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1. 发明授权

US5561554A Confocal imaging system for microscopy 失效
标题翻译：用于显微镜的共焦成像系统
公开(公告)号：US5561554A
公开(公告)日：1996-10-01
申请号：US388145
申请日：1995-02-13
申请人： John G. White , William B. Amos , James M. Fordham
发明人： John G. White , William B. Amos , James M. Fordham
IPC分类号： G02B21/06 , G02B17/06 , G02B21/00 , G02B26/10
CPC分类号： G02B21/0048 , G02B17/0652 , G02B21/0024 , G02B21/0028 , G02B21/0032 , G02B26/10
摘要： A confocal imaging system for use in conjunction with an optical microscope, in which a slit-shaped or bar-shaped beam of light is scanned over the specimen, descanned with a fixed mask and rescanned for viewing or recording, the focusing and scanning system being constituted by wholly reflective optical systems.
摘要翻译：一种与光学显微镜结合使用的共焦成像系统，其中在样本上扫描狭缝状或棒状光束，用固定的掩模进行扫描并重新扫描以用于观察或记录，聚焦和扫描系统为由全反射光学系统构成。

2. 发明授权

US5452125A Confocal imaging system for microscopy 失效
标题翻译：用于显微镜的共焦成像系统
公开(公告)号：US5452125A
公开(公告)日：1995-09-19
申请号：US969142
申请日：1993-01-25
申请人： John G. White , William B. Amos , James M. Fordham
发明人： John G. White , William B. Amos , James M. Fordham
IPC分类号： G02B21/06 , G02B17/06 , G02B21/00 , G02B26/10 , G02B26/08
CPC分类号： G02B21/0048 , G02B17/0652 , G02B21/0024 , G02B21/0028 , G02B21/0032 , G02B26/10
摘要： A confocal imaging system for use in conjunction with an optical microscope, in which a silt-shaped or bar-shaped beam of light is scanned over the specimen, descanned with a fixed mask and rescanned for viewing or recording, the focussing and scanning system being constituted by wholly reflective optical systems.
摘要翻译： PCT No.PCT / GB91 / 01268 Sec。 371日期：1993年1月25日 102（e）日期1993年1月25日PCT提交1991年7月26日PCT公布。出版物WO92 / 02838 日期：1992年2月20日。一种与光学显微镜结合使用的共焦成像系统，其中在样品上扫描成粉状或棒状光束，用固定的掩模进行扫描并重新扫描以用于观察或记录，聚焦扫描系统由全反射光学系统构成。

3. 发明授权

US07330268B2 Spectral imaging apparatus and methodology 失效
公开(公告)号：US07330268B2
公开(公告)日：2008-02-12
申请号：US11478804
申请日：2006-06-30
申请人： Kenneth J. Pettipiece , William B. Amos
发明人： Kenneth J. Pettipiece , William B. Amos
IPC分类号： G01B9/02
CPC分类号： G01J3/2823 , G01J3/45 , G01J2003/2866
摘要： A method and apparatus for an improved spectral imaging system is provided. The system is capable of measuring the fluorescence, luminescence, or absorption at selected locations on a sample plate. The emissions detection subassembly can tune to any wavelength within a continuum of wavelengths utilizing an interferometric spectral discriminator. The interferometric spectral discriminator creates an interferogram from which the wavelength spectra for each pixel of the array can be calculated, typically using Fourier transform analysis. In one aspect, the chromatic accuracy of the system is calibrated using a calibration slit placed in the input aperture of the input relay lens but outside of the sample image. The slit is illuminated using a source of known wavelength. The fringe count versus the wavelength of the slit illumination source is monitored and used to calibrate the spectral discriminator. In another aspect, a transparent optic is included in the interferometric spectral discriminator that can be inserted into the beam path whenever a monochrome image of the sample is required. The optic produces a large offset in the legs of the interferometer resulting in the fringe density becoming too large to resolve by the individual pixels of the detector array. In another aspect, the interferometric spectral discriminator includes a polarizing beam splitter. The polarizing beam splitter preferentially reflects one polarization while preferentially transmitting a second polarization, thus achieving improved efficiency while minimizing ghosting. In another aspect, a metaphase finder is used to locate areas of interest. The sample plate containing the material of interest is illuminated with light of a wavelength determined to preferentially scatter from objects the size of the metaphase spreads. The intensity of the scattered light versus the location on the sample plate is monitored and used to locate the areas of interest. Preferably the sample plate is also illuminated by light of a second wavelength which is not preferentially scattered by the objects of interest, thus representing the background scatter. By subtracting the background scatter from the primary scattered light, improved object discrimination is achieved.

4. 发明授权

US4997242A Achromatic scanning system 失效
标题翻译：消色差扫描系统
公开(公告)号：US4997242A
公开(公告)日：1991-03-05
申请号：US551057
申请日：1990-07-11
申请人： William B. Amos
发明人： William B. Amos
IPC分类号： G02B21/00 , G02B26/10
CPC分类号： G02B21/002 , G02B26/101
摘要： An achromatic scanning system 25 subjects an incoming beam of light to reflection off four successive mirrors (35a, 42a, 42b, 35b). The mirrors at the input and output are preferably plane mirrors (35a-b) and are referred to as the scanning mirrors. They are movable and provide the desired beam displacement when appropriately driven. They face away generally from each other and are rotatable about respective axes. Each axis lies in the plane of its respective mirror and the two axes are non-parallel (preferably perpendicular) to each other. The two intermediate mirrors are concave mirrors (42a-b) that face each other and define an afocal assembly that transfers the light reflected from the first scanning mirror (35a) to the second scanning mirror (35b).
摘要翻译：消色差扫描系统25使入射光束从四个连续的反射镜（35a，42a，42b，35b）反射。输入和输出端的反射镜最好是平面镜（35a-b），被称为扫描镜。它们是可移动的，并在适当驱动时提供所需的梁位移。它们彼此面对，并可围绕各自的轴线旋转。每个轴位于其相应反射镜的平面中，并且两个轴线彼此不平行（优选垂直）。两个中间反射镜是相互面对的凹面镜（42a-b），并且限定将从第一扫描反射镜（35a）反射的光传送到第二扫描反射镜（35b）的无焦组件。

5. 发明授权

US6108082A Spectral imaging apparatus and methodology 有权
公开(公告)号：US6108082A
公开(公告)日：2000-08-22
申请号：US316511
申请日：1999-05-21
申请人： Kenneth J. Pettipiece , William B. Amos
发明人： Kenneth J. Pettipiece , William B. Amos
IPC分类号： G01N21/64 , G01J3/28 , G01J3/45 , G01J3/44
CPC分类号： G01J3/2823 , G01J3/45 , G01J2003/2866
摘要： A method and apparatus for an improved spectral imaging system is provided. The system is capable of measuring the fluorescence, luminescence, or absorption at selected locations on a sample plate. The emissions detection subassembly can tune to any wavelength within a continuum of wavelengths utilizing an interferometric spectral discriminator. The interferometric spectral discriminator creates an interferogram from which the wavelength spectra for each pixel of the array can be calculated, typically using Fourier transform analysis. In one aspect, the chromatic accuracy of the system is calibrated using a calibration slit placed in the input aperture of the input relay lens but outside of the sample image. The slit is illuminated using a source of known wavelength. The fringe count versus the wavelength of the slit illumination source is monitored and used to calibrate the spectral discriminator. In another aspect, a transparent optic is included in the interferometric spectral discriminator that can be inserted into the beam path whenever a monochrome image of the sample is required. The optic produces a large offset in the legs of the interferometer resulting in the fringe density becoming too large to resolve by the individual pixels of the detector array. In another aspect, the interferometric spectral discriminator includes a polarizing beam splitter. The polarizing beam splitter preferentially reflects one polarization while preferentially transmitting a second polarization, thus achieving improved efficiency while minimizing ghosting. In another aspect, a metaphase finder is used to locate areas of interest. The sample plate containing the material of interest is illuminated with light of a wavelength determined to preferentially scatter from objects the size of the metaphase spreads. The intensity of the scattered light versus the location on the sample plate is monitored and used to locate the areas of interest. Preferably the sample plate is also illuminated by light of a second wavelength which is not preferentially scattered by the objects of interest, thus representing the background scatter. By subtracting the background scatter from the primary scattered light, improved object discrimination is achieved.

6. 发明授权

US6051835A Spectral imaging apparatus and methodology 失效
公开(公告)号：US6051835A
公开(公告)日：2000-04-18
申请号：US4180
申请日：1998-01-07
申请人： Kenneth J. Pettipiece , William B. Amos
发明人： Kenneth J. Pettipiece , William B. Amos
IPC分类号： G01N21/64 , G01J3/28 , G01J3/45 , G01B9/02
CPC分类号： G01J3/2823 , G01J3/45 , G01J2003/2866
摘要： A method and apparatus for an improved spectral imaging system is provided. The system is capable of measuring the fluorescence, luminescence, or absorption at selected locations on a sample plate. The emissions detection subassembly can tune to any wavelength within a continuum of wavelengths utilizing an interferometric spectral discriminator. The interferometric spectral discriminator creates an interferogram from which the wavelength spectra for each pixel of the array can be calculated, typically using Fourier transform analysis. In on aspect, the chromatic accuracy of the system is calibrated using a calibration slit placed in the input aperture of the input relay lens but outside of the sample image. The slit is illuminated using a source of known wavelength. The fringe count versus the wavelength of the slit illumination source is monitored and used to calibrate the spectral discriminator. In another aspect, a transparent optic is included in the interferometric spectral discriminator that can be inserted into the beam path whenever a monochrome image of the sample is required. The optic produces a large offset in the legs of the interferometer resulting in the fringe density becoming too large to resolve by the individual pixels of the detector array. In another aspect, the interferometric spectral discriminator includes a polarizing beam splitter. The polarizing beam splitter preferentially reflects one polarization while preferentially transmitting a second polarization, thus achieving improved efficiency while minimizing ghosting. In another aspect, a metaphase finder is used to locate areas of interest. The sample plate containing the material of interest is illuminated with light of a wavelength determined to preferentially scatter from objects the size of the metaphase spreads. The intensity of the scattered light versus the location on the sample plate is monitored and used to locate the areas of interest. Preferably the sample plate is also illuminated by light of a second wavelength which is not preferentially scattered by the objects of interest, thus representing the background scatter. By subtracting the background scatter from the primary scattered light, improved object discrimination is achieved.

7. 发明授权

US5304810A Confocal scanning optical microscope 失效
标题翻译：共焦扫描光学显微镜
公开(公告)号：US5304810A
公开(公告)日：1994-04-19
申请号：US972462
申请日：1993-02-16
申请人： William B. Amos
发明人： William B. Amos
IPC分类号： G01N21/64 , G02B21/00 , G02B21/06 , G01N21/00 , G01N21/63
CPC分类号： G01N21/6458 , G02B21/0024 , G02B21/0032 , G02B21/0064 , G02B21/0076
摘要： A confocal scanning optical microscope in which a specimen under test is simultaneously scanned with two distinct spots or slits of illumination and two output beams emitted from the specimen due to reflection or fluorescence are descanned and passed to separate stationary confocal apertures and detectors.
摘要翻译： PCT No.PCT / GB91 / 01176 Sec。 371日期：1993年2月16日 102（e）日期1993年2月16日PCT 1991年7月16日PCT公布。出版物WO92 / 01966 日期：1992年2月6日。一种共焦扫描光学显微镜，其中被测试样本被同时扫描具有两个不同的点或狭缝的照明，并且由于反射或荧光而从样本发射出的两个输出光束被排出并传递到分离的固定共聚焦孔和探测器。

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