二侧彼此电连接，其中至少一个柔性电路具有限定的形状，其被配置成与插座卡组件和PCB基本垂直的平面。还公开了其他实施例。

10. 发明授权

US06139839A Control of infectious microorganisms by modulation of chorionic gonadotropin-related protein activity 失效
标题翻译：通过调节绒毛膜促性腺激素相关蛋白活性控制感染性微生物
公开(公告)号：US06139839A
公开(公告)日：2000-10-31
申请号：US158565
申请日：1998-09-22
申请人： William D. Odell , Jeanine T. Griffin , Sanjeev Grover , Omar Caticha , Douglas T. Carrell , Marion L. Woods, II
发明人： William D. Odell , Jeanine T. Griffin , Sanjeev Grover , Omar Caticha , Douglas T. Carrell , Marion L. Woods, II
IPC分类号： A61K38/00 , A61P5/02 , A61P31/04 , C07K16/26 , A61K39/395 , A61K39/00 , C07K16/00
CPC分类号： C07K16/26 , A61K2039/505 , A61K38/00
摘要： A method of controlling, in a warm-blooded animal, an infectious microorganism expressing a chorionic gonadotropin-like growth-regulating protein comprises modulating the activity of the protein by administering to the warm-blooded animal an effective amount of an antibody capable of inhibiting the activity of the protein, the chorionic gonadotropin-like growth-regulating protein itself such that the animal develops a neutralizing immune response, or peptides that block the receptors of the chorionic gonadotropin-like growth-regulating protein in the infectious microorganism. Candida albicans is one such microorganism that can be controlled by delivering an antibody against the growth-regulating protein, CaCGLP. Mycobacteria can also be controlled by this method. A method of inhibiting transition of Candida albicans blastospores in vitro by contacting the blastospores with an antibody against CaCGLP is also disclosed. A method of inhibiting growth of mycobacteria in vitro comprises contacting the mycobacteria with an antibody against an endogenous chorionic gonadotropin-like growth-regulating protein. In vitro growth of microorganisms can also be stimulated by contacting the microorganism with a chorionic gonadotropin-like growth-regulating protein.
摘要翻译：在温血动物中，控制表达绒毛膜促性腺激素样生长调节蛋白的感染性微生物的方法包括通过向温血动物施用有效量的能抑制绒毛膜促性腺激素生长调节蛋白的抗体来调节蛋白质的活性蛋白质的活性，绒毛膜促性腺激素样生长调节蛋白本身使得动物产生中和免疫应答，或阻断感染性微生物中绒毛膜促性腺激素样生长调节蛋白的受体的肽。白色念珠菌是一种这样的微生物，其可以通过递送针对生长调节蛋白CaCGLP的抗体来控制。分枝杆菌也可以通过这种方法进行控制。还公开了通过使胚泡与抗CaCGLP的抗体接触来抑制白色念珠菌胚轴的转化的方法。一种在体外抑制分枝杆菌生长的方法包括使分枝杆菌与抗内源性绒毛膜促性腺激素样生长调节蛋白的抗体接触。微生物的体外生长也可以通过使微生物与绒毛膜促性腺激素样生长调节蛋白接触来刺激。

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