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1. 发明申请

US20130108019A1 DETECTOR MODULES FOR IMAGING SYSTEMS AND METHODS OF MANUFACTURING 有权
标题翻译：用于成像系统的检测器模块和制造方法
公开(公告)号：US20130108019A1
公开(公告)日：2013-05-02
申请号：US13283373
申请日：2011-10-27
申请人： John Eric Tkaczyk , Kevin Matthew Durocher , James Rose , Haochuan Jiang , Abdelaziz Ikhlef , Vladimir Lobastov , Daniel David Harrison
发明人： John Eric Tkaczyk , Kevin Matthew Durocher , James Rose , Haochuan Jiang , Abdelaziz Ikhlef , Vladimir Lobastov , Daniel David Harrison
IPC分类号： G01N23/04 , H01L31/18 , G01N23/08 , G01N23/083 , G01T1/16 , G01T1/24
CPC分类号： G01T1/247 , A61B6/037 , A61B6/4233 , G01N2223/419 , G01N2223/507 , G01T1/249 , G01T7/005
摘要： Detector modules for an imaging system and methods of manufacturing are provided. One detector module includes a substrate, a direct conversion sensor material coupled to the substrate and a flexible interconnect electrically coupled to the direct conversion sensor material and configured to provide readout of electrical signals generated by the direct conversion sensor material. The detector module also includes at least one illumination source for illuminating the direct conversion sensor material.
摘要翻译：提供了用于成像系统的检测器模块和制造方法。一个检测器模块包括衬底，耦合到衬底的直接转换传感器材料和电耦合到直接转换传感器材料并被配置为提供由直接转换传感器材料产生的电信号的读出的柔性互连。检测器模块还包括用于照亮直接转换传感器材料的至少一个照明源。

2. 发明授权

US08824635B2 Detector modules for imaging systems and methods of manufacturing 有权
标题翻译：用于成像系统的检测器模块和制造方法
公开(公告)号：US08824635B2
公开(公告)日：2014-09-02
申请号：US13283373
申请日：2011-10-27
申请人： John Eric Tkaczyk , Kevin Matthew Durocher , James Rose , Haochuan Jiang , Abdelaziz Ikhlef , Vladimir Lobastov , Daniel David Harrison
发明人： John Eric Tkaczyk , Kevin Matthew Durocher , James Rose , Haochuan Jiang , Abdelaziz Ikhlef , Vladimir Lobastov , Daniel David Harrison
IPC分类号： H05G1/64 , H01L27/148 , G01T1/16 , G01T1/208
CPC分类号： G01T1/247 , A61B6/037 , A61B6/4233 , G01N2223/419 , G01N2223/507 , G01T1/249 , G01T7/005
摘要： Detector modules for an imaging system and methods of manufacturing are provided. One detector module includes a substrate, a direct conversion sensor material coupled to the substrate and a flexible interconnect electrically coupled to the direct conversion sensor material and configured to provide readout of electrical signals generated by the direct conversion sensor material. The detector module also includes at least one illumination source for illuminating the direct conversion sensor material.
摘要翻译：提供了用于成像系统的检测器模块和制造方法。一个检测器模块包括衬底，耦合到衬底的直接转换传感器材料和电耦合到直接转换传感器材料并被配置为提供由直接转换传感器材料产生的电信号的读出的柔性互连。检测器模块还包括用于照亮直接转换传感器材料的至少一个照明源。

3. 发明授权

US07154091B2 Method and system for ultrafast photoelectron microscope 有权
标题翻译：超快光电子显微镜的方法和系统
公开(公告)号：US07154091B2
公开(公告)日：2006-12-26
申请号：US11097837
申请日：2005-04-01
申请人： Ahmed Zewail , Vladimir Lobastov
发明人： Ahmed Zewail , Vladimir Lobastov
IPC分类号： H01J37/26 , G01N23/04
CPC分类号： H01J37/26 , H01J37/065 , H01J37/073 , H01J37/24 , H01J37/243 , H01J37/265 , H01J2237/0432 , H01J2237/06333 , H01J2237/06341 , H01J2237/206 , H01J2237/2065 , H01J2237/24585 , H01J2237/2482 , H01J2237/2803 , H01J2237/2809 , H01J2237/2813 , H01J2237/2855
摘要： An ultrafast system (and methods) for characterizing one or more samples. The system includes a stage assembly, which has a sample to be characterized. The system has a laser source that is capable of emitting an optical pulse of less than 1 ps in duration. The system has a cathode coupled to the laser source. In a specific embodiment, the cathode is capable of emitting an electron pulse less than 1 ps in duration. The system has an electron lens assembly adapted to focus the electron pulse onto the sample disposed on the stage. The system has a detector adapted to capture one or more electrons passing through the sample. The one or more electrons passing through the sample is representative of the structure of the sample. The detector provides a signal (e.g., data signal) associated with the one or more electrons passing through the sample that represents the structure of the sample. The system has a processor coupled to the detector. The processor is adapted to process the data signal associated with the one or more electrons passing through the sample to output information associated with the structure of the sample. The system has an output device coupled to the processor. The output device is adapted to output the information associated with the structure of the sample.
摘要翻译：用于表征一个或多个样品的超快系统（和方法）。该系统包括具有要表征的样品的载物台组件。该系统具有能够发射持续时间小于1ps的光脉冲的激光源。该系统具有耦合到激光源的阴极。在具体实施例中，阴极能够发射持续时间小于1ps的电子脉冲。该系统具有适于将电子脉冲聚焦到设置在载物台上的样品上的电子透镜组件。该系统具有适于捕获穿过样品的一个或多个电子的检测器。通过样品的一个或多个电子代表样品的结构。检测器提供与通过样品的一个或多个电子相关联的信号（例如，数据信号），其表示样品的结构。该系统具有耦合到检测器的处理器。处理器适于处理与通过样本的一个或多个电子相关联的数据信号，以输出与样本的结构相关联的信息。该系统具有耦合到处理器的输出设备。输出设备适于输出与样本结构相关联的信息。

4. 发明授权

US07915583B2 Method and system for ultrafast photoelectron microscope 有权
标题翻译：超快光电子显微镜的方法和系统
公开(公告)号：US07915583B2
公开(公告)日：2011-03-29
申请号：US12234567
申请日：2008-09-19
申请人： Ahmed Zewail , Vladimir Lobastov
发明人： Ahmed Zewail , Vladimir Lobastov
IPC分类号： H01J37/26 , H01J37/252
CPC分类号： H01J37/26 , H01J37/065 , H01J37/073 , H01J37/24 , H01J37/243 , H01J37/265 , H01J2237/0432 , H01J2237/06333 , H01J2237/06341 , H01J2237/206 , H01J2237/2065 , H01J2237/24585 , H01J2237/2482 , H01J2237/2803 , H01J2237/2809 , H01J2237/2813 , H01J2237/2855
摘要： An ultrafast system (and methods) for characterizing one or more samples. The system includes a stage assembly, which has a sample to be characterized. The system has a laser source that is capable of emitting an optical pulse of less than 1 ps in duration. The system has a cathode coupled to the laser source. In a specific embodiment, the cathode is capable of emitting an electron pulse less than 1 ps in duration. The system has an electron lens assembly adapted to focus the electron pulse onto the sample disposed on the stage. The system has a detector adapted to capture one or more electrons passing through the sample. The one or more electrons passing through the sample is representative of the structure of the sample. The detector provides a signal (e.g., data signal) associated with the one or more electrons passing through the sample that represents the structure of the sample. The system has a processor coupled to the detector. The processor is adapted to process the data signal associated with the one or more electrons passing through the sample to output information associated with the structure of the sample. The system has an output device coupled to the processor. The output device is adapted to output the information associated with the structure of the sample.
摘要翻译：用于表征一个或多个样品的超快系统（和方法）。该系统包括具有要表征的样品的载物台组件。该系统具有能够发射持续时间小于1ps的光脉冲的激光源。该系统具有耦合到激光源的阴极。在具体实施例中，阴极能够发射持续时间小于1ps的电子脉冲。该系统具有适于将电子脉冲聚焦到设置在载物台上的样品上的电子透镜组件。该系统具有适于捕获穿过样品的一个或多个电子的检测器。通过样品的一个或多个电子代表样品的结构。检测器提供与通过样品的一个或多个电子相关联的信号（例如，数据信号），其表示样品的结构。该系统具有耦合到检测器的处理器。处理器适于处理与通过样本的一个或多个电子相关联的数据信号，以输出与样本的结构相关联的信息。该系统具有耦合到处理器的输出设备。输出设备适于输出与样本结构相关联的信息。

5. 发明申请

US20080017796A1 Method and system for ultrafast photoelectron microscope 有权
标题翻译：超快光电子显微镜的方法和系统
公开(公告)号：US20080017796A1
公开(公告)日：2008-01-24
申请号：US11643008
申请日：2006-12-19
申请人： Ahmed Zewail , Vladimir Lobastov
发明人： Ahmed Zewail , Vladimir Lobastov
IPC分类号： G01N23/00
CPC分类号： H01J37/26 , H01J37/065 , H01J37/073 , H01J37/24 , H01J37/243 , H01J37/265 , H01J2237/0432 , H01J2237/06333 , H01J2237/06341 , H01J2237/206 , H01J2237/2065 , H01J2237/24585 , H01J2237/2482 , H01J2237/2803 , H01J2237/2809 , H01J2237/2813 , H01J2237/2855
摘要： An ultrafast system (and methods) for characterizing one or more samples. The system includes a stage assembly, which has a sample to be characterized. The system has a laser source that is capable of emitting an optical pulse of less than 1 ps in duration. The system has a cathode coupled to the laser source. In a specific embodiment, the cathode is capable of emitting an electron pulse less than 1 ps in duration. The system has an electron lens assembly adapted to focus the electron pulse onto the sample disposed on the stage. The system has a detector adapted to capture one or more electrons passing through the sample. The one or more electrons passing through the sample is representative of the structure of the sample. The detector provides a signal (e.g., data signal) associated with the one or more electrons passing through the sample that represents the structure of the sample. The system has a processor coupled to the detector. The processor is adapted to process the data signal associated with the one or more electrons passing through the sample to output information associated with the structure of the sample. The system has an output device coupled to the processor. The output device is adapted to output the information associated with the structure of the sample.
摘要翻译：用于表征一个或多个样品的超快系统（和方法）。该系统包括具有要表征的样品的载物台组件。该系统具有能够发射持续时间小于1ps的光脉冲的激光源。该系统具有耦合到激光源的阴极。在具体实施例中，阴极能够发射持续时间小于1ps的电子脉冲。该系统具有适于将电子脉冲聚焦到设置在载物台上的样品上的电子透镜组件。该系统具有适于捕获穿过样品的一个或多个电子的检测器。通过样品的一个或多个电子代表样品的结构。检测器提供与通过样品的一个或多个电子相关联的信号（例如，数据信号），其表示样品的结构。该系统具有耦合到检测器的处理器。处理器适于处理与通过样本的一个或多个电子相关联的数据信号，以输出与样本的结构相关联的信息。该系统具有耦合到处理器的输出设备。输出设备适于输出与样本结构相关联的信息。

6. 发明申请

US20090236521A1 METHOD AND SYSTEM FOR ULTRAFAST PHOTOELECTRON MICROSCOPE 有权
标题翻译：超导光电显微镜的方法与系统
公开(公告)号：US20090236521A1
公开(公告)日：2009-09-24
申请号：US12234567
申请日：2008-09-19
申请人： Ahmed Zewail , Vladimir Lobastov
发明人： Ahmed Zewail , Vladimir Lobastov
IPC分类号： G01N23/04
CPC分类号： H01J37/26 , H01J37/065 , H01J37/073 , H01J37/24 , H01J37/243 , H01J37/265 , H01J2237/0432 , H01J2237/06333 , H01J2237/06341 , H01J2237/206 , H01J2237/2065 , H01J2237/24585 , H01J2237/2482 , H01J2237/2803 , H01J2237/2809 , H01J2237/2813 , H01J2237/2855
摘要： An ultrafast system (and methods) for characterizing one or more samples. The system includes a stage assembly, which has a sample to be characterized. The system has a laser source that is capable of emitting an optical pulse of less than 1 ps in duration. The system has a cathode coupled to the laser source. In a specific embodiment, the cathode is capable of emitting an electron pulse less than 1 ps in duration. The system has an electron lens assembly adapted to focus the electron pulse onto the sample disposed on the stage. The system has a detector adapted to capture one or more electrons passing through the sample. The one or more electrons passing through the sample is representative of the structure of the sample. The detector provides a signal (e.g., data signal) associated with the one or more electrons passing through the sample that represents the structure of the sample. The system has a processor coupled to the detector. The processor is adapted to process the data signal associated with the one or more electrons passing through the sample to output information associated with the structure of the sample. The system has an output device coupled to the processor. The output device is adapted to output the information associated with the structure of the sample.
摘要翻译：用于表征一个或多个样品的超快系统（和方法）。该系统包括具有要表征的样品的载物台组件。该系统具有能够发射持续时间小于1ps的光脉冲的激光源。该系统具有耦合到激光源的阴极。在具体实施例中，阴极能够发射持续时间小于1ps的电子脉冲。该系统具有适于将电子脉冲聚焦到设置在载物台上的样品上的电子透镜组件。该系统具有适于捕获穿过样品的一个或多个电子的检测器。通过样品的一个或多个电子代表样品的结构。检测器提供与通过样品的一个或多个电子相关联的信号（例如，数据信号），其表示样品的结构。该系统具有耦合到检测器的处理器。处理器适于处理与通过样本的一个或多个电子相关联的数据信号，以输出与样本的结构相关联的信息。该系统具有耦合到处理器的输出设备。输出设备适于输出与样本结构相关联的信息。

7. 发明授权

US07442931B2 Method and system for ultrafast photoelectron microscope 有权
公开(公告)号：US07442931B2
公开(公告)日：2008-10-28
申请号：US11643008
申请日：2006-12-19
申请人： Ahmed Zewail , Vladimir Lobastov
发明人： Ahmed Zewail , Vladimir Lobastov
IPC分类号： H01J37/26
CPC分类号： H01J37/26 , H01J37/065 , H01J37/073 , H01J37/24 , H01J37/243 , H01J37/265 , H01J2237/0432 , H01J2237/06333 , H01J2237/06341 , H01J2237/206 , H01J2237/2065 , H01J2237/24585 , H01J2237/2482 , H01J2237/2803 , H01J2237/2809 , H01J2237/2813 , H01J2237/2855
摘要： An ultrafast system (and methods) for characterizing one or more samples. The system includes a stage assembly, which has a sample to be characterized. The system has a laser source that is capable of emitting an optical pulse of less than 1 ps in duration. The system has a cathode coupled to the laser source. In a specific embodiment, the cathode is capable of emitting an electron pulse less than 1 ps in duration. The system has an electron lens assembly adapted to focus the electron pulse onto the sample disposed on the stage. The system has a detector adapted to capture one or more electrons passing through the sample. The one or more electrons passing through the sample is representative of the structure of the sample. The detector provides a signal (e.g., data signal) associated with the one or more electrons passing through the sample that represents the structure of the sample. The system has a processor coupled to the detector. The processor is adapted to process the data signal associated with the one or more electrons passing through the sample to output information associated with the structure of the sample. The system has an output device coupled to the processor. The output device is adapted to output the information associated with the structure of the sample.

8. 发明申请

US20050253069A1 Method and system for ultrafast photoelectron microscope 有权
标题翻译：超快光电子显微镜的方法和系统
公开(公告)号：US20050253069A1
公开(公告)日：2005-11-17
申请号：US11097837
申请日：2005-04-01
申请人： Ahmed Zewail , Vladimir Lobastov
发明人： Ahmed Zewail , Vladimir Lobastov
IPC分类号： H01J37/073 , H01J37/26
CPC分类号： H01J37/26 , H01J37/065 , H01J37/073 , H01J37/24 , H01J37/243 , H01J37/265 , H01J2237/0432 , H01J2237/06333 , H01J2237/06341 , H01J2237/206 , H01J2237/2065 , H01J2237/24585 , H01J2237/2482 , H01J2237/2803 , H01J2237/2809 , H01J2237/2813 , H01J2237/2855
摘要： An ultrafast system (and methods) for characterizing one or more samples. The system includes a stage assembly, which has a sample to be characterized. The system has a laser source that is capable of emitting an optical pulse of less than 1 ps in duration. The system has a cathode coupled to the laser source. In a specific embodiment, the cathode is capable of emitting an electron pulse less than 1 ps in duration. The system has an electron lens assembly adapted to focus the electron pulse onto the sample disposed on the stage. The system has a detector adapted to capture one or more electrons passing through the sample. The one or more electrons passing through the sample is representative of the structure of the sample. The detector provides a signal (e.g., data signal) associated with the one or more electrons passing through the sample that represents the structure of the sample. The system has a processor coupled to the detector. The processor is adapted to process the data signal associated with the one or more electrons passing through the sample to output information associated with the structure of the sample. The system has an output device coupled to the processor. The output device is adapted to output the information associated with the structure of the sample.
摘要翻译：用于表征一个或多个样品的超快系统（和方法）。该系统包括具有要表征的样品的载物台组件。该系统具有能够发射持续时间小于1ps的光脉冲的激光源。该系统具有耦合到激光源的阴极。在具体实施例中，阴极能够发射持续时间小于1ps的电子脉冲。该系统具有适于将电子脉冲聚焦到设置在载物台上的样品上的电子透镜组件。该系统具有适于捕获穿过样品的一个或多个电子的检测器。通过样品的一个或多个电子代表样品的结构。检测器提供与通过样品的一个或多个电子相关联的信号（例如，数据信号），其表示样品的结构。该系统具有耦合到检测器的处理器。处理器适于处理与通过样本的一个或多个电子相关联的数据信号，以输出与样本的结构相关联的信息。该系统具有耦合到处理器的输出设备。输出设备适于输出与样本结构相关联的信息。

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