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    • 1. 发明授权
    • Sliding contact test apparatus
    • 滑动接触试验装置
    • US5034749A
    • 1991-07-23
    • US410315
    • 1989-09-21
    • John R. JungblutDavid A. Bruno
    • John R. JungblutDavid A. Bruno
    • G01R31/00G01R3/00G01R31/01
    • G01R31/013G01R3/00
    • The apparatus (20) includes electrically conductive contacts (44, 54) that are spaced apart a distance slightly less than the distance between the terminals (34, 36) formed on the components (24) to be tested. One contact (54) is held in position by a spring (112). The other contact (44) is stationary. The contacts (44, 54) slide against the terminal surfaces (52, 56) of the components (24) that are conveyed into a test location (26) between the contacts. The apparatus employs few moving parts and the sliding motion of the contacts (44, 54) against the terminal surfaces (52, 56) ensures that the contacts (44, 54) penetrate any oxide layer present on the terminal surfaces (52, 56). In an alternative embodiment (160), two sets of contacts (44L, 44T, 54L, 54T) are employed for testing components (24) in two adjacent test locations (26L, 26T). One configuration of a movable contact (304) is such that minimal force is applied to the terminal surfaces (52, 56) of the components (24) so that the components may be tested without marking or damaging the surfaces (52, 56).
    • 装置(20)包括间隔开的距离略小于形成在待测试部件(24)上的端子(34,36)之间的距离的导电触头(44,54)。 一个触点(54)通过弹簧(112)保持就位。 另一个触点(44)是静止的。 触头(44,54)抵靠被传送到触点之间的测试位置(26)的部件(24)的端子表面(52,56)滑动。 该装置使用较少的移动部件,并且触头(44,45)相对于端子表面(52,56)的滑动运动确保触点(44,45)穿过存在于端子表面(52,56)上的任何氧化物层, 。 在替代实施例(160)中,采用两组触点(44L,44T,54L,54T)来测试两个相邻测试位置(26L,26T)中的部件(24)。 可移动触点(304)的一种构造使得最小的力施加到部件(24)的端子表面(52,56),使得可以在不标记或损坏表面(52,56)的情况下测试部件。